Chung Y.-W. Practical guide to surface science and spectroscopy

WILEY-VCH, 2004, 238p. A First-Principles Scheme for Calculatingv the Electronic Structure of Strongly Correlated Materials: GW+DMFT A Many-body Approach to the Electronic and Optical Properties of Copper and Silver Correlation Spectroscopy of Nano-size Materials Electron–Electron Coincidence Studies on Atomic Targets: A Review of (e,2e) and (e,3e) Experiments Studying the Details of the Electron–Electron Interaction in Solids and Surfaces Two-El...

Surface Science Reports 59 (2005) p.1–152 The atomic force microscope (AFM) is not only a tool to image the topography of solid surfaces at high resolution. It can also be used to measure force-versus-distance curves. Such curves, briefly called force curves, provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities. For this reason the measurement of force cur...

Elsevier Surface Science Reports 34 (1999) p.1-104 Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology. Furthermore, they have great importance for the study of surface interactions from a theoretical point of view. Force-distance curves have been employed for the study of numerous materials properties and for t...

3rd edition, Springer Science+Business Media, New York, 2011, 491 pages Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation...

WILEY-VCH Verlag, Berlin, 2001, 271 Pages This modern approach to the subject is clearly and logically structured, and gives readers an understanding of the essence of Fourier transforms and their applications. All important aspects are included with respect to their use with optical spectroscopic data. Based on popular lectures, the authors provide the mathematical fundamentals and numerical applications which are essential in practical use....

Elsevier Science, 2009, 709 pages Much of what we know about atoms, molecules, and the nature of matter has been obtained using spectroscopy over the last one hundred years or so. In this book we have collected together twenty chapters by eminent scientists from around the world to describe their work at the cutting edge of molecular spectroscopy. These chapters describe new methodology and applications, instrumental developments, and theory wh...

Surface Science Reports 66 (2011) р.1–27 journal homepage: www.elsevier.com/locate/surfrep Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results. The first part of this review will introduce the principles of KPFM and...

2nd Ed. , 2009, John Wiley & Sons, 666 p. Introduction How do we De?ne the Surface? How Many Atoms in a Surface? Information Required Surface Sensitivity Radiation Effects – Surface Damage Complexity of the Data Auger Electron Spectroscopy Introduction Principle of the Auger Process Instrumentation Quantitative Analysis Depth Pro?le Analysis Summary Electron Spectroscopy for Chemical Analysis Overview X-ray Interaction withMatter, t...

Springer, 2006. - 741 p. - Solid State Spectroscopy is a burgeoning field being applied in many branches of science including physics, chemistry, biosciences, surface science and materials science. The currently available information about various spectroscopic techniques is scattered across various disciplines in the scientific and technical literature not within easy reach of the reader. There is a need to have a comprehensive yet concise volum...

Wiley, 2003, 212p. Electron spectroscopy: some basic concepts Electron spectrometer design The electron spectrum: qualitative and quantitative interpretation Compositional depth profiling Applications of electron spectroscopy in materials science Comparison of XPS and AES with other analytical techniques