Ionization Chamber Dosimetry 157
other than polymethylmethacrylate (PMMA) and is
restricted to cylindrical and spherical ionization chambers.
There is only limited knowledge of the dependence of
displacement correction factors on depth in phantom. [74]
Calculated dose values at points along the central lat-
eral axis (a line through the center of the cavity parallel
to the x-axis) are given in Figure 3.70 for the spherical
cavities located at 30-mm depth in the PMMA phantom.
A decrease in calculated dose values with increasing lat-
eral distance, l, from the center of the cavity is found.
This is due to an increase in the amount of phantom
material traversed by the photons with increasing lateral
distance from the center of the cavity. Due to partial lack
of side scatter, the calculated dose values at the maximum
lateral distance are still somewhat higher (up to about
10%) than the dose at the same depth in the homogeneous
phantom. Also shown in the figure are fits using STAR-
PAC, a least-squares program for nonlinear functions
[76], according to
(3.143)
The results of calculations of dose in the cavities rel-
ative to dose at 30-mm depth in the homogeneous phan-
toms, (D(r)/D(0)), for spherical cavities of different radii
placed with their centers at 30-mm depth inside the
PMMA, A-150 plastic, and EVA/28 phantoms are shown
in Figure 3.71 as a function of cavity radius.
It is evident from Figure 3.71 that the exponential fits
are superior.
When parallel-plate chambers are used for dosimetry
in electron fields, the AAPM dosimetry protocol recom-
mends a value of 1.0 for the replacement correction factor,
P
repl,pp,E
, until further data become available. P
repl,pp,E
for
five commercially available parallel-plate chambers was
measured by Reft and Kuchnir [77] as a function of elec-
tron energy from a nominal value of 5.5 to 22 MeV by
comparison with a cylindrical chamber whose P
repl, cyl,E
was obtained from data in the protocol. It was found that
for three of the chambers, P
repl,pp,E
is independent of
energy, consistent with unity within one or two standard
deviations (s.d.). For the fourth chamber, P
repl,pp,E
is sim-
ilarly consistent with one above 10 MeV but decreases at
lower energies, while for the fifth one it shows a system-
atic drop with decreasing energy.
For equal dose to the homogeneous medium at the
effective point of measurement, the following relation
holds:
(3.144)
where
M is the measured charge corrected for temperature,
pressure, polarity effect, and ion collection efficiency. P
repl
and P
wall
are the replacement and wall correction factors,
and pp and cyl refer to the parallel-plate and cylindrical
chambers, respectively. The effect of chamber polarity is
evaluated from the ratio of charges measured with positive
and negative polarizing voltages. For measurements in a
photon field, the AAPM protocol considers P
repl,pp,x
to
equal 1, and when a cylindrical chamber is used at d
max
,
P
repl,cyl,x
1, also. With the exception of the NACP cham-
ber, which has a graphite entrance wall, all measurements
were taken in a phantom matched to the chamber wall
material. Therefore, P
wall
1.0. Equation (3.144) then
reduces to:
(3.145)
where the notation is used to represent the ratio
(M
x
)
cyl
(M
x
)
pp
. For the NACP chamber, was
used; it varied from 0.995 to 0.997 over the energy range
investigated. In the case of the 22-MeV electron beam
irradiation, values of
P
repl,cyl,E
are available only for the
Farmer chamber. The Exradin cylindrical chamber, there-
fore, was not used with the electron beams. Following
recommendations of the AAPM protocol, P
wall
1 for all
chambers and P
repl,pp,E
1 at high electron energies.
Referring to Equation (3.144),
(3.146)
Using Equation (3.144) and (3.145), Reft and Kuchnir
found that for the matched pair of chambers in homoge-
neous media,
(3.147)
where
E and X refer to electron and photon fields, respec-
tively. All of the measurements were made in phantom
with a source-to-surface distance of 100 cm and the effec-
tive point of measurement of each chamber placed at
d
max
.
A 10 10-cm
2
field defined at the phantom surface was
used at nominal electron energies of 5.5, 6, 9, 12, 15, 18,
and 22 MeV from a Cl 2500 linear accelerator.
Results for P
repl
as a function of electron energy for
the five chambers are summarized in Table 3.19.
As seen in Figure 3.72, the experimentally determined
values of P
repl,pp,E
for the Holt, NACP, and Exradin cham-
bers are constant over the energy range investigated. The
respective average values are 0.985, 0.980, and 0.989 with
a standard deviation of 0.5% and an overall uncertainty
of 1% (63% confidence level).
The TG-21 protocol analyzes the replacement correc-
tion factor in two components: (a) gradient correction and
(b) electron fluence correction. The gradient correction,
according to the protocol, arises because, on the descend-
ing portion of a depth-dose curve, the proximal surface of
a cylindrical cavity intercepts an electron fluence that is
f
r
l() 1 dl bl
2
N
gas, pp
M
pp
P
repl, pp
P
wall, pp
N
gas, cyl
M
cyl
P
repl, cyl
P
wall, cyl
N
gas, pp
N
gas, cyl
Mx[]
pp
cyl
M
X
[]
pp
cyl
P
wall
1
gas, pp
N
gas, cyl
P
repl, E
[]
pp
cyl
M
E
[]
pp
cyl
P
repl, E
[]
cyl
pp
M
E
[]
pp
cyl
Mx[]
pp
cyl
()P
wall,pp, X
Ch-03.fm(part 2) Page 157 Friday, November 10, 2000 11:59 AM