
185
INDEX
band structure studies, 56–60 Relaxation shift, 53
Resonance, 56chemical bonding on surfaces,
54–56 Retarding field analyzer (RFA),
14–16, 87, 148chemical shift, 51–52
detectors, 50 Rohrer, Heinrich, 101, 102, 107
element identification, 51
extended X-ray absorption S
Scanning Auger microprobefine structure, 60–62
one-electron description of, (SAM), 33–35
Scanning capacitance micros-45–46
photon sources, 47–50 copy (SCaM), 115
Scanning probe microscopyrelaxation shift and multiplet
splitting, 53 See also under type of
defined, 101Photoemission, 147
Photon sources, 47–50 Scanning tunneling microscopy
(STM)Physisorption (physical adsorp-
tion), 157, 158 applications, 112–114
coarse motion control, 107Piezoelectric effect, 108
Piezoelectric inchworm, 107 data acquisition and analysis,
111–112Piezoelectric positioners, 107
Piezoelectric tube scanner, development of, 101
fine motion control, 107–109108–109
Planck’s constant, 84 historical development,
102–103Plasma frequency, 71
Plasmon excitations, 71–72 image interpretation, 106–107
imaging principles, 104–105Platinum, 109
Poisons, 173 implementation, 107–112
limitations, 114–115Poisson equation, 142
Potassium, 172–173 review of electron tunneling,
103–104Pressure measurement, 7–9
Profile analysis, 33 tip preparation, 109–110
vibration isolation, 110–11Promoters, 172–173
Schottky model, 148–152
surface states and failure of,Q
Quantitative analysis, 35–38 152–153
Schro
¨
dinger equation, 85, 138,
140R
Real space lattice, 92–93 Secondary ion mass spectrome-
try (SIMS), 77–80Reciprocal space, properties of
surface, 88 Semiconductor surfaces