Reed S.J.B. Electron microprobe analysis and scanning electron microscopy in geology

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Published in the United States of America by Cambridge University Press, New York Second edition 2005 216 p.

Electron microprobe analysis
Scanning electron microscopy
Geological applications of SEM and EMPA
Related techniques
Electron–specimen interactions
Inelastic scattering
Electron range
Elastic scattering
Secondary-electron emission
X-ray production
X-ray absorption
The Auger effect and fluorescence yield
Cathodoluminescence
Specimen heating
Instrumentation
The electron gun
Beam diameter and current
Column alignment
Beam current monitoring
Beam scanning
The specimen stage
The optical microscope
Vacuum systems
Detection of other types of signal
Scanning electron microscopy
Magnification and resolution
Focussing
Topographic images
Compositional images
Image defects
Image enhancement
Other types of image
X-ray spectrometers
Energy-dispersive spectrometers
Wavelength-dispersive spectrometers
A comparison between ED and WD spectrometers
Element mapping
Digital mapping
EDS mapping
WDS mapping
Quantitative mapping
Statistics and noise in maps
Colour maps
Line scans
Three-dimensional maps
X-ray analysis I
Pure-element X-ray spectra
Element identification
Mineral identification
Quantitative WD analysis
Quantitative ED analysis
Matrix corrections
Correction programs
Treatment of results
Standards
X-ray analysis II
Light-element analysis
Low-voltage analysis
Choice of conditions for quantitative analysis
Counting statistics
Detection limits
The effect of the conductive coating
Beam damage
Boundary effects
Sample preparation
Initial preparation of samples
Mounting
Polishing
Etching
Coating
Marking specimens
Specimen handling and storage

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