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DAMAGE DETECTION IN TETRAGONAL ZIRCONIA POLYCRYSTALS
(TZP) BY IMPEDANCE SPECTROSCOPY
S.
Wagner*,
A.
Tiefenbach**,
R.
Oberacker*, M.
J.
Hoffmann",
B.
Hoffmann**
(*)Institut fir Keramik im Maschinenbau, Universitat Karlsruhe,
D-76131 Karlsruhe, Germany
(**)Institut fir Werkstoffe der Elektrotechnik, Universitat Karlsruhe,
D-76131 Karlsruhe, Germany
ABSTRACT
The influence of phase composition and artificial
long cracks on the electrical behaviour of 9 mol% CeOz
stabilised Zr02 (9Ce-TZP) has been investigated by
impedance spectroscopy at room temperature
as
well as
at elevated temperatures. Cracks were introduced and
propagated by the bridge method. The crack
propagation
in
9Ce-TZP is combined with a tetragonal
to monoclinic phase transformation in the process zone
of the crack. These
two
processes correspond to a
change in the electrical properties. It was possible to
correlate the changes in the electrical properties to the
phase transformation
as
well
as
to the crack
propagation. Numerical field simulations were
performed for this purpose. From experimental results
and numerical field simulations a sensitivity analysis
has been derived with respect to the detection of short
cracks under load at room temperature. Closed cracks
are detectable only at elevated temperatures.
INTRODUCTION
In
tetragonal zirconia ceramics (Tetragonal Zirconia
Polycrystals TZP or Partially Stabilised Zirconia PSZ)
subcritical crack growth under static and cyclic load is
observed [1,2]. Phase transformation from the
tetragonal to monoclinic phase, taking place in the
process zone of propagating cracks, acts
as
toughening
mechanism and plays an important role in these
ceramics [3,4,5,6]. Lifetime predictions for TZP
components under static and cyclic loading are
subjected to statistical scatter, due to the
unknown
and
often widely distributed defect population
in
the
material. This limits the use of such components.
Therefore the development of non destructive
evaluation methods
(NDE)
is important for the
detection of fatigue relevant defects prior to
catastrophic failure.
Electrical measurements offer some advantages
over to the more common NDE methods, such
as
local
measurement of the critical component sections and
measurements from room temperature up to high
temperatures. There is, however, only limited
information available on the application of methods
such
as
impedance spectroscopy for this purpose [7].
No
assessment of the potential of electrical methods
is
possible on the basis of the present knowledge.
However, ionic conductors such
as
zirconia seem to be
suitable materials for this technique.
In this study both, the influence of the tetragonal to
monoclinic phase transformation
as
well the effect of
single cracks on the electrical behaviour of 9 mol%
CeOz stabilised ZrOz (9Ce-TZP) has been investigated
from room temperature up to 55OOC. This 9Ce-TZP
material develops large transformation zones at the
crack tip.
The electrical characterisation of the material result
in restriction only for the room temperature
characterisation, where only capacitive measurements
are feasible. At elevated temperatures, the ionic
conductivity becomes measurable and gives additional
information with respect
to
defects.
EXPERIMENTAL PROCEDURE
Sample preparation
-
3r the sample preparation 9 mol% CeOZ stabilised
,!rij2
powder (9Ce-TZP, Unitec, UK) has been used.
Plates of 65x45~12 mm3 were produced by pressing,
cold isostatic pressing and sintering at 1400°C for
2
hours in air. From the plates four point bending
specimens with a dimension of 48x9~4
mm3
as well as
specimens for the transformation and high temperature
experiments of
1
Ox8x 12
mm3
were manufactured by
diamond cutting and grinding. The grinding induced
monoclinic zone at the surface was removed by
annealing the samples for one hour at 1000°C in air.
By cooling the specimens to -85°C in cryogenic
silicon oil, the transformation of the tetragonal to the
monoclinic (m+t) phase was induced.
A
retransformation process from the monoclinic to the
tetragonal state has been realised by heating to 600°C.
Microstructural characterisation
SEM and TEM were utilised for investigating the
microstructure. The mean grain size was determined
from SEM micrographs taken from polished and
thermally etched specimens by the line intercept
method. Samples for TEM investigations were
prepared by grinding, dimpling and ion milling.
A
Zeiss
EM91 2 Omega microscope with an accelerating
voltage of 120 kV was used for TEM investigations.
The phase analysis was performed at an X-ray
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