Egerton R.F. Physical Principles of Electron Microscopy. An Introduction to TEM, SEM, and AEM
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202 Index
Stacking fault, 114
Stage,
side-entry, 76
top-entry, 77
STEM, 18, 177
Steradian, 65
Stigmator, 52
condenser, 74
objective, 82, 145
SEM, 145
STM, 21
Surface replica, 103
Symmetry, axial, 3439
Symmetry, crystal, 112
Synchrotron source, 10
TEM,
history, 11
construction, 57
Thickness fringes, 114
Thickness measurement, 174
Thin-film deposition, 122
Thin-lens approximation, 32
Thinning of specimens, 121
Topographic contrast,
in SEM, 131
in STM, 22
Tunneling, 21, 63
Ultrafast microscopy, 188
Ultramicrotome, 101, 120
Unit cell, 110
Units of length, 1
Vacancy clusters, 114
Vacuum system, 88
Viewing screen, 85
Water window, 10
Wavelength,
of electrons, 11, 117
of light, 2
Wehnelt electrode, 61
Wien filter, 183
Work function, 58
Working distance, 143
X-ray,
bremsstrahlung, 160
characteristic, 158
X-ray microscope, 9
X-ray spectroscopy, 158, 143
XEDS, 161
XWDS, 168
Y-modulation, 25
Yield,
backscattering, 137
fluorescence, 166
secondary-electron, 131
total-electron, 148
Z-contrast, 101
ZAF correction, 167
Zero-loss peak, 173
Zone plate, 9, 152