Czanderna A.W., Madey T.E., Powell C.J.(Eds.) Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Wiley -VCH, 2002, 352p. Introduction Electron detection Ion detection Photon detection Scanning probe microscopy Summary and comparison of techniques Surface and thin film analytical equipment suppliers

Surface Science Reports 59 (2005) p.1–152 The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force cur...

Elsevier Surface Science Reports 34 (1999) p.1-104 Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology. Furthermore, they have great importance for the study of surface interactions from a theoretical point of view. Force-distance curves have been employed for the study of numerous materials properties and for t...

Academic Press, 2001, 186p. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy Auger Electron Spectroscopy Photoelectron Spectroscopy Inelastic Scattering of Electrons and Ions Low-Energy Electron Diffraction Scanning Probe Microscopy Interfacial Segregation Metal–Semiconductor Interfaces Gas–Surface Interactions

Kluwer Academic Publishers, 2002, 302 p. Ultrahigh Vacuum and Vacuum Compatibility of Materials Cryogenic Sample Transfer for Preservation of Surface Chemistry Specimen Handling: Cleaning and Processing Atomically Clean Surfaces of Elemental Solids Specimen Treatments: Surface Preparation of Metal Compound Materials (Mainly Oxides) In Situ Processing by Gas or Alkali Metal Dosing and by Cleavage Chemical Modification of Surfaces Physical and C...

Springer-Verlag, Berlin, 2011, 323 pages The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of...

Surface Science Reports 66 (2011) р.1–27 journal homepage: www.elsevier.com/locate/surfrep Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results. The first part of this review will introduce the principles of KPFM and...

2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

Wiley, 2003, 212p. Electron spectroscopy: some basic concepts Electron spectrometer design The electron spectrum: qualitative and quantitative interpretation Compositional depth profiling Applications of electron spectroscopy in materials science Comparison of XPS and AES with other analytical techniques

2 ed, Cambridge University Press, 1994, 586 p. Introduction Surface crystallography and diffraction Electron spectroscopies Incident ion techniques Desorption spectroscopies Tunnelling microscopy Work function techniques Atomic and molecular beam scattering Vibrational spectroscopies