Interface defects are the result of errors made during the pretreatment cycle of the adherends prior to the actual bonding
process. In practice, pretreatment flaws are reduced by careful process control and by adherence to specification
requirements and inspection before proceeding with the bond cycle. Controls generally include the waterbreak test and
measurement of the anodic layer and primer thickness. Interface defects can be caused by improper or inadequate
degreasing, deoxidizing, anodizing, drying, damage to the anodizing layer, or excessive primer thickness.
Interface defects are generally not detectable by state-of-the-art NDT methods. Therefore, test specimens are processed
along with production parts and sent to the laboratory for evaluation. Applicable wedge crack specimens, lap shear
specimens, or honeycomb flatwise tension specimens are fabricated and tested to determine if the process meets
specification requirements before the bonding cycle starts.
Considerable effort at Fokker in the Netherlands led to the important discovery that the ideal oxide configuration for
adhesion on aluminum alloys can be detected by inspection with an electron microscope at suitable magnification (Ref 2,
3, 4). To inspect with the electron microscope, a piece of the structure must be removed. As a consequence, the electron
microscope became a useful tool for adhesion quality control. Another physical parameter that was used as a basis for the
NDT of surfaces for the ability to bond was contact potential, which is measured by a proprietary method developed by
Fokker known as a contamination tester (Ref 3, 5). This instrument is based on Kelvin's dynamic-condenser method but
avoids the disturbances usually associated with it. There is sufficient evidence that the contamination tester is able to
detect nondestructively the absence of the optimum oxide configuration arising from incomplete anodizing and/or
subsequent contamination (Ref 4).
More recently, Couchman et al. (Ref 6) at General Dynamics developed an adhesive bond strength classifier algorithm
that can be used to build an adhesive bond strength tester. Lap shear specimens were fabricated using Reliabond 398
adhesive. The test specimens include:
• A control set with optimum bond strength
• An undercured set
• A weak bond produced by an unetched surface
• A thin-bond adhesive that was cured without a carrier
The weakest bond was observed to fail at 725 kPa (105 psi), while the strongest held to 15.7 MPa (2.27 ksi). Tabulated
results showed the following:
• Undercured set: 725 to 6410 kPa (105 to 930 psi)
• Unetched surface set: 5.79 to 7.58 MPa (0.840 to 1.10 ksi)
• Control set: 13.4 to 14.8 MPa (1.94 to 2.15 ksi)
• Thin adhesive set: 14.1 to 15.6 MPa (2.05 to 2.27 ksi)
The accept/reject value was set at 13.1 MPa (1.90 ksi), and all specimens were classified correctly. The important factor is
that an interface defect (unetched surface), which results in poor adhesion, was detected.
Defects within the cured adhesive layer can be one or more of the following:
• Undercured or overcured adhesive
• Thick adhesive resulting in porosity or voids due to improper bonding pressure or part fit-up
• Frothy fillets and porous adhesive caused by too fast a heat-up rate
• Loss of long-term durability due to excessive moisture in the adhesive prior to curing
In normal cases, the curing time is very easily controlled. The curing temperature and temperature rate are controlled by
proper positioning of the thermocouples on the panel and by regulating the heat-up rate.
Thick glue lines occur in a bonded assembly due to inadequate mating of the facing sheets or blocked fixing rivets, and
they result mostly in porosity and voids. However, a thick glue line made with added layers of adhesive is usually free of