Hawkes P.W., Spence J.C.H. (Eds.) Science of Microscopy. V.1 and 2

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Figure 1–14. Illustration of

certain lens aberrations. (a)

A perfect lens focuses a

point source to a single

image point. (b) Spherical

aberration causes rays at

higher angles to be overfo-

cused. (c) Chromatic aber-

ration causes rays at

different energies (indi-

cated by color) to be focused

differently.

Figure 1–18. (a) Structural model of the complex oxide Nb

projected along [001]. (b) Conven-

tional axial HRTEM image recorded at the Scherzer defocus of a thin crystal. (c) Reconstructed

modulus of the exit-plane wavefunction of Nb

with the marked area enlarged (inset), which

directly shows the cation positions (black) with improved resolution compared to the axial image. The

line indicates a stacking fault with a shift of a third of a unit cell along [010]. (d) Reconstructed phase

of the exit-plane wavefunction with the marked area enlarged (inset). The cation sites in the phase are

recovered with positive (white) contrast and additional weak between the cation atomic columns

which indicate the positions of the oxygen anions are also resolved. The reconstructed phase and

modulus are shown at the same scale.

Figure 2–14. An ADF image of an

NiS

/Si(001) interface with the struc-

ture determined from the image over-

laid. [Reprinted with permission from

Falke et al. (2004). Copyright (2004)

by the American Physical Society.]

Figure 3–56. Stereo pair of SE micrographs (a and

b) of the hydrogel poly-(N-isopropylacrylamide)

(PNIPAAm) in the swollen state recorded at 2 keV

with the “in-lens” FESEM. The specimen was rapidly

frozen, freeze dried, and ultrathin rotary shadowed

with platinum/carbon (for details see Matzelle et al.,

2002). (c) Red–green stereo anaglyph prepared from

(a and b). The tilt axis has a vertical direction. (d)

Red–green stereo anaglyph in a “bird view.”

Figure 1–20. (a) Enlarged region taken from the reconstructed modulus calculated from a tilt azimuth

dataset of an Nd

SrTi

crystal edge in the [010] projection showing a small difference in positions

of the Nd(4) and Nd(5) cations at the interface between adjacent perovskite slabs. (b) Reconstructed

phase of the same region as (a) showing details of the oxygen anion sublattice between the Ti sites.

The experimental data were recorded using the tilt series geometry described in the text with a JEOL

JEM-3000F FEGTEM, 300 kV, C

= 0.57 mm with an injected tilt of 1.9 mrad.

Figure 3–66. X-Ray microanalysis of a Cr–Fe-alloy with a Si phase. The EDX spectra (a and b) were

recorded with the Röntec XFlah3001 from locations “Punkt1” and “Punkt2” marked in the SE micro-

graph of the specimen (c). The positions of the characteristic X-ray energies for the various elements

emerging in the spectra are indicated by thin colored lines, which are labeled with the chemical

symbol of the corresponding chemical element. The elements iron, chromium, and vanadium occur

with one K

peak each in the energy range from 4.95 to 6.40 keV and with one less intense L

peak

each in the energy range from 0.51 to 0.71 keV. Elemental distribution maps of Fe (d), Cr (e), Si (f), and

Ti (g) were recorded using the K

lines. (h) Mixed micrograph obtained by superimposition of the SE

image and the maps of the distribution of Fe, Cr, Si, and Ti within the ﬁ eld of view. Experimental

conditions: SEM, LEO 438VP. For recording spectra: E

= 20 keV; count rate, ≈ 3 × 10

cps; acquisition

time, 300 s. For recording maps: E

= 25 keV; count rate ≈ 1.5 × 10

cps; acquisition time 600 s. (EDX

spectra, SE micro graph, and elemental distribution maps were kindly provided by Röntec GmbH,

Berlin, Germany.)

x 1E3 Pulses/eV

4.0

3.0

2.0

1.0

0.0

- keV -

810

x 1E3 Pulses/eV

3.0

2.0

1.0

0.0

24 6

- keV -

810

(continued)

Figure 3–66. Continued

Figure 3–68. ESBD patterns from an as-cast niobium specimen.

generated by automatic indexing. [EBSD patterns were kindly

provided by Dr. S. Zaefferer, Max-Planck-Institut für Eisenforsc-

hung, Düsseldorf, Germany. (a and b) From Zaefferer, 2004; with

kind permission from JEOL (Germany) GmbH, München,

Germany.

5.00 µm = 100 steps

colour coding:

hatched areas:

austenite

111

001

b) c)

grain boundary character

rotation angle fraction

41˚ 42˚ 0.051

42˚ 43˚ 0.112

43˚ 44˚ 0.140

44˚ 45˚ 0.132

45˚ 46˚ 0.097

46˚ 47˚ 0.018

deviation to

centre grain

orientation

orientation class

<001> ll ND (max. 20˚)

all other orientations

austenite

101

Figure 3–69. Secondary electron micrograph of austenite (b) Orientation map of (a) measured by

automated crystal orientation mapping and color coded for the crystal direction parallel to the normal

direction (ND) of the sheet. Hatched areas correspond to austenite grains. (c) The boundary character

between γ- and α-grains, different orientation components [(001)||ND, red; all others blue] and the

orientation variations inside of each grain (color shading; b, bainite). The micrograph and the maps

are recorded with thermal FESEM JSM-6500F. Note: the extension toward the top and bottom of the

measured are in (b) and (c) is larger than the area marked in (a). (Reprinted from Zaefferer et al., 2004;

2.50 µm = 50 steps

austenite

Angular deviation

to orientation in

grain centre

Figure 3–70. Orientation map of one grain from

the microstructure in Figure 3–69a. Color code:

angular deviation of every mapping point to

one orientation in the center of the grain. Bainite

appears in conjunction with a steep orientation

gradient in ferrite. The white line marks the

maximum extension of austenite at austeniza-

tion temperature. f, ferrite; a, austenite (hatched);

b, bainite. (Reprinted from Zaefferer et al.,

2004; copyright, 2004, with permission from

Elsevier.)

Figure 4–19. Schematics of a commercial

EDXS detector showing the detector front, the

Dewar system to cool the detector, and various com-

ponents that are interfaced in the electron micro-

scope. (Courtesy of N. Rowlands, Oxford

Instruments.)

abc

Figure 4–26. Various in-column spectrometer conﬁ gurations. (a) Mirror-prism spectrometer,

(b) OMEGA ﬁ lter, and (c) Mandolin ﬁ lter. (Courtesy of P. Schlossmacher, Zeiss SMT.)

Figure 4–27. Schematic diagram of the in-

column energy-ﬁ ltered microscope (Zeiss-Libra

200). (Courtesy of P. Schlossmacher, Zeiss SMT.)

Figure 4–29. (a) Postcolumn imaging

ﬁ lter (Gatan Imaging Filter GIF);

schematic diagram of the electron

optics components and detection

system (top diagram). (Adapted from

Krivanek, Gubbens et al., 1991a.) (b)

Actual spectrometer [Gatan’s GIF

2000 series spectrometer (Tridiem

model)] and components (bottom

diagram). (Courtesy of M. Kundman,

Gatan.)

Figure 4–31. Various implementations of monochromators in commercially available instruments.

Left: The FEI monochromator, single Wien ﬁ lter. (Courtesy of P. Tiemeijer, FEI Company.) Center: The

JEOL monochromator double-Wien ﬁ lter. (Courtesy of JEOL Ltd.) Right: The lectrostatic omega ﬁ lter

implemented in the Libra Zeiss microscope. (Courtesy of M. Haider, CEOS GmbH.)

0.7 Å probe ON column

16.3 Å

max = 0.36 min = 0.00

300 Å

Figure 4–37. Real space intensity plots demonstrating the dispersion of the electron intensity when

the electron beam is located on top of the atomic column and when it is located between two atomic

columns. The bright empty circles indicate the position of the atoms in the cell closest to the point of

impact of the electron beam. Channeling is observed when the beam is positioned on the atomic

column (a) while much stronger dispersion is observed when the electron beam is not on the atomic

column (b). (Data courtesy of C. Dywer and J. Etheridge.)

Figure 4–74. Color-coded elemental map of a device showing the distribution of elements in the ras-

tered area: red, Al-rich area; blue, Si-rich area; green, Ti-rich area. White, W. Interdiffusion of Si into

the Al is noted through the bottom barrier layer containing Ti.

Figure 4–77. Various appr-

oaches to EFTEM imaging.

Zero-loss (ZL) ﬁ ltered imaging

(selecting only electrons that

have lost no signiﬁ cant

amounts of energy), plasmon

imaging (selecting only elec-

trons that have lost energy in

the 10–30 eV range), and core

loss imaging with the three-

windows technique (extrapo-

lation of the background

under the edge) and the jump-

ratio technique.

Figure 5–1. Phenomena classiﬁ ed by spatial and temporal resolution. Spatial resolution, is deﬁ ned as

follows: (1) if the technique is an imaging method, the low end of the bounding box would be deﬁ ned

by the smallest resolvable feature and the high end by the typical ﬁ eld of view or (2) for a nonimaging

technique, the bounding box would be deﬁ ned by the range of probe or spot sizes. Time resolution is

deﬁ ned as that for a single-shot investigation of irreversible processes. So time resolution is deﬁ ned

as the single-shot exposure time to obtain data that demonstrate a particular spatial resolution.

Spatial Resolution (m

-1

)

Time Resolution (s

-1

)

Diffraction of

Phase

Transformations

structural

changes in

biology

nucleation

and

growth

of damage

Imaging of

Phase

Transformations

Making

and

Breaking

of Bonds

Dislocation

Dynamics at

Conventional

Strain Rates

magnetic

switching

melting

and

resolidification

Figure 5–2. The DTEM at TU Berlin. Cathode and sample drive lasers are at left.

Figure 5–3. TU Berlin dynamic trans-

mission electron microscope.