Springer, 2010, 250 p.
Methodology: General Introduction
Introduction to Materials
The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM)
Materials Problems and Approaches for TEM and TEM/STEM Analyses
Physical and Chemical Mechanisms of Preparation Techniques
Artifacts in Transmission Electron Microscopy
Selection of Preparation Techniques Based on Material Problems and TEM Analyses
Comparisons of Techniques
Conclusion: What Is a Good Sample?
Methodology: General Introduction
Introduction to Materials
The Different Observation Modes in Electron Microscopy (SEM, TEM, STEM)
Materials Problems and Approaches for TEM and TEM/STEM Analyses
Physical and Chemical Mechanisms of Preparation Techniques
Artifacts in Transmission Electron Microscopy
Selection of Preparation Techniques Based on Material Problems and TEM Analyses
Comparisons of Techniques
Conclusion: What Is a Good Sample?