
Characterization
and
Properties
of
Nanomaterials
385
2. L.H. Schwartz and J.B. Cohen,
Diffraction From Materials,
Springer-Verlag, Berlin,
3.
L.
Reimer,
Scanning Electron Microscopy,
Springer-Verlag, Berlin, 1985.
4. AS. Nowick (ed.),
Electron Microscopy
of
Materials: An Introduction,
Academic
5. J.W. Edington,
Practical Electron Microscopy
in
Materials,
van Nostrand Reinhold,
6.
Z.L.
Wang,
Reflected Electron Microscopy and Spectroscopy for Surface Analysis,
7.
D.
Bonnell (ed.),
Scanning Probe Microscopy and Spectroscopy,
Wiley-VCH,
8.
C.R. Brundle, C.A. Evans Jr., and
S.
Wilson (eds.),
Encyclopedia
of
Materials
9. J.C. Vickerman,
Surface Analysis: The Principle Techniques,
John Wiley
&
Sons,
10. A. Segmuller and M. Murakami, in
Analytical Techniques
for
Thin Films,
eds.
11.
L.S.
Birks and H. Friedman,
J;
Appl. Phys.
17,
687 (1 946).
12. A. Segmuller and M. Murakami, in
Thin Films From Free Atoms and Particles,
ed.
K.J. Klabunde, Academic Press, Orlando, FL,
p.
325, 1985.
13. A.A. Guzelian, J.E.B. Katari, A.V Kadavanich,
U.
Banin,
K.
Hamad, E. Juban,
A.P. Alivisatos, R.H. Wolters, C.C. Arnold, and J.R. Heath,
J.
Phys. Chem.
100,
7212
(1 996).
14.
0.
Glatter and
0.
Kratky,
Small Angle X-ray Scattering,
Academic Press, New York,
1982.
15. A. Guinier and G. Fournet,
Small
Angle Scattering
of
X-Rays,
John Wiley
&
Sons,
New York, 1955.
16. N.S. Andreev, E.A. Porai-Koshits, and
0.V
Mazurin, in
Phase Separation in Glass,
eds.,
0.V
Mazurin and E.A. Porai-Koshits, North-Holland, Amsterdam,
p.
67, 1984.
17. C.R. Kagan, C.B. Murray, and M.G. Bawendi,
Phys. Rev.
B54,8633 (1996).
18. B.A. Korgel and
D.
Fitzmaurice,
Phys. Rev.
B59,
14191 (1999).
19. C.B. Murray, C.R. Kagan, and M.G. Bawendi,
Ann. Rev. Mate,: Sci.
30,
545 (2000).
20. G. Porod,
Kolloid.-Z.
124, 83 (1951).
2
1.
G.
Porod,
Ko1Loid.-Z.
125, 5
1
(1 952).
22.
I?
Debye and A.M. Bueche,
1
Appl. Phys.
20,
51
8
(1 949).
23.
S.J.
Limmer,
S.
Vince Cruz, and G.Z. Cao,
Adv. Muter,
submitted (2003).
24. M. von Heimendahl, in
Electron Microscopy
of
Materials: An Introduction,
ed.
25. A.N. Goldstein, C.M. Echer, and A.P. Alivisatos,
Science
256, 1425 (1992).
26.
Z.L.
Wang,
Adv. Muter.
12, 1295 (2000).
27. P. Poncharal,
Z.L.
Wang,
D.
Ugarte, and W.A. de Heer,
Science
283,
1516 (1999).
28.
Z.L.
Wang,
P.
Poncharal, and W.A. de Heer,
1
Phys. Chem. Solids
61, 1025 (2000).
29. G. Binnig, H. Rohrer, C. Gerber, and
E.
Weibel,
Phys. Rev. Lett.
49,
57 (1982).
30.
G.
Binnig, C.F. Quate, and Ch. Gerber,
Phys. Rev. Lett.
56,930 (1986).
3 1. R.S. Howland and M.D. Kirk, in
Encyclopedia
of
Materials Characterization,
eds.
C.R. Brundle, C.A. Evans Jr., and
S.
Wilson, Butterworth-Heinemann, Stoneham,
MA,
p.
85,
1992.
1987.
Press, New York, 1980.
New York, 1976.
Cambridge University Press, Cambridge, 1996.
New York, 2001.
Characterization,
Butterworth-Heinemann, Stoneham, MA, 1992.
New York, 1997.
K.N. Tu and R. Rosenberg, Academic Press, San Diego, CA,
p.
143, 1988.
A.S. Nowick, Academic Press, New York,
p.
1,
1980.
32. G. Binnig, H. Rohrer, C. Gerber, and
E.
Weibel,
Phys. Rev. Lett.
50,
120 (1983).