233Epitaxial growth of graphene thin films on single crystal metal surfaces
© Woodhead Publishing Limited, 2011
Finally, note that the above discussion applied to graphene on metal surfaces
with a threefold symmetry. Much less literature addresses graphene prepared
on, for example, (100) surfaces of fcc metals (Hamilton, 1980; Zhao, 2011)
or (110) surfaces of body-centred cubic metals. On these metals graphene/
metal moirés are also found, but their symmetry is decreased compared to
that of moirés with graphene on threefold symmetric surfaces.
10.2.2 Height of the graphene sheet
The distance between the metallic surface and the graphene surface is
characteristic of the metal/graphene interaction. extreme cases for this
interaction are van der Waals binding, such as in between the graphite plane,
and strong hybridization of the metal d bands with the p bands of graphene.
While the rst case mostly preserves the conical character of graphene p
bands, the second deeply modies them, causing band gap opening at the K
point in the brillouin zone and bending of the bands. In both cases, charge
transfer between graphene and the metal is a priori expected.
In the case of dominating van der Waals interactions, as in graphite, the
graphene–metal distance is expected to be close to the graphite interplane
distance, i.e. around 0.345 nm. In the opposite situation, the carbon and
metal atoms form bonds with a covalent character, therefore the distance
is expected to be much shorter (e.g. 0.21 nm for graphene/Ni(111); Gamo,
1997).
The graphene–metal distance remains poorly characterized at experimental
level. This is mainly ascribed to the limitations of the techniques that are
commonly employed: sTM has so far been unable to disentangle topographic
and electronic contributions to the apparent height measurements in the
graphene–metal system (Marchini, 2007; Vazquez de Parga, 2008); atomic
force microscopy (aFM) was only used in air for graphene on metals, so
that the sensitivity of the technique does not allow for a sufciently accurate
determination of the height. The only techniques which proved relevant up to
now are LEED I-V measurements and SXRD which were applied to graphene
on Ni(111), Ru(0001), and Pt(111) (Gamo, 1997a; Martoccia, 2008; Sutter,
2009a; Moritz, 2010). The analysis of the SXRD data relies on the choice
of structural models a priori, which introduces an (unknown) uncertainty
in the value of the graphene–metal height. The LEED I-V analysis is based
on the simulation of electron reectivity using a dynamical diffraction
framework, which allows a partial agreement between the simulations and
the experiment, thus imposing careful interpretation of the simulations.
Concerning theory studies, a number of reports provide estimates of the
graphene–metal distance (Bertoni, 2004; Nemec, 2006, 2008; Giovannetti,
2008; Wang, 2009; Khomyakov, 2009; Ran, 2009). Yet, noticeable deviations
are found, for example for graphene/Pd(111) (Nemec, 2006; Giovannetti,
ThinFilm-Zexian-10.indd 233 7/1/11 9:42:50 AM