264
pure (‘defect free’) crystal can be obtained routinely when the size of the
crystal does not exceed a critical size.
Due to the seemingly complex nature of the thermal, structural and dy-
namical coupling
of
the molten material, the crystal, the crucible, the gas
chamber and other parts of the growth, considerable efforts have been de-
voted to the laboratory experiments and to modelling and simulations of the
growth environment over the past several decades. As a result, there exists
an extensive literature, mostly in engineering fields. These studies cover
a
wide spectrum of areas, from decoupled one or two dimensional simulations
to fully coupled three-dimensional computations
3,4,9110,13114915.
Most of the
studies rely heavily on computer simulation since the fully coupled system
can not be solved otherwise. These investigations have generated useful in-
formation including temperature distribution, crystal-melt interface shape,
and melt flow patterns inside the crucible. By comparison, until recently
much less attention has been paid to the modelling of defects inside the
crystal and main factors which determine the formation of defects
16.
In this paper, we present a perturbation approach to study the temper-
ature field inside the crystal and related thermal stress. It is believed that
the defects formation can be related to the excessive thermal stress above
some critical value (see
11>18&21>731591g
and references therein). Therefore,
some analysis on the growth factors which determine the stress level will be
extremely useful for crystal growers using different operating conditions for
less well-known type 111-V crystals such as the Indium Antimonide (InSb)
compound. While the basic solution remains the same for these compounds,
we will focus on InSb crystals in the remainer of the paper.
By examining the physical process and parameter values of the growth
environment closely, we are able to identify the main features associated
with InSb crystals. In particular, we found that the temperature field is
dominated by the lateral flux through the crystal-gas surface, characterized
by the non-dimensional Biot number. The value of the Biot number is small
under the growth condition for InSb crystals, which suggests an asymptotic
expansion of the solution with respect to the Biot number.
As
a result, an-
alytical solutions could be obtained for the pseudo-steady case, which is
another main feature of the temperature field inside the crystal. This is
similar to the growth of other crystals where the pseudo-steady assumption
has been discussed in detail
6.
Even for the fully unsteady case, the asymp-
totic expansion results in a system of one-dimensional equations and the
thermal stress can be obtained explicitly in an analytical form, under the
plane strain assumption. To simplify the presentation, we have used a sim-