
Kyoto, Japan). It consists of SisN4 matrix grains with
the mean diameter of about 1
pm
and aspect ratio 2 to
4, and a small number of the large grains of length up to
30
pm
and diameter
of
3 -6 pm, often containing pore-
like defects and nuclei fiom seeding (Fig.
2).
Secondary
phases in the pockets
are
crystalline and they contain
Lu, which was also reported in the gas-pressure sintered
version of this grade, SN 282 [5]. The mean value
of
the four-point bending strength (3040 mm) at room
temperature is 687d26 MPa; at 1200°C it is
approximately
680
MPa, and 580 MPa at 1400°C [6-71.
Fig.
2.
The microstructure
of
the silicon nitride studied
with typical bimodal grain size distribution.
Tensile Creep Testing
The tensile tests were performed on flat, dog-bone
specimens (SR51 type [8]). The gage size of the
specimens is 2 mm x 2.5 mm and the gage length is 15
mm. They were loaded via single pin Sic pull rods,
lever
arm
and dead weight. Tensile strain was measured
in
situ
using a pair
of
silicon carbide flags suspended by
their own weight on the specimen and laser-
extensometry system [8]. The raw data were recorded by
PC in the interval of
5
min
or
15 min and averaged over
a time period corresponding to 3 to 7 data points.
Details of the testing procedure are described elsewhere
Twenty-one specimens were tested
in
air at 1350"C,
1400"C, 1450"C, 1500°C and 1550°C at the stresses
ranging fiom 150 MPa to 380 MPa and periods up to
10
000
h. Two specimens broke during loading. Three
specimens broke prematurely and the measurement
system failed in three of the tests. Data fiom these
specimens were excluded
from
consideration.
[8-
101.
Microstructure Characterization
The phase composition
of
the specimens was
investigated by X-ray difhction at 40 kV (Cu
K,,
h
=
1.54046
A)
fiom different zones
of
the bulk samples.
The interior of the specimens, revealed by grinding
away half of the specimen thickness, was used
as
a
representative composition for the evaluation of the
changes in the bulk.
The samples for the transmission electron
microscopy (TEM) studies were prepared
hm
fm
creep tested specimens. They were cut from the core
of
gage section parallel to the direction of the applied
stress. After hand grinding and polishing to -100 pm
thickness and dimpling, the foils were thinned by ion
milling at
5
kV using Ar gas until foil perforation.
Transmission electron microscopy investigations
on
carbon coated specimens were carried out at 200 kV and
400 kV.
Creep damage was investigated by a scanning
electron microscope (SEM) on the secondary
fmcttm
surfaces produced at room temperature after creep and on
the polished and plasma etched cross sections.
Anomalous Ultra SmalCAngle X-ray Scattering
Cavity size distribution and the evolution of the
secondary phase pockets were investigated using
anomalous ultra small-angle X-ray scattering on the
beam line 33ID-D at the Advanced Photon Source at
Argonne National Laboratory. The beam incident on the
sample was monitored by an ionization chamber. The
beam scattered by the sample was detected by a silicon
PIN photodiode operating in an unbiased mode. The
details of the USAXS instrument were reported
elsewhere
[
1
I].
The samples with the dimensions of 2.5 mm x 4
mm x
0.15
mm were prepared fiom the as-received
material and hm the gage and grip zones of three
specimens after creep. The grip-gage pairs of specimens
were used to eliminate the effects of initial porosity and
possible changes in the microstructure during prolonged
heat treatment on cavity and pocket size distributions.
Data collection fiom USAXS scan for each specimen
required approximately 20 min with a
5
s
counting time
per data point. The iterative method of Lake was used
to desmear the data [12].
The anomalous USAXS technique involves
measurement at -250 eV,
-100
eV, -40 eV and
-10
eV
below the
LIII
absorption edge energy, which is 9244 eV
for Lu. The presence of LuaSi207 as the secondary phase
was assumed in the calculations. The details of the A-
USAXS technique and evaluation method were reported
elsewhere
[
131.
RESULTS
Creep Behavior
Fig. 3 shows the long-term tensile creep behavior
of
the material at 1400°C under the stress of
200
MPa.
The
test
was interrupted prior
to
failure after 10,200 h.
During this period, the test was interrupted once due to
the power outage. The total strain is around
0.5
%,
however, due to the several failures in the data
collection, an uncertainty of
>
0.1% is included.
Despite that, the transient stage exceeds
6000
h azd
the
strain rate after this period is less than
1
x
10-
I/s,
close to the limit of the laser extensometer resolution. A
conservative estimate
of
the minimum strain rate at
these conditions is
7
x
lo-"
l/s. Similar transient creep
was observed at 1450°C. The short-term tests at
1550°C indicated conventional creep behavior with the
primary and secondary stages. However, these data were
affected
by the oxidation of the Sic pull rods which
form glass bubbles which interact with the laser beam.
Because of prolonged lifetime, the number of tests
performed until fmal failure was limited. Stress
dependence of the minimum strain rate fiom the tests
unaffected by premature failure is summarized in Fig. 4.
It can be seen that the stress exponent exceeds 6.
488