Gonzalez, R.C., Woods, R., 1992. Digital Image Processing. Addison-Wesley, Reading, MA.
Hardy, M., Jamagne, M., Elsass, F., Robert, M., Chesneau, D., 1999. Mineralogical devel-
opment of the silt fractions of a podzoluvisol on loess in the Paris Basin (France).
European Journal of Soil Science 50, 443–456.
Hidalgo, C., Thiry, M., Elsass, F., Quantin, P., 1998. Caracte
´
risation mine
´
ralogique des
argiles des sols volcaniques indure
´
s de la valle
´
e de Mexico. 16th World Congress of Soil
Science, Montpellier, France, pp. 20–26.
Iijima, S., Buseck, P.R., 1978. Experimental study of disordered mica structures by high-
resolution electron microscopy. Acta Crystallographica A34, 709–719.
Kim, J.W., Peacor, R., Tessier, D., Elsass, F., 1995. A technique for maintaining texture and
permanent expansion of smectite interlayers for TEM observations. Clays and Clay Min-
erals 43, 51–57.
Klimentidis, R.E., Mackinnon, I.D.R., 1986. High-resolution imaging of ordered mixed-layer
clays. Clays and Clay Minerals 34, 155–164.
Kogure, T., 2002. Investigations of micas using advanced transmission electron microscopy.
In: Mottana, A., Sassi, F.P., Thompson, J.B. Jr., Guggenheim, S. (Eds.), Micas: Crystal
Chemistry & Metamorphic Petrology. Reviews in Mineralogy, Vol. 46. Mineralogical So-
ciety of America, Washington, DC, pp. 281–312.
Ko
¨
ster, H.M., 1977. Die Berechnung kristallchemischer Strukturformeln von 2:1 Schichtsil-
icaten. Clay Minerals 12, 45–54.
Lee, J.H., Ahn, J.H., Peacor, D.R., 1985. Textures in layered silicates: progressive changes
through diagenesis and low temperature metamorphism. Journal of Sedimentology and
Petrology 55, 532–590.
Lorimer, G.W., Al-Salman, S.A., Cliff, G., 1977. The quantitative analysis in thin specimen:
Effects of absorption, fluorescence, and beam spreading. In: Misell, D.L. (Ed.), Develop-
ments in Electron Microscopy and Analysis. Institute of Physics Conference Series 36. The
Institute of Physics, Bristol and London, 369 pp.
Mackinnon, I.D.R., Kaser, S.A., 1987. Microanalysis of clays at low temperature. Microbeam
Analysis 22, 332–334.
Mackinnon, I.D.R., Lumpkin, G.R., van Deusen, S.B., 1986. Thin-film analyses of silicate
standards at 200 kV: the effect of temperature on element loss. Microbeam Analysis 24,
451–454.
McKee, T.R., Brown, J.L., 1977. Preparation of specimens for electron microscopic exam-
ination. In: Dixon, J.B., Weed, S.B. (Eds.), Minerals in Soil Environments. Soil Science
Society of America, Madison, WI, pp. 809–841.
Metha, S., Goldstein, J.I., Williams, D.B., Romig, A.D. Jr., 1979. Determination of Cliff-
Lorimer k calibration factors for thin-foil X-ray microanalysis of Na, Mg, and Al in the
STEM. Microbeam Analysis 14, 119–123.
Moore, D.M., Reynolds, R.C. Jr., 1997. X-ray Diffraction and the Identification and Analysis
of Clay Minerals. Oxford University Press, Oxford.
Murphy, S.F., Brandtley, S.L., Blum, A.E., White, A.F., Dong, H., 1998. Chemical
weathering in a tropical watershed, Luquillo Mountains, Puertu Rico: II the rate
and mechanism of biotite weathering. Geochimica et Cosmochimica Acta 62,
227–243.
Mystkowski, K., S
´
rodon
´
, J., Elsass, F., 2000. Mean thickness and thickness distribution of
smectite crystallites. Clay Minerals 35, 545–557.
Chapter 12.8: Transmission Electron Microscopy960