Zuo-Guang. Ye Advanced Dielectric Piezoelectric and Ferroelectric Materials: Synthesis, Characterisation and Applications
Подождите немного. Документ загружается.
Index1060
irreversible work and hysteresis loss
378–81
work-energy analysis 376–8, 379, 380
X phase 432
X-ray diffraction (XRD) 106, 107
BiT 824–5
from soft chemical methods 876,
877
BITN and BITV 844, 845
BLT from soft chemical methods 876,
877
Bragg condition 942–3
layered perovskite K
2
NbO
3
F 886, 887
lead–free relaxors derived from
barium titanate 904–5
nano–islands 610–11
perovskite artificial lattices 980, 981,
982
PIMNT ceramics 208–9, 210
PMN–PT
crystals 106, 107, 342–4, 346
powders 452, 453, 454
potassium niobate 886, 887
thin films 892, 893
PSN–PT 177–80
crystals 194–6
powders 452–3, 454
SBT from soft chemical methods 870,
871
X-ray diffraction reciprocal space
mapping (XRD-RSM) 713, 715,
980, 982
xerogel 725–6
Young’s modulus 455, 459, 460
see also elastic compliance constants
zero-field-cooling (ZFC) 335
zero-field-heating (ZFH) 335
zinc oxide thin film transistor (TFT) 531,
533
zirconium oxide 684
zirconolite-like structure 507, 508
zone levelling 9–12, 30, 81–2
zone-melting growth 81–3
WPNL2204
WPNL2204