Woodruff D.P., Delchar T.A. Modern techniques of surface science

Springer, 2010, 338 p. Techniques: General Introduction Preliminary Preparation Techniques Thinning Preparation Techniques Mechanical Preparation Techniques Replica Techniques Techniques Speci?c to Fine Particles Contrast Enhancement and Labeling Techniques

Wiley -VCH, 2002, 352p. Introduction Electron detection Ion detection Photon detection Scanning probe microscopy Summary and comparison of techniques Surface and thin film analytical equipment suppliers

Surface Science Reports 59 (2005) p.1–152 The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force cur...

Elsevier Surface Science Reports 34 (1999) p.1-104 Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology. Furthermore, they have great importance for the study of surface interactions from a theoretical point of view. Force-distance curves have been employed for the study of numerous materials properties and for t...

Springer-Verlag, Berlin, 2011, 323 pages The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of...

Surface Science Reports 66 (2011) р.1–27 journal homepage: www.elsevier.com/locate/surfrep Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results. The first part of this review will introduce the principles of KPFM and...

2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

Springer, 2006. - 741 p. - Solid State Spectroscopy is a burgeoning field being applied in many branches of science including physics, chemistry, biosciences, surface science and materials science. The currently available information about various spectroscopic techniques is scattered across various disciplines in the scientific and technical literature not within easy reach of the reader. There is a need to have a comprehensive yet concise volum...

Wiley, 2003, 212p. Electron spectroscopy: some basic concepts Electron spectrometer design The electron spectrum: qualitative and quantitative interpretation Compositional depth profiling Applications of electron spectroscopy in materials science Comparison of XPS and AES with other analytical techniques

John Wiley & Sons Ltd, Chichester, UK, 2011, 352 pages This book introduces the reader to the basic concepts of the generation and manipulation of synchrotron light, its interaction with matter, and the application of synchrotron light in the classical techniques, while including some of the most modern technological developments. As much as possible, complicated mathematical derivations and formulas are avoided. A more heuristic approach i...