Chapter 15 Scanning Tunneling Microscopy in Surface Science 1021
Eder, C., Smoliner, J. and Strasser, G. (1996). Appl. Phys. Lett. 68, 2876.
Eigler, D.M. and Schweizer, E.K. (1990). Nature 344, 524.
Erwin, S.C., Baski, A.A. and Whitman, L.J. (1996). Phys. Rev. Lett. 77, 687.
Feenstra, R.M., Stroscio, J.A., Tersoff, J. and Fein, A.P. (1987). Phys. Rev. Lett.
58, 1192.
Feenstra, R.M., Collins, D.A., Ting, D.Z.-Y., Wang, M.W. and McGill, T.C.
(1994). Phys. Rev. Lett. 72, 2749.
Festy, F. and Palmer, R.E. (2004). Appl. Phys. Lett. 85, 5034.
Fowell, A.E., Williams, R.H., Richardson, B.E. and Shen, T.-H. (1990). Semicond.
Sci. Technol. 5, 348.
Fujikawa, Y., Akiyama, K., Nagao, T., Sakurai, T., Lagally, M.G., Hashimoto,
T., Morikawa, Y. and Terakura, K. (2002). Phys. Rev. Lett. 88, 176101.
Gai, Z., Li, X., Zhao, R.G. and Yang, W.S. (1998). Phys. Rev. B 57, 15060.
Gewirth, A.A. and Niece, B.K. (1997). Chem. Rev. 97, 1129.
Gimzewski, J.K., Joachim, C., Schlittler, R.R., Langlais, V., Tang, H. and
Johannsen, I. (1998). Science 281, 531.
Goldman, R.S., Feenstra, R.M., Briner, B.G., O’Steen, M.L. and Hauenstein, R.
J. (1996). Appl. Phys. Lett. 69, 3698.
Gong, Q., Offermans, P., Nötzel, R., Koenraod, P.M. and Loolter, J.H. (2004).
Appl. Phys. 85, 5697.
Grant, M.L., Swartzentruber, B.S., Bartelt, N.C. and Hannon, J.B. (2001). Phys.
Rev. Lett. 86, 4588.
Gregory, S. (1990). Phys. Rev. Lett. 64, 689.
Güntherodt, H.-J. and Wiesendanger, R., Eds. (1992). Scanning Tunneling
Microscopy Vol. I & II (Springer, Berlin).
Hamers, R.J. (1989). Annu. Rev. Phys. Chem. 531.
Hamers, R.J., Tromp, R.M. and Demuth, J.E. (1986). Phys. Rev. Lett. 56, 1972.
Hanaguri, T., Lupien, C., Kohsaka, Y., Lee, D.-H., Azuma, M., Takano, M.,
Takagi, H. and Davis, J.C. (2004). Nature 430, 1001.
Hasegawa, Y. and Avouris, Ph. (1993). Phys. Rev. Lett. 71, 1071.
Heer, R., Smoliner, J., Strasser, G. and Gornik, E. (1998). Appl. Phys. Lett. 73,
3138.
Heinrich, A.J., Lutz, C.P., Gupta, J.A. and Eigler, D.M. (2002). Science 298, 1381.
Heinze, S., Bode, M., Kubetzka, A., Pietzsch, O., Nie, X., Blügel, S. and Wiesen-
danger, R. (2000). Science 288, 1805.
Hendriksen, B.L.M. and Frenken, J.W.M. (2002). Phys. Rev. Lett. 89, 046101.
Hla, S.-W. and Rieder, K.-H. (2003). Annu. Rev. Phys. Chem. 54, 307.
Hoffman, J.E., McElroy, K., Lee, D.-H., Lang, K.M., Eisaki, H., Uchida, S. and
Davis, J.C. (2002a). Science 297, 1148.
Hoffman, J.E., Hudson, E.W., Lang, K.M., Madhavan, V., Eisaki, H., Uchida, S.
and Davis, J.C. (2002b). Science 295, 466.
Horch, S., Lorensen, H.T., Helveg, S., Lægsgaard, E., Stensgaard, I., Jacobsen,
K.W., Nørskov, J.K. and Besenbacher, F. (1999). Nature 398, 134.
Hornbaker, D.J., Kahng, S.-J., Misra, S., Smith, B.W., Johnson, A.T., Mele, E.J.,
Luzzi, D.E. and Yazdani, A. (2002). Science 295, 828.
Horn-von Hoegen, M. (1994). Appl. Phys. A 59, 503.
Hou, J.G., Jinlong, Y., Haiqian, W., Qunxiang, L., Changgan, Z., Hai, L., Wang,
B., Chen, D.M. and Qinshi, Z. (1999). Phys. Rev. Lett. 83, 3001.
Hovis, J.S. and Hamers, R.J. (1997). Surf. Sci. 402, 1.
Jaklevic, R.C. and Lambe, J. (1966). Phys. Rev. Lett. 17, 1139.
Jaklevic, R.C., Lambe, J., Mikkor, M. and Vassell, W.C. (1971). Phys. Rev. Lett.
26, 88.
Jensen, J.A., Rider, K.B., Chen, Y., Salmeron, M. and Somorjai, G.A. (1999). J.
Vac. Sci. Technol. B 17, 1080.