Czichos H., Saito T., Smith L.E. (Eds.) Handbook of Metrology and Testing
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1218 Subject Index
mirabilite 822
MIS
(metal–insulator–semiconductor)
514
miscibility gap 1085
MISFET (metal–insulator–semicon-
ductor FET)
513
MITI (Ministry of International Trade
and Industry of Japan) 799
mixing 266
MKS units 26
MKSA (meter, kilogram, second,
ampere) 11
MLE (maximum-likelihood
estimation) 953
MLLSQ (multiple linear least
squares) 182
MMF (minimum mass fraction)
180
MnBi 647
mobile carrier
– effective mass 517
–profile 517
mobility 491
mode field diameter (MFD) 632
mode locking 601, 619
mode of sampling 44
model structures 232
modeling approach to measurement
uncertainty 75
mode-locked fiber laser 637
mode-locked laser 619, 621
modulus of elasticity (MOE) 341,
778
MOE (modulus of elasticity) 341,
778
moiré pattern 256
moiré topography 652, 655
moisture resistance 647
MOKE (magnetooptic Kerr effect)
546, 583
MOL 614
MOL based on semimagnetic
semiconductor 611
molar purity 155
molecular
–analysis 195
– architecture 258
– displacement 528
– dynamics (MD) 975
– technique 825
moment-measuring coil 547, 554
momentum conservation 603
momentum-scaling method 980
monitoring of
– composites 949
monitoring of efficiency of inhibitor
732
monochromator 227, 594
monolayer 292
MOS (metal–oxide–semiconductor)
516
Mößbauer spectroscopy 197, 250
motif parameter 315
motional narrowing 267
mouth opening displacement 412
MRA (mutual recognition
arrangement) 99
MRR (median rank regression) 953
MS (mass spectrometry) 146, 147,
168, 735
multiaxiality 1018
multichannel advantage 594
multichannel analyzer (MCA) 621
multimode operation 601
multiple linear least squares
(MLLSQ) 182
multiple-phonon scattering 604
multiplex advantage 594
multiplexed sensor 934
multiscale method 1059
multiscaled heterogeneous
deformation 395
muon spin resonance 230
muon spin rotation 247
Murnaghan equation 1069
muscle spindle 649
mutual exclusion 604
mutual inductor 560
mutual recognition arrangement
(MRA) 99
Mètre des Archives 24
N
NAB (national accreditation body)
88
nanogranular 1112
nanoparticle 796
nanoscale field distribution 607
nanoscopic architecture 205
nanostructured semiconductor
material 605
narrow-band filtering 634, 635
national accreditation body (NAB)
88
National Bureau of Standards 25
National Institute of Standards and
Technology (NIST) 149, 503
national measurement institute (NMI)
88
National Metrology Institute (NMI)
149, 377
National Physics Laboratory (NPL)
25, 496
national standard 198
natural
– constant 5
– glass (obsidian) 812
– material 16
Navier 341
Nd:YAG laser 616, 619
NDE (nondestructive evaluation)
21, 888
NDT (nondestructive testing) 778,
888, 907
near infrared (NIR) 149
near-edge x-ray absorption fine
structure (NEXAFS) 239
near-field luminescence image 607
near-field optical microscopy (NOM)
605, 606
near-field transmission image 607
necking 391
negative temperature 600
neighbor distances 239
nematic phase 237
Nernst equation 672, 674
net plane 212, 237
network analyzer 532
Neumann boundary condition 1037
neutral axis 340, 341
neutron 211, 238
– activation analysis (NAA) 161,
194
– depth profiling (NDP) 163
– diffraction 269
– generator 160
– reflectance (NR) 298
new approach (European economy)
131
Newton–Raphson method 1055
NEXAFS (near-edge x-ray
absorption fine structure) 239
Ni
2
MnGa 1109
Ni–Al 1073
Ni–Al–C 1083
NIR (near infrared) 149
NIST (National Institute of Standards
and Technology) 503
nitrifying bacteria 815
nitrogen 259, 824
nitrokalite 822
nitronatrite 822
Subject Index
Subject Index 1219
NMI (national measurement institute)
88
NMI (National Metrology Institute)
149, 377
NMR (nuclear magnetic resonance)
230, 545, 546
NMR spectroscopy 196
node 1034
NOE (nuclear Overhauser effect)
261, 266
NOESY (nuclear Overhauser effect
spectroscopy) 266
noise
– figure 636
– spectroscopy 242
– thermometer 472
NOM (near-field optical microscopy)
605, 606
Nomarski microscope 217
nominal
–strain 389
–stress 389
noncontact AFM 224
noncontact mode 319
nondestructive evaluation (NDE)
21, 888
nondestructive testing (NDT) 778,
888, 907
nonlinear 319
–crystal 617
– dielectric response 528
– fluorescent microscopy 275
– optics 614
– refractive index 617, 630, 632
– spectroscopy 623
– susceptibility 614, 616
nonlinearity 289
– second-order 615, 616
nonmetallic material 15
nonproportional loading 1018
nonradiative decay 599
nonradiative process 623
nonwoven 806
Nose–Hoover thermostat 981
NPL (National Physics Laboratory)
496
NPL primary conductivity standard
497
NRA (nuclear reaction analysis)
298
NTC thermistor 477
nuclear magnetic moment 259
nuclear magnetic resonance (NMR)
230, 545, 546
–analysis 259
– spectroscopy 154
nuclear orientation thermometry
481
nuclear Overhauser effect (NOE)
261, 266
nuclear Overhauser effect
spectroscopy (NOESY) 266
nuclear quadrupole interaction 230
nuclear reaction analysis (NRA)
298
nuclear spin 229, 259
nucleic acid probe 837
number of samples 44
numerical aperture 626
numerical error 1056
n-value 392
Nyquist formula 472
Néel temperature 543
O
OA (operational amplifier) 672
object-to-detector distance (ODD)
905
OCT (optical coherent tomography)
655
ODD (object-to-detector distance)
905
ODF (orientation distribution
function) 270
ODMR (optically detected magnetic
resonance) 230, 247
odor control 811
OECD 797
off-resonance 263
Ohm’s law 475, 476
ohmic contact 524
oil 816
OIML (International Organization of
Legal Metrology) 11
one-dimensional (1-D) NMR 263
on-site corrosion testing 699
opal 812
opening mode 408
operating parameter 7
operation
– single-mode 601
operational amplifier (OA) 672
operationally defined properties
119
optical
– absorption 268
– atomic spectrometry 192
– coherent tomography (OCT) 655
– conductivity 598
– constant 595, 644
– emission spectrometry (OES)
158, 159, 193
–fiber 626, 627
– fiber type 936
–flat 323
– force detection 318
–gain 600
– indices
complex 529
– Kerr effect 617
– Kerr shutter 622, 623
– laser distancemeter 650
–microscopy(OM) 215
– parametric amplifier (OPA) 620
– parametric generation (OPG) 616
– property 587
– pulse method 629
– pumping 600
– pyrometry 654
– rectification 616
– rectification (OR) 625
– rotary dispersion (ORD) 268
– scanning techniques 308
– sectioning 652
– spectroscopy 196
– spectrum analyzer (OSA) 939
– stylus profilometry 316
– technique 316
– time domain reflectometry (OTDR)
941
– time-domain reflectometer (OTDR)
627, 937, 940
– time-domain reflectometry (OTDR)
628
– tip 606
optical disk 642, 645
–memory 641
– rewritable optical disk 641
optically detected magnetic
resonance (ODMR) 230, 247
opus cementicium 812
OR (optical rectification) 625
orbital angular momenta 229
order–disorder transition 1071
ordering 1063
organic
– layer 298
– material 15
– pollution 816
– vapor 816
organogenic pigmentation 820
orientation distribution function
(ODF) 270
Orowan loop 403
Subject Index
1220 Subject Index
oscillator model 614
Ostwald ripening 1107
OTDR (optical time-domain
reflectometry) 628
outdoor exposure trial 829
output coupler 601
overlapping signal 262
overwrite 646
oxalate film 812
oxidation 792
–behavior 721
– kinetics 721
–rate 723
oxoglutaric acid 823
oxygen 243
– sputtering 301
P
PA (polyamides) 848
PAA (photon activation analysis)
165, 194
PAC (perturbed angular correlation)
230, 248, 546
PAHs (polycyclic aromatic
hydrocarbons) 150
PAM-CRASH 1051
paper 803
paracrystal 235
parallel electron loss spectroscopy
282
parallel-plate resonator 536
paramagnetic current 259
paramagnetic state 1081
parametric method 321
Paris’ equation 401
Paris’ law 420
Parrinello–Rahman method 982
partial differential equation 1035
– second-order 1047
partial dislocation 254, 255
partial distribution function 238,
239
particle
– induced x-ray emission (PIXE)
166
– method 1057
– shape 274
–size 44
particulate organic matter (POM)
860
PAS (positron annihilation
spectroscopy) 249
passive mode-locking 620
path-independent contour integral
410
patina 813
Patterson function 232
PC (polycarbonate) 303
PC antenna 626
PCF (photonic crystal fiber) 639
PCR (polymerase chain reaction)
833, 834
PDMS (poly(dimethyl siloxane)
428
PDMS (poly(dimethyl siloxane))
295, 304
peak 322
– broadening 257
– separation 233
–shift 258
peer assessment 136
PE-HD (high-density polyethylene)
853
Pendellösung 220, 255
penetrating radar 778
penetration depth of electrons 608
Penning ionization 146
peptide 268
performance 19
– control 887
periodic
– boundary condition 978
permalloy 544, 584
permeability 547, 557, 561, 563
– complex 563
permeameter 557
permeation 426
permittivity, complex 527
permutation symmetry 614
Perovskite 1079
perpendicular magnetic anisotropy
648
perpendicular magnetization 641,
647
PERSF (pure element relative
sensitivity factor) 286, 291, 297
perturbation expansion 615
perturbed angular correlation (PAC)
230, 248, 546
Petrov–Galerkin method 1039
PGAA (prompt gamma activation
analysis) 162
phase
– boundary 254
– compression 630
– contrast computed tomography
929
–diagrams 1061
– mask technique 633
– problem 232
– separation 1076
– shift method 629
–stress 404
– transformation 356, 1023, 1091
phase matching 623
– condition 617
phase-change optical disk 641
phase-field method 1092
phase-shift interferometry (PSI)
317
PHB (poly(β-hydroxy butyrate))
796
pheromone 786
phonon 211, 228, 596
phosphorescence 149–151
photoabsorption 244
photoacoustic method 460
photoacoustic spectroscopy 599
photocalorimetric
– spectroscopy 599
photochemical ageing 849
photodiode 519
photoelectron emission 231
photogrammetry 321
photoinitiated ageing 849
photoionization detector (PID) 168
photoluminescence (PL) 244
photomultiplier tube (PMT) 159,
600, 908
photon activation analysis (PAA)
165, 194
photonic crystal fiber (PCF) 639
photosensitivity 633
photosensor
–APD 620
–PD 620
–PMT 620
photostimulated luminescence (PSL)
910
photothermal method 460
Physikalisch-Technische
Bundesanstalt (PTB) 504
pick-up 312
PID (photoionization detector) 168
piezoactuator 223
piezoceramics 945
piezoelectric
– effect 945
– load cell 755
– material 319
piezoelectricity 493
pigeon 814
pipe method 458
pitting 701, 818
PL (photoluminescence) 244
PL excitation spectroscopy 600
PL spectroscopy 599
Subject Index
Subject Index 1221
planar defect 254
Planck distribution 599
Planck’s law 472, 479, 480
plane–strain fracture toughness 411
plasma frequency 597
plasmon 218, 231
plastic
– anisotropic coefficient 359, 362
– constraint 410
– optical fiber 639
– strain hardening 359, 360
– strain ratio 359, 362
– strain-rate sensitivity 360
– work hardening 359, 360
plastic loading modes
– ball punch 364, 365
– bending 364
– biaxial tension, indentation 358
– compression tests 362
– compression, tension 358
– driftexpansion 365
– earing 365
– flanging 365
– flattening 365
– hardness, multiaxial compression
358
– ringexpansion 365
– shear 364
– shear testing 363
– shear, bending, torsion 358
– torsion 364
– torsion testing 364
– torsion testing, hot tensile,
multiaxial 366
– tube ring hydraulic pressure 365
– uniaxial tension test 360
– uniaxial tension, compression 358
plastic yielding
– Tresca criterion 355
– von Mises criterion 355
plasticity 355, 1014
–clay 356
– creep 361
– dependency, creep 361
– isotropic hardening 366
– kinematic hardening 366
– superplasticity 362
– temperature effects, time 361
plastics 789
– biodegradable 789
– compostability 799
plate capacitor model 514
plidulation 649
PMMA (poly(methyl methacrylate)
440
PMMA (poly(methyl methacrylate))
304
PMT (photomultiplier tube) 159,
600, 908
point group 235
point sensor 934
point-by-point
– scan 308
– technique 633
Poisson’s ratio 340, 343, 391, 1045
– determination by static methods
347
– on ceramics 348
polar Kerr effect 641
polar Kerr magnetometer 648
polariton 596
polarizability 228
polarization 595, 596
– dielectric 485
– electronic 492
– of electron spin 1064
– orientation 492
– saturation 528
– selection rule 604
pole
–coil 551
– figure 269
poly(1-trimethlsilyl-1-propyne)
(PTMSP) 433, 442
poly(dimethyl siloxane) (PDMS)
295, 304, 428
poly(methyl methacrylate) (PMMA)
304, 440
poly(β-hydroxy butyrate) (PHB)
796
polyacetylene 490
polyamides (PA) 848
polyaniline 490
polyatomic ion 305
polycarbonate (PC) 303
polycrystalline AgBrCl fiber 639
polycyclic aromatic hydrocarbons
(PAHs) 150
poly-l-lysine 306
polymer 15, 235, 258, 791, 848
– amorphous 796
–blend 303
– conducting 490
– elastic constants 347
– optical fiber (POF) 944, 945
polymerase chain reaction (PCR)
833, 834
polymers and composite materials
878
polypyrrole 490
polytetrafluoroethylene (PTFE,
Teflon) 153, 304
polyurethane 824
polyvinylchloride (PVC) 303, 772,
790
polyvinylidene fluoride (PVDF)
890, 945
POM (particulate organic matter)
860
pop-in 414
population inversion 600
pore 322
pore size evaluation 925
porphyr 812
positron annihilation spectroscopy
(PAS) 249
positron lifetime 249
postsputtering oxidation 301
post-test evaluation 731
potential profiles measurement 690
potential–pH diagram 675
potentiometric method 476
potentiostatic corrosion testing 672
Pourbaix diagram 675
powder diffraction 233, 269
P-profile
– primary 312
Pr-doped fiber amplifier 637
precipitation hardening 403
precision 115
preconditioning, natural 776
preferential sputtering 292
preparation 264
preservation of samples 45
primary
– cell, flow-through 507
– method 119
– P-profile 312
– reference measurement procedure
119
– reference solution 503
– standard 198
– structure 258
principal stress 1047
prism 593
probe 318
– tip 223
procedure 323
– reference 6, 118
– versus method 118
process
– single-quantum 262
process control 313
– parameter 322
proficiency test (PT) 48, 76, 88
Subject Index
1222 Subject Index
profile parameter 314
profilometry 761
projection 313
prokaryote 814
prompt gamma activation analysis
(PGAA) 162
property of materials 17
property, mechanical 790
proportion of total variance 43
proportional limit 359, 391
protein 258, 268, 303
protoctist 814
proton 259
proton-hopping mechanism 501
protozoa 814
provisional low temperature scale of
2000 473
pseudo-eucentric tilting 321
Pseudomonas 817
Pseudomonas aeruginosa 817
pseudopotentials 1067
PSI (phase-shift interferometry)
317
PSL (photostimulated luminescence)
910
PT (proficiency test) 48, 88
PT reference values 121
PTB (Physikalisch-Technische
Bundesanstalt) 504
PTC thermistor 477
PTFE, Teflon
(polytetrafluoroethylene) 153,
304
PTMSP
(poly(1-trimethlsilyl-1-propyne))
433, 442
pulse
– calorimetry 462
– field magnetometer (PFM) 546
– measurement 693
– oximetry 655
– sequence diagram 263
pulsed laser 601, 618
pulse-field magnetometer 541
pulse-width modulation (PWM)
559
pulverization 818
pump–probe experiment 621, 623,
624
pure element relative sensitivity
factor (PERSF) 286, 291, 297
purity 178
purity of water conductivity 506
push rod dilatometry 470
PVC (polyvinylchloride) 303, 772,
790
PVDF (polyvinylidene fluoride)
890, 945
PWM (pulse-width modulation)
559
PZT (lead zirconate titanate) 945
Q
QMR (quasiminimal residual
method) 1058
QNMR (quantitative proton nuclear
magnetic resonance) 155
Q-switch 618
quadrupole 147
– splitting 251
qualification 111
quality
– assurance (QA) 98
– control (QC) 98
– control chart 116
– internal 112
quantification 301, 308
– of inhomogeneous samples 292
– of thin homogeneous overlayers
297
quantitative analysis 286
quantitative proton nuclear magnetic
resonance (QNMR) 155
quantum
– efficiency 599
– spectroscopy 529
quantum-based standards 28, 29
quantum-well magnetooptic layer
613
quasicrystal 237
quasi-distributed sensor 934,
940–942
quasiminimal residual method
(QMR) 1058
quasistatic test procedure for elastic
constant determination 346
quasistatic-loading 388
quaternal structure 258
Q-value 618
R
radiation
–solar 848
radiation source
– thermal 588
radiation thermometer 472, 479
radiative decay 599
radioactive tracer technique 762
radiochemical NAA (RNAA) 161
radiofrequency (RF) 147, 159
radionuclide wear measurement
762
radius of gyration 273
Raman
– active 603
–gain 631
– scattering 228, 239, 272, 603
– spectroscopy 151, 197, 243, 603
–tensor 604
random amplified polymorphic DNA
(RAPD) 836
range of scalability 320
RAPD (random amplified
polymorphic DNA) 836
rapid solidification 995
rare-earth transition-metal (RE-TM)
647
raster scanning 318
rate equation 598
rate window 522
Rayleigh scattering 602, 627
RBS (Rutherford backscattering
spectrometry) 240, 297, 645
RDE (rotating disc electrode) 685,
686
reabsorption 600
reaction rate constant 646
reciprocal lattice 212
reciprocal space 215
reconstruction from stereo pairs
321
recording density 646
recrystallization 1110
reduction in area 392
redundancy 963
reentrance 322
reference
– binding energy 295
– data determination 121
– electrode (RE) 672
– laboratory 126
– material (RM) 6, 34, 48, 109,
110, 493
– measurement procedure 118
primary 119
– measurement service 121
– measurement standard 126
– method 118
–organism 833
– procedure 6, 118
– product 774
– solution
primary 503
– spectrophotometer 148
–value 117
reflection 594
Subject Index
Subject Index 1223
– signal 316
reflectivity 594
refractive index 217, 236, 595, 644
– complex 626
regenerative amplifier 620
regional metrology organization
(RMO) 10, 29, 31
regular solution model 1062
relative complex permittivity 529
relative sensitivity factor (RSF)
147, 296, 301
relaxation
– peak 231
– spectroscopy 242
– time 231, 242
reliability function 951
remanence 547
repetition rate 621
representation theorem 1018
requirements for reference
procedures 119
resistance 486
– bridge 476
– measurement 494
– thermometer 475
resolution 310
resolved shear stress 1028
resonance transition 529
resonant Raman scattering 229,
243, 604
resonant transition 528
resonant vibrating cantilever mode
319
restriction endonucleases 836
restriction fragment length
polymorphism (RFLP) 836
retention time 267
reticuliterme 785
Reticulitermes santonensis 787
retina examination 655
RE-TM (rare-earth transition-metal)
647
reversed-phase liquid
chromatography (RPLC) 169
reversible phase transition 641
RF (radiofrequency) 147, 159
RFLP (restriction fragment length
polymorphism) 836
rhodium–iron thermometer 477
ribosomal RNA (rRNA) 835
ribotyping 837
Rietveld method 234
rigid band approximation 1078
ring specimen 556
river pattern 425
RMO (regional metrology
organization) 10, 29, 31
RNAA (radiochemical NAA) 161
rock varnish 816
rolling direction 1021
rolling motion 751
room fire 876
root mean square 314
– deviation 315
rotating disc electrode (RDE) 685,
686
rotating ring disc electrode (RRDE)
686
roughness 312
– measurement 312
– R-profile 312
RPLC (reversed-phase liquid
chromatography) 169
RRDE (rotating ring disc electrode)
686
rRNA (ribosomal RNA) 835
RSF (relative sensitivity factor)
147, 296, 301
ruthenium-oxide sensor 481
Rutherford backscattering
spectrometry (RBS) 240, 297,
645
r-value 392
S
S/N (signal-to-noise ratio) 154
SAD (selected area diffraction) 234
SADCMET (Southern African
Development Community
Cooperation in Measurement
Traceability) 29
sample rotation 293
sampling 40, 312
– and analytical quality control
scheme (SAQCS) 45
– length 313
– proficiency test (SPT) 42
–target 44
– uncertainty 41
sandstone 812
sap stain 777
sapphire crystalline fiber 639
satellite spots 234
saturation
–coil 547, 562
– magnetization 543
– magnetometer 562
– polarization 562
Savitzky and Golay smoothing 290
SBS (sick-building syndrome) 860
scale of materials 16
scanner tube 319
scanning confocal laser microscopy
(SCLM) 837
scanning electrochemical microscopy
(SECM) 690
scanning electron microscopy (SEM)
180, 222, 292, 308, 309, 320, 424,
607, 645
– cathodoluminescence mode
(SEM-CL) 257
scanning force microscopy (SFM)
689
scanning nanoindenter 273
scanning near-field optical
microscopy (SNOM) 225, 272,
282
scanning probe microscopy (SPM)
223, 281, 308, 318
scanning reference electrode
technique (SRET) 691
scanning transmission electron
microscopy (STEM) 179, 221
scanning tunneling microscopy
(STM) 223, 241, 282, 309, 318,
672, 689
scanning tunneling spectroscopy
(STS) 224
scanning vibrating electrode
technique (SVET) 691
scanning white-light interferometry
(SWLI) 317
scattering 211, 602
– parameter 532
– wave vector 213
Scherzer defocus 221, 254
schlieren 653, 654
Schottky
– contact 514
– defect 491
Schrödinger equation 1067
scialbatura 812
SCLM (scanning confocal laser
microscopy) 837
scratch test 407, 753
screening of electric field 609
SD (strength difference) 393
SDO (standards development
organization) 361
sealed x-ray tube 233
SEC (specific energy consumption)
846
SECM (scanning electrochemical
microscopy) 690
Subject Index
1224 Subject Index
second boundary condition 1037
secondary electron SEM (SEM-SE)
222
secondary emission 868, 869
secondary ion mass spectrometry
(SIMS) 159, 281, 282, 298, 645
secondary ion mass spectroscopy
(SIMS) 517
secondary structure 258
second-harmonic generation (SHG)
616, 624, 655
–microscopy 275
second-order
– Laue zone (SOLZ) 235
– nonlinearity 615, 616
– partial differential equation 1047
seconds pendulum 24
Seebeck effect 478
segregated phosphorus 287
selected area diffraction (SAD) 234
selection rule 228, 247, 603, 623
selective corrosion 704
selective polarization inversion (SPI)
264
self-diffusion coefficient 1106
self-focusing 617
self-phase modulation (SPM) 617,
630
Sellmeier equation 628
SEM (scanning electron microscopy)
180, 222, 292, 308, 309, 320, 424,
607, 645
semiconductor 15, 486
– band bending 514
– characterization method 508
– compound 489
– conductivity measurement 507
– deep level 519
–device 523
– doping profile 515
– electrical property 488
–implanted 516
– laser 601
– property 508
– purity 513
semi-volatile organic compound
(SVOC) 860, 867
SEM-SE (secondary electron SEM)
222
SENB (single-edge notch bend)
714
sensing technique 932
sensitivity factor 302
sensor 932, 934
– effect 935
– integration 933
SER (specific emission rate) 866
SFG (sum-frequency generation)
616
SFM (scanning force microscopy)
689
shadowgraph 653, 654
shape of contact asperities 322
SHE (standard hydrogen electrode)
673
shear
– lag model 407
– modulus 340, 343
–strain 396
–stress 396
sheet carrier concentration 510
sheet resistance 525
SHG (second-harmonic generation)
616, 624, 655
shiny 316
Shirley background 295
Shockley partial dislocation 255
short-range order 237
short-terminated probe 531
SI (International System of Units)
11
SI unit 25, 26, 35, 198
sick-building syndrome (SBS) 860
side groove 414
Siderococcus 816
signal amplitude 646
signal processing 934
signal-to-noise ratio (S/N) 154
silane 824
silica optical fiber 936
silicon
– doping level 524
– drift detector (SDD) 181
– lattice 489
siloxane 824
silver 813
SIM (Sistema Interamericano de
Metrología) 29
SIMS (secondary ion mass
spectrometry) 159, 282, 298, 645
SIMS (secondary ion mass
spectroscopy) 517
single crystal 258
single quantum dot spectroscopy
605
single-edge notch bend (SENB)
714
single-edge notched (SEN) bend
specimen 411
single-mode
– laser 618
– operation 601
single-molecule
– spectroscopy 605
single-quantum
– process 262
single-sheet
– tester (SST) 547, 560
singularity zone 409
sinter 812
Sistema Interamericano de
Metrología (SIM) 29
size 214, 273
– effect 258
skewness 315
skin
– spectroscopy 655
sliding motion 751
slimicide 805
slow neutrons 212
slow strain rate testing 708
small crystals 214
small-angle
– grain boundary 256
small-scale yielding condition 409
smart
– material 932, 933
– structure 932, 933
SMART layer (Stanford
multi-actuator receiver
transduction layer) 946
smectic phase 237
smouldering ignition 872
S–N curve 399
Snoek relaxation 242
SNOM (scanning near-field optical
microscopy) 225, 272, 282
SOD (source-to-object distance)
905
soft
– magnetic materials 541
– material
magnetically 544
– pulse 263
–rot 776
– surface 316
software gage 323
soil burial trial 804
solar
– radiation 848
solidification 1102
solid-solution hardening 403
solid-state
– amorphization 993
– laser 601
–NMR 248
soliton 630
solubility 1071
Subject Index
Subject Index 1225
solute retention 169
solution calorimetry 467
sonic stress wave 778
SOR (successive overrelaxation
method) 1058
sorbent for air analysis 865
sounds tapping 786
source of measurement uncertainty
72
source-to-object distance (SOD)
905
Southern African Development
Community Cooperation in
Measurement Traceability
(SADCMET) 29
space charge region 514
S-parameter set 315
spark 159
Spark OES (spark optical emission
spectrometry) 158
spark optical emission spectrometry
(Spark OES) 158
spatial resolution 215, 272, 282,
285, 607, 613
– beyond the diffraction limit 606
specific contact resistance 525
specific emission rate (SER) 866
specific energy consumption (SEC)
846
specific heat capacity 454
specific resistance
– measurement 511
specific wear rate 747
specimens to measure elastic
constants 344
spectral band radiation thermometers
479
spectral response 850
spectral sensitivity 850
spectrometer 600, 644
– energy scale 288, 295
– transmission function 290
spectrophotometer
– reference 148
spectroscopy 623
– photocalorimetric 599
– single-molecule 605
–skin 655
spectrum meter 646
specular reflection 233
SPF (superplastic forming) 362,
365
SPI (selective polarization inversion)
264
spin
– decoupling 264
– echo 264
–finish 803
–glass 544
– Hamiltonian 230, 245
– operator 1068
–wave 580
spin–lattice relaxation 261
– time 248
spinodal decomposition 1107
spin–orbit
– coupling 230, 245
spin–spin
– coupling 260
– relaxation 261
split cavity resonator 536
split-post dielectric resonator 536
SPM (scanning probe microscopy)
223, 281, 308, 318
SPM (self-phase modulation) 617,
630
spontaneous emission 599
spontaneous ignition 872
spontaneous magnetization 543,
579
spring back 365
sputter depth profiling 282, 292,
298
sputtering 147, 159
– yield 293
SQUID (superconducting quantum
interference device) 497
SQUID magnetometer 545, 580,
581
SRE (stray radiant energy) 148
SRET (scanning reference electrode
technique) 691
SRS (stimulated Raman scattering)
631
stable crack extension 413
stacking fault 239, 252, 254, 258
– intrinsic 255
stain 776
standard addition approach 170
standard hydrogen electrode (SHE)
673
standard platinum resistance
thermometer 473
standard time–temperature curve
876
standard uncertainty 503
standards development organization
(SDO) 361
Stanford multi-actuator receiver
transduction layer (SMART layer)
946
static bending technique 778
static SIMS 283, 303
static tester 644
statistical surface description 321
steel 813, 877
Stefan–Boltzmann
– constant 654
–law 472, 475, 480
STEM (scanning transmission
electron microscopy) 179, 221
STEM-EELS 272
step-meter 644
stereogram 274
stereographic projection 269
steric local configuration 261
stimulated Brillouin scattering 631
stimulated Raman scattering (SRS)
631
stitching 320
STM (scanning tunneling
microscopy) 223, 241, 282, 309,
318, 672, 689
stochastic method 981
Stokes
– process 603
– scattering 603
–shift 228, 244, 631
Stokes–Wilson scattering 240
storage oscilloscope
– digital 621
strain 341, 342
– distribution 273
– gauge 754
– localization 1021
– measurement 346
– nominal 389
– sensitivity 938, 939
–true 390
stray radiant energy (SRE) 148
streak camera 621, 622
strength difference (SD) 393
strength of materials 388
Streptomyces 818
stress 273, 341
– athermal 402
– corrosion 706
– corrosion cracking (HISCC) 706
– corrosion cracking (SCC) 405
– corrosion test 707
– intensity factor 408
– intensity factor range ΔK 419
Subject Index
1226 Subject Index
– nominal 389
– strength interference 952
– thermal 402, 1023
–true 390
– yield 359
stress–strain
–curve 389, 1113
– relations 343
– relationship 1045
stretched zone (SZ) 425
– width (SZW) 417
striations 426
structural
–analysis 258
– health monitoring (SHM) 932
– material 877
– phase transformation 1108
structure
– primary 258
structure factor 214, 232
structure–property relation 7
STS (scanning tunneling
spectroscopy) 224
stylus 310, 312
– instrument 312
– profilometry 308, 312
subaerial biofilm 811
subaquatic biofilm 811
sublattice model 1063
success run 958
successive overrelaxation method
(SOR) 1058
sum-frequency generation (SFG)
616
superconducting material 488
superconducting quantum
interference device (SQUID) 497
superconductor 497, 598, 625
– ceramic 488
– high-T
c
488
supercooled liquid 642
super-hyperfine structures 246
superlattice 234
superplastic forming (SPF) 362,
365
superstructure 1068, 1069
surface
–analysis 283
– charge density 492
– chemical analysis 282
– contamination 287
– enhanced Raman scattering 229
–erosion 792
– inversion point 516
– mapping 320
– of reference 1063
– plasmon resonance 274
– potential microscope (SPOM)
645
– recombination 523
– replication 765
– roughness 222, 1029
–soft 316
– state parameter 523
–tester 312
– texture calibration standard 323
– topography analysis 308, 325
–worn 764
surrounding coil 549
susceptibility 547, 563
SVET (scanning vibrating electrode
technique) 691
SVOC (semi-volatile organic
compound) 860, 867
swarming insect 786
swelling 818
swelling of the crater floor 301
SWLI (scanning white-light
interferometry) 317
symmetry property 614
synchrotron radiation 221, 232,
274, 277
synchrotron refraction computed
tomography 929
system reliability 962
systematic errors
– from sampling 42, 50
SZ (stretched zone) 425
T
TAC (time-to-amplitude converter)
621
Tafel plot 679, 682
tapping sound 786
TBCCO (tellurium-barium-calcium-
copper-oxide)
497
TC213 309
TDI technology (time-delayed
integration) 912
TDS (time-domain spectroscopy)
625
TDS (total dissolved solid) 499
Te
81
Ge
15
Sb
2
S
2
642
Te-based eutectic alloy 642
technical object 6
tellurium-barium-calcium-copper-
oxide (TBCCO)
497
TEM (transmission electron
microscope) 270
temper brittling 286
temperature
– dependent-color material 654
– melting 793
– sensitivity 939
–sensor 471
– unit kelvin 473
template for reference procedures
123
tensile
– strength (TS) 392
– test specimen 115
tension test 389
tensor 614
terahertz (THz) 625, 656
– imaging 626
termite 781, 783, 785, 786, 788
– dog 786
– galleries 783
– tubes 783
terpene 867
tertiary structure 258
test
–field 795
– high cycle fatigue (HCF) 730
– laboratory 796
– low cycle fatigue (LCF) 730
– respirometric 797
– simulation 795
– specimens to measure elastic
constants 344, 345
– wood 779
tester
– single-sheet (SST) 547, 560
testing 3
tetrahedron cluster 1068
tetramethylsilane (TMS) 155
textile 803
texture 269
TFT (thin-film transistors) 911
theoretical strength 402
thermal
– activation 401
– conductivity 454
– conductivity detector (TCD) 168
– cycling oxidation testing 725
– desorption mass spectrometry
(TDS) 645
– detector 591
– diffusion rate 642, 643
– diffusivity 454
– effusivity 454
– equilibrium 474
– gravimetric analysis-infrared
(TGA-IR) 153
– inertia 870, 872
Subject Index
Subject Index 1227
– ionization mass spectrometry
(TIMS) 191
– magnetic recording 647
– neutrons 212
– property 453
– radiation source 588
–stress 402, 1023
thermalization 249
thermocouple 478
thermodynamic equilibrium 1065
thermodynamic temperature 472
thermodynamics
– of corrosion 674
thermograph 655
thermogravimetry 471
thermomechanical analysis 469
thermometer
– acoustic gas 472
– standard 473
– total radiation 480
– vapor pressure 473
THG (third-harmonic generation)
616, 617
THG spectroscopy 617
thickness 218, 231, 256
– fringe 220
thin-film transistors (TFT) 911
Thiobacillus 815
thiosulfate 815
third-harmonic generation (THG)
616, 617
third-order nonlinear effect 617
third-order nonlinearity 615
third-order polarization 615
three-dimensional atom probe
(3-DAP) microanalysis 275
three-dimensional TEM (3-D-TEM)
276
three-parameter Weibull analysis
956
THz (terahertz) 625, 656
THz wave 656
Ti:sapphire laser 620, 625
time integration 1049
time of flight (TOF) 147, 275, 649
time to ignition 871
time-correlated single-photon
counting 621
time-domain spectroscopy (TDS)
625
time-resolved imaging 612
time-resolved spectroscopy 600,
620, 622
time-to-amplitude converter (TAC)
621
tin 813
tip 318
–radius 312
TIRFM (total internal reflection
fluorescence microscopy) 217,
269
titrimetry 174
Tl-Se 642
Tl-Te 642
Tm-doped fiber amplifier 637
TMR (total material requirement)
846
TMR (tunnel magneto-resistance)
545, 584
TMS (tetramethylsilane) 155
TOF (time of flight) 147, 275, 649
tolerance verification 313
top-down approach 42
topography 215, 224, 308
torque magnetometer 547, 554, 582
torsion 395
total dissolved solid (TDS) 499
total internal reflection 218
total internal reflection fluorescence
microscopy (TIRFM) 217, 269
total material requirement (TMR)
846
total radiation
– thermometer 480
total reflection x-ray fluorescence
spectrometry (TXRF) 194
total volatile organic compound
(TVOC) 860
toxic product 874
toxic value 780
toxicity 802
traceability 322
–chain 4, 110, 502
– of measurements 45
– to reference values 117
trace-particle 652
tracing 312
– speed 312
trailing edge decay length 300
transfer spectrophotometer 148
transfer standard 324
transformation plasticity 1024
transient absorption 623, 624
transient hot wire method 458
translation vector 254
translational symmetry 239
transmission 594
– change 623
– characteristic 312
– electron microscope (TEM) 645
– electron microscopy (TEM) 179,
218, 252, 282, 293, 298
– line method 525
transmission electron microscope
(TEM) 270
transmittance 594
transmitter 262
transparent 316
trans-polyacetylene conductivity
490
transverse time constant 261
trap 786
– filling phase 521
Tresca criterion 396
triangulation 649, 650
tribological testing 747
tribology 743
triple point of water 473
true
– 3-D characterization 322
–strain 390
–stress 390
trueness 115
truncation 313
TS (tensile strength) 392
T–T–T diagram 1024
tunable laser 594
tungsten lamp 589
tungsten strip lamp 480
tunnel magneto-resistance (TMR)
545, 584
tunneling 518
– current 223
TVOC (total volatile organic
compound) 860
tweed-like structure 1108
twin boundary 254, 258
twin domain 1108
twinning 402
two-beam condition 252
two-dimensional (2-D) NMR 264
two-electrode cell 503
two-phase separation 1074, 1085
two-photon absorption 623, 624
– coefficient 617
two-photon microscopy 275
two-photon process 229
two-sublattice model 1071
TXRF (total reflection x-ray
fluorescence spectrometry) 194
types of corrosion 670
U
UHV (ultrahigh vacuum) 184
ultimate tensile strength (UTS) 359,
360, 392
ultrahigh spatial resolution 605
Subject Index