11 One-Dimensional Phase-Change Nanomaterials 283
reported in the literature [35,37–39]. The XPS analysis indicates that the nanowires
are GeTe compound. The peaks at 32.8 eV in Fig. 11.6a and 576.2 eV in Fig. 11.6b
are due to GeO
2
and TeO
2
, respectively, from the thin oxide outer layer. Because
XPS is a surface sensitive tool with a sampling depth of several nanometers, even 1–
3nmGeO
2
·TeO
2
outer layer can be clearly detected. A quantitative analysis from
XPS data further confirms that the atomic ratio of Ge and Te is close to 1:1.
11.3.3 Synthesis and Characterization of III–VI Compound
(In
2
Se
3
) Nanowires
The compound semiconductor Indium Selenide (In
2
Se
3
) is of interest due to its
polymorphism and the related metal-ion defect structure. It exhibits at least three dif-
ferent crystalline modifications denoted by α, β, and γ with a transition temperature
of 200 and 650
◦
C, respectively, for the α–β and β–γ transition [40]. Undoped In
2
Se
3
is an n-type semiconductor in the form of hexagonal structure with a direct band gap
of 1.7 eV [41]. In
2
Se
3
is considered for several applications such as photovoltaic so-
lar cell [42, 43], optoelectronics [44], and ionic battery [45]. In particular, In
2
Se
3
has been recently used as a programmable material in phase-change random access
memory (PRAM) [46, 47]. In
2
Se
3
shows four orders of magnitude higher electri-
cal resistivity than Ge
2
Sb
2
Te
5
, a widely used phase-change material for PRAM.
Its resistivity can be varied by a factor of 10
5
, depending on the degree of crystal-
lization. Highly resistive phase-change materials help to reduce the programming
current in PRAM switching activity, especially in the crystal to amorphous (c-to-α)
phase transition. The reduced current implies low energy consumption, minimized
intercell thermal interference, and improved cell scalability in data storage.
A typical synthesis condition for In
2
Se
3
nanowires is described as follows.
In
2
Se
3
powder (99.999%, Aldrich) was placed upstream in the reactor in the middle
of the high-temperature zone. Both Si(111) wafer and 300
˚
A thermal SiO
2
coated
Si(100) wafer, deposited with gold nanoparticles or indium film, were loaded down-
stream in the low temperature zone as the target substrate for nanowire growth.
Argon as the carrier gas was introduced at a flow rate of 25 sccm and pressure of
30∼600Torr, or at a flow rate of 100 sccm and at atmospheric pressure. The tem-
peratures of the source material and that of the targeted substrate were ramped up to
900–950
◦
C and 650–700
◦
C, respectively, and maintained for 60 min.
The as-grown In
2
Se
3
NWs have a diameter in the range of 40–80 nm and are up to
100µm in length as shown in Fig. 11.7. A representative TEM image (Fig. 11.8a) of
an individual In
2
Se
3
NW shows that the nanowire has a smooth surface and uniform
thickness along the growth direction. The average diameter of the NWs is 60 ±
18nm. Local EDS analyses (Fig. 11.8b), in which the TEM electron beam is focused
on a targeted sample areas as small as 9 nm in diameter, shows that the particle,
appeared as a dark-colored ball on the tip of the nanowire, is primarily gold with
an indium content below 5 at.% and selenium content below the detection level.
The local point EDS analysis on the nanowire (Fig. 11.8c) shows that In and Se