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ADDITIONAL READING
the specimen. This vibration is transmitted to the STM tip, causing
it to vibrate as well. As a result, the tip–surface spacing is affected.
In the limit when ⬍⬍
o
, calculate the effect on the tip–surface
spacing. Assume no damping.
2. It is possible to use a long piezoelectric bar to increase the scanning
range of an STM or AFM. The major disadvantage is that such
a long bar will act like a cantilever, with a lower resonance
frequency. Let us explore this using a numerical example. Con-
sider a piezoelectric bar with width ⫽ thickness ⫽ 1 mm, length
⫽ 100 mm, modulus ⫽ 70 GPa, density ⫽ 3 g/cm
3
. Show that
its resonance frequency is less than 100 Hz. Resonance frequen-
cies lower than 1 kHz are considered undesirable in scanning
probe microscopy.
3. Consider a tunneling gap with the tunneling current obeying Eq.
(6.3). To be specific, let us assume that the tunneling current is
1 nA and the tunneling bias is 25 mV. For (tunneling barrier)
⫽ 3.5 eV and in the constant current mode, what is the tunneling
bias required to increase the tip–specimen spacing by 0.1 nm?
4. Given that the cohesive energy of solids ⬇ 100 kcal and that the
interatomic spacing ⬇ 0.2 nm, estimate the force of attraction
(in newtons) between atoms in typical solids. You do not have
to worry about the functional form of the interaction forces.
5. (a) Consider STM imaging of a trough of depth D and width W
using a tip of radius R (2R ⬎ W). When R is sufficiently
large, the depth d recorded by the STM will be less than D.
In the limit when d is on the same order as the r.m.s. surface
roughness of the surrounding, this trough is barely visible
to the STM. Show that the smallest trough W one can see
with the STM is equal to
兹8R.
(b) By the same reasoning, a rectangular protrusion of height H
and width W would appear wider because of the finite tip
radius R. How much wider? You can assume the tip to be a
sphere in this problem and R » and H.
ADDITIONAL READING
R. Young, J. Ward, and F. Scire: ‘‘The Topographiner: An Instrument for Measuring
Surface Microtopography,’’ Rev. Sci. Instrum. 43, 999 (1972).