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damage in the grain boundaries due to oxidation
may also have an effect on the dynamic fatigue
behaviour.
Conclusions
The dynamic fatigue behaviour of two materials, one
rich in Si02 and the other rich in Y2O3, was examined at
room and at elevated temperatures for unnotched and
notched specimens. At room temperature, no differences
were observed. At 1500 "C, however, significant
differences were observed, regardless of defect type.
The SiO2-rich specimens exhibited less oxidation, more
slow crack growth and lower dynamic fatigue strengths
than the Y203-rich specimens did. Additionally, for
notched specimens, the dynamic fatigue strengths were
higher at 1500 "C than at room temperature and at both
temperatures after tempering. It is assumed that
processes, such
as
oxidation, involving blunting of the
crack tip are responsible for the observed behaviour.
However, further studies must be performed in order to
explain the high-temperature behaviour of these
materials. Not only oxidation, but other mechanisms
must be active at 1500 "C to cause the differences which
were seen especially in the tempered materials between
room temperature and 1500 "C. Dynamic fatigue testing
could be performed in an inert atmosphere to remove
the effects of oxidation. Additionally, the crystallization
behaviour of the two materials could be tested using
techniques such
as
differential thermal analysis, TEM
and quantitative analysis
of
the X-ray diffraction results.
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