Contents xix
7.2.1 Types of Etching . . .................. 408
7.2.2 Plasma Sources . . .................. 412
7.3 Plasma Process Parameters and Control ............ 418
7.3.1 Energy-DrivenAnisotropy............... 419
7.3.2 Inhibitor-DrivenAnisotropy.............. 420
7.3.3 SelectivityinPlasmaEtching ............. 421
7.4 Case Study: Etching Silicon, Silicon Dioxide,
andSiliconNitride ....................... 422
7.5 Case Study: High-Aspect-Ratio Silicon Etch Process . .... 427
7.5.1 Cryogenic Dry Etching . . . ............. 428
7.5.2 Bosch Process . . . .................. 429
7.5.3 Understanding Trends for DRIE Recipe
Development...................... 432
7.6 High-Aspect-Ratio Etching of Piezoelectric Materials . .... 434
7.6.1 Case Study: High-Aspect-Ratio Etching of
Glass (Pyrex
R
)andQuartz .............. 434
7.6.2 High-Aspect-Ratio Etching of Piezoelectric
Materials........................ 438
7.7 Etching of Compound Semiconductors ............. 441
7.7.1 Case Study: Etching of GaAs and AlGaAs . . .... 441
7.7.2 Case Study: Etching of InP, InGaAs, InSb,
andInAs........................ 444
7.8 Case Study: Ion Beam Etching ................. 446
7.9 Summary ............................ 449
References . . . ............................ 452
8 MEMS Wet-Etch Processes and Procedures ............ 457
8.1 Introduction ........................... 458
8.2 Principles and Process Architectures for Wet Etching . .... 460
8.2.1 Surface Reactions and Reactant/Product Transport . . 464
8.2.2 Etchant Selectivity and Masking Considerations . . . 467
8.2.3 Direct Etching and Liftoff Techniques . ........ 469
8.2.4 Sacrificial Layer Removal . . ............. 470
8.2.5 Substrate Thinning and Removal . . . ........ 471
8.2.6 Impact on Process Architecture ............ 472
8.2.7 Process Development for Wet Etches . ........ 473
8.2.8 Additional Considerations and Alternatives . . .... 476
8.3 Evaluation and Development of Wet-Etch Facilities
and Procedures . . ....................... 479
8.3.1 Facility Requirements ................. 479
8.3.1.1 General Facilities ............. 479
8.3.1.2 Wet-Bench Services ............ 480
8.3.1.3 Wet-Bench Equipment . . ........ 480
8.3.1.4 Safety ................... 481
8.3.2 WaferHandlingConsiderations............ 482