Goodhew P.J. et al. Electron microscopy and analysis

Springer, 2010, 250 p. Methodology: General Introduction Introduction to Materials The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM) Materials Problems and Approaches for TEM and TEM/STEM Analyses Physical and Chemical Mechanisms of Preparation Techniques Artifacts in Transmission Electron Microscopy Selection of Preparation Techniques Based on Material Problems and TEM Analyses Comparisons of Techniques Conclusion: What Is...

Springer, 2005, 202p. Preface An Introduction to Microscopy Limitations of the Human Eye The Light-Optical Microscope The X-ray Microscope The Transmission Electron Microscope The Scanning Electron Microscope Scanning Transmission Electron Microscope Analytical Electron Microscopy Scanning-Probe Microscopes Electron Optics PropertiesofanIdealImage ImaginginLightOptics ImagingwithElectrons Focusing Properties of a Thin Magnetic Lens C...

3 ed. , Kluwer, 2003, 689p. Introduction The SEM and Its Modes of Operation Electron Beam Specimen Interactions Image Formation and Interpretation Special Topics in Scanning Electron Microscopy Generation of X Rays in the SEM Specimen X-Ray Spectral Measurement: EDS and WDS Qualitative X-Ray Analysis Quantitative X-Ray Analysis: The Basics Special Topics in Electron Beam X-Ray Microanalysis Specimen Preparation of Hard Materials: Metals, C...

Springer. 2007. 1332 p. Volume 1 Imaging with Electrons Atomic Resolution Transmission Electron Microscopy Scanning Transmission Electron Microscopy Scanning Electron Mocroscopy Analytical Electron Microscopy Hiigh-Speed Electron Microscopy In Situ Transmission Electron Microscopy Cryoelectron Tomography (CET) LEEM and SPLEEM Photoemission Electron Microscopy (PEEM) Aberration Correction Volume II Imaging with Photons Two-Photon Excitation Fluore...

Springer; Berlin, 1 edition, 2008, 473 p. There are many books on electron microscopy, however, the study of polymers using EM necessitates special techniques, precautions and preparation methods, including ultramicrotomy. This book discusses the general characteristics of the various techniques of EM, including scanning force microscopy (AFM). The application of these techniques to the study of morphology and properties, particularly micromechan...

Published in the United States of America by Cambridge University Press, New York Second edition 2005 216 p. Electron microprobe analysis Scanning electron microscopy Geological applications of SEM and EMPA Related techniques Electron–specimen interactions Inelastic scattering Electron range Elastic scattering Secondary-electron emission X-ray production X-ray absorption The Auger effect and fluorescence yield Cathodolumin...

Springer, 2008, 602p. Introduction TransmissionElectronMicroscopy Alternative Types of Electron Microscopy Particle Optics of Electrons Acceleration and De?ection of Electrons ElectronLenses Lens Aberrations Correction of Aberrations and Microscope Alignment Wave Optics of Electrons ElectronWavesandPhaseShifts Fresnel and Fraunhofer Di?raction Wave-Optical Formulation of Imaging Elements of a Transmission Electron Microscope ElectronGuns The Illu...

2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

Cambridge University Press, 1996, 436 p. Symbols and definitions Kinematical electron diffraction Reflection high-energy electron diffraction Dynamical theories of RHEED Resonance reflections in RHEED Imaging surfaces in TEM Contrast mechanisms of reflected electron imaging Applications of UHV REM Applications of non-UHV REM Phonon scattering in RHEED Valence excitation in RHEED Atomic inner shell excitations in RHEED Novel techniques associated...

2nd ed. , Springer, 2009. - 832 p. = BASICS The Transmission Electron Microscope Scattering and Diffraction Elastic Scattering Inelastic Scattering and Beam Damage Electron Sources Lenses, Apertures, and Resolution How to ‘See’ Electrons Pumps and Holders The Instrument Specimen Preparation = DIFFRACTION Diffraction in TEM Thinking in Reciprocal Space Diffracted Beams Dispersion Surfaces Diffraction from Crystals Diffraction from Small Volumes...