2nd Ed. , 2009, John Wiley & Sons, 666 p.
Introduction
How do we De?ne the Surface?
How Many Atoms in a Surface?
Information Required
Surface Sensitivity
Radiation Effects – Surface Damage
Complexity of the Data
Auger Electron Spectroscopy
Introduction
Principle of the Auger Process
Instrumentation
Quantitative Analysis
Depth Pro?le Analysis
Summary
Electron Spectroscopy for Chemical Analysis
Overview
X-ray Interaction withMatter, the Photoelectron Effect
and Photoemission from Solids
Binding Energy and the Chemical Shift
Inelastic Mean Free Path and Sampling Depth
Quanti?cation
Spectral Features
Instrumentation
Spectral Quality
Depth Pro?ling
X–Y Mapping and Imaging
Chemical Derivatization
Valence Band
Perspectives
Conclusions
Molecular Surface Mass Spectrometry by SIMS
Introduction
Basic Concepts
Experimental Requirements
Modes of Analysis
Ionization of the Sputtered Neutrals
Ambient Methods of Desorption Mass Spectrometry
DynamicSIMS
Fundamentals and Attributes
Areas and Methods of Application
Quanti?cation of Data
Novel Approaches
Instrumentation
Conclusions
Low-Energy Ion Scattering and Rutherford Backscattering
Introduction
Physical Basis
Rutherford Backscattering
Low-Energy Ion Scattering
Vibrational Spectroscopy from Surfaces
Introduction
Infrared Spectroscopy from Surfaces
Electron Energy Loss Spectroscopy (EELS)
The Group Theory of Surface Vibrations
Laser Raman Spectroscopy from Surfaces
Inelastic Neutron Scattering (INS)
Sum-Frequency Generation Methods
Surface Structure Determination by Interference Techniques
Introduction
Electron Diffraction Techniques
X-ray Techniques
Photoelectron Diffraction
Scanning Probe Microscopy
Introduction
Scanning Tunnelling Microscopy
Atomic Force Microscopy
Scanning Near-Field Optical Microscopy
Other Scanning Probe Microscopy Techniques
Lithography Using Probe Microscopy Methods
Conclusions
The Application of Multivariate Data Analysis Techniques in Surface Analysis
Introduction
Basic Concepts
Factor Analysis for Identi?cation
Regression Methods for Quanti?cation
Methods for Classi?cation
Summary and Conclusion
Introduction
How do we De?ne the Surface?
How Many Atoms in a Surface?
Information Required
Surface Sensitivity
Radiation Effects – Surface Damage
Complexity of the Data
Auger Electron Spectroscopy
Introduction
Principle of the Auger Process
Instrumentation
Quantitative Analysis
Depth Pro?le Analysis
Summary
Electron Spectroscopy for Chemical Analysis
Overview
X-ray Interaction withMatter, the Photoelectron Effect
and Photoemission from Solids
Binding Energy and the Chemical Shift
Inelastic Mean Free Path and Sampling Depth
Quanti?cation
Spectral Features
Instrumentation
Spectral Quality
Depth Pro?ling
X–Y Mapping and Imaging
Chemical Derivatization
Valence Band
Perspectives
Conclusions
Molecular Surface Mass Spectrometry by SIMS
Introduction
Basic Concepts
Experimental Requirements
Modes of Analysis
Ionization of the Sputtered Neutrals
Ambient Methods of Desorption Mass Spectrometry
DynamicSIMS
Fundamentals and Attributes
Areas and Methods of Application
Quanti?cation of Data
Novel Approaches
Instrumentation
Conclusions
Low-Energy Ion Scattering and Rutherford Backscattering
Introduction
Physical Basis
Rutherford Backscattering
Low-Energy Ion Scattering
Vibrational Spectroscopy from Surfaces
Introduction
Infrared Spectroscopy from Surfaces
Electron Energy Loss Spectroscopy (EELS)
The Group Theory of Surface Vibrations
Laser Raman Spectroscopy from Surfaces
Inelastic Neutron Scattering (INS)
Sum-Frequency Generation Methods
Surface Structure Determination by Interference Techniques
Introduction
Electron Diffraction Techniques
X-ray Techniques
Photoelectron Diffraction
Scanning Probe Microscopy
Introduction
Scanning Tunnelling Microscopy
Atomic Force Microscopy
Scanning Near-Field Optical Microscopy
Other Scanning Probe Microscopy Techniques
Lithography Using Probe Microscopy Methods
Conclusions
The Application of Multivariate Data Analysis Techniques in Surface Analysis
Introduction
Basic Concepts
Factor Analysis for Identi?cation
Regression Methods for Quanti?cation
Methods for Classi?cation
Summary and Conclusion