624
Chapter
7
corresponding input data file, Ch7ExOli.inp, is found on the CD. For
LHPM-Rietica, a single data file should contain both sets of powder
diffraction data, and these are found on the
CD
in the file
Ch7ExOl-Cu&MoKa.dat. The progression of Rietveld refinement is
illustrated in
Table
7.7. The initial residuals are shown in the first row in
Table
7.7, where expectedly, the figures of merit for the second set of data
(Mo
Ka)
are much worse than for the first (see
Table
7.3 and
Table
7.5).
Table
7.7.
The progress of the combined Rietveld refinement of the crystal structure of
LaNi4.ssSno
Is
employing two sets of experimental data obtained using Cu
Ka
and Mo
Ka
radiations.
Refined parameters
Cu Mo
R, R,,
RB
R, Rw,
RB
Initial
11.78 14.45 11.45 523.6 612.5 589.1
Scale factors
"
6.97 10.08 4.40 22.44 27.02 8.12
Scale factors plus
a,
c
and zero shifts
8.00 11.38 4.60 7.55 11.39 1.40
As above plus peak shape, background
7.44 10.51 4.35 6.38 10.27 1.42
As above plus
Pv
(all) and population
7.29 10.39 4.13 6.43 10.30 1.53
parameter,
n,
in
3(g)
site
All plus an impurity phase
6.87 9.02 4.13 5.99 8.62 1.40
a
When multiple sets of data are used in a combined Rietveld refinement, the first set has a
fixed scale,
k
=
1,
but all other sets have their own scales in addition to a phase scale.
Thus, in our case when we have two sets of diffraction data and one crystalline phase, two
scale factors
(K
and
kM,
Ka)
have been refined independently (see
Eq.
7.10,
below).
When more than one set of experimental diffraction data is employed in
the combined Rietveld refinement, the minimized function (in the simplest
case of
Eq.
7.3) becomes
In
Eq.
7.10,
h
is the number of different sets of powder diffraction data,
ns
is the number of data points collected in the
sth
set, and k, is the scale
factor for the
sth
diffraction pattern, which appears because scattered
intensity is measured on a relative scale. Other notations are identical to
Eq. 7.3. Different scale factors, k, and
K,
are simple multipliers. Hence, they
strongly correlate, and usually are not refined simultaneously. Constraining
one of the scale factors (usually kl, for the first diffraction data set) at 1
enables successful refinement of the phase scale
(9
and scale factors of all
remaining sets of diffraction data (k2, k3,
. .
.,
kh). Equations 7.4, 7.6 and 7.7
are modified in the same way as
Eq.
7.3 for a combined Rietveld refinement.
Furthermore, it is often the case that x-ray and neutron, or conventional x-
ray and synchrotron data are used in combined refinements, therefore, the