21 Micro/Nanotribology and Micro/Nanomechanics of Magnetic Storage Devices 1195
18. B. Bhushan, V.N. Koinkar, and J. Ruan. Microtribology of magnetic media. Proc. Inst.
Mech. Eng., J. Eng. Tribol., 208:17–29, 1994.
19. B. Bhushan, A.V. Kulkarni, W. Bonin, and J.T. Wyrobek. Nanoindentation and pi-
coindentation measurements using a capacitance transducer system in atomic force mi-
croscopy. Philos. Mag., 74:1117–1128, 1996.
20. S. Sundararajan and B. Bhushan. Development of a continuous microscratch technique
in an atomicforce microscopyand its applications to study scratchresistance of ultra-thin
hard amorphous carbon coatings. J. Mater. Res., 16:437–445, 2001.
21. D. DeVecchio and B. Bhushan. Localized surface elasticity measurements using an
atomic force microscope. Rev. Sci. Instrum., 68:4498–4505, 1997.
22. V. Scherer, B. Bhushan, U. Rabe, and W. Arnold. Local elasticity and lubrication meas-
urements using atomic force and friction force microscopy at ultrasonic frequencies.
IEEE Trans. Mag., 33:4077–4079, 1997.
23. W.W. Scott and B. Bhushan. Use of phase imaging in atomic force microscopy for
measurement of viscoelastic contrast in polymer nanocomposites and molecularly-thick
lubricant films. Ultramicrosc., 97:151–169, 2003.
24. B. Bhushan and J. Qi. Phase contrast imaging of nanocomposites and molecularly-thick
lubricant films in magnetic media. Nanotechnol., 14:886–895, 2003.
25. T. Kasai, B. Bhushan, L. Huang, and C. Su. Topography and phase imaging using the
torsional resonance mode. Nanotechnol., 15:731–742, 2004.
26. B. Bhushan and T. Kasai. A surface topography-independent friction measurement tech-
nique using torsional resonance mode in an afm. Nanotechnol., 15:923–935, 2004.
27. B. Bhushan, T. Miyamoto, and V.N. Koinkar. Microscopic friction between a sharp
diamond tip and thin-film magnetic rigid disks by friction force microscopy. Adv. Info.
Storage Syst., 6:151–161, 1995.
28. V.N. Koinkar and B. Bhushan. Microtribological studies of Al
2
O
3
,Al
2
O
3
−
TiC, poly-
crystalline and single-crystal Mn
−
Zn ferrite and SiC head slider materials. Wear,
202:110–122, 1996.
29. V.N. Koinkar and B. Bhushan. Microtribological studies of unlubricated and lubricated
surfaces using atomic force/friction force microscopy. J. Vac. Sci. Technol. A, 14:2378–
2391, 1996.
30. H. Liu and B. Bhushan. Nanotribological characterization of molecularly-thick lubricant
films for applications to mems/nems by afm. Ultramicrosc., 97:321–340, 2003.
31. B. Bhushan. Magnetic slider/rigid disk substrate materials and disk texturing techniques
– status and future outlook. Adv. Info. Storage Syst., 5:175–209, 1993.
32. B. Bhushan, M. Dominiak, and J.P. Lazzari. Contact- start-stop studies with silicon
planar head sliders against thin-film disks. IEEE Trans. Mag., 28:2874–2876, 1992.
33. B. Bhushan and G.S. Blackman. Atomic force microscopy of magnetic rigid disks and
sliders and its applications to tribology. ASME J. Tribol., 113:452–458, 1991.
34. P.I. Oden, A. Majumdar, B. Bhushan, A. Padmanabhan, and J. J. Graham. Afm imaging,
roughness analysis and contact mechanics of magnetic tape and head surfaces. ASME
J. Tribol., 114:666–674, 1992.
35. S. Ganti and B. Bhushan. Generalized fractal analysis and its applications to engineering
surfaces. Wear, 180:17–34, 1995.
36. C.Y. Poon and B. Bhushan. Comparison of surface roughness measurements by stylus
profiler, afm and non-contact optical profiler. Wear, 190:76–88, 1995.
37. C.Y. Poon and B. Bhushan. Surface roughness analysis of glass-ceramic substrates and
finished magnetic disks, and Ni
−
PcoatedAl
−
Mg and glass substrates. Wear, 190:89–
109, 1995.