74 D. Ruzmetov and S. Ramanathan
low-T curves. The discontinuous change of the bandwidth upon crossing the MIT
temperature and constant line shape on either side of T
MIT
attest that the observed
discrete changes in the energy band structure are attributes of the phase transition.
Each spectrum in Figs. 2.15 and 2.16 can be fitted well with the sum of two
Doniach–Sunjic peaks (with Gaussian broadening) and a linear background so that
the linewidths, positions, and heights of the component peaks can be precisely ex-
tracted from the measured data [27, 39]. The results of the fitting are presented in
[39]. Sample 1 is sputtered at lower substrate temperature, has smaller grain size,
and is expected to have more disorder than sample 2 [39]. The bandwidths for this
sample appear to be larger than for sample 2 and there is also a decrease in the spac-
ing between the bands
and
. The decrease occurs mainly due to the shift of
the
peak.
Taking into account the symmetry of the orbitals in the compound can help to
obtain the microstructural information from the O K-edge XAS data extracted from
the spectra in Figs. 2.15 and 2.16, and summarized in [39]. orbitals in VO
2
point
in between the ligands (O ions) and orbitals are directed toward the ligand. There-
fore, V–V interactions affect the band more, whereas the band is influenced by
the V-ligand configuration and the indirect V–O–V interaction. Then the observed
shift in the
peak in the film with smaller grain size and increased disorder (sample
1) can be taken as evidence for the distortion of the oxygen octahedra with respect to
the V ions as compared to the samples that exhibit more single crystal VO
2
character
(samples 2 and 2m) [39]. As-grown sample 2 m is identical to sample 2 and was used
for temperature dependent measurements across T
MIT
. It was observed that neither
line position, nor spacing , change appreciably upon MIT (samples 2 and 2m)
indicating that the V–V pairing upon the MIT (as a part of the lattice transformation
from tetragonal to monoclinic) is not accompanied with the O octahedra distortion.
Finally, the widths of the peaks are the largest in the most disordered sample 1 fol-
lowed with the low-T phase of sample 2. Apparently the line widths are connected
to the amount of defects in the crystal lattice of materials. The films deposited at
low substrate temperatures have more lattice defects since the deposited atoms have
less energy to move to the most favorable thermodynamic locations. These defects
on average will cause the line broadening that is being observed in sample 1. Sim-
ilarly, the lower-symmetry monoclinic phase of VO
2
(sample 2 in Fig. 2.15) yields
broader lines than the tetragonal metallic phase (sample 2m in Fig. 2.16).
X-ray absorption spectroscopy can be used to learn what features of the band
structure are directly connected with the metal–insulator transition. Consider again
(see Sect. 2.2) the set of five vanadium oxide films with varying V–O stoichiometry
in the narrow range around the stoichiometry of VO
2
. The results of the electri-
cal characterization for this set were presented in Fig. 2.4. In order to extract the
transition temperatures .T
MIT
/ and widths .T /, the derivatives of the resistance
d.log
10
R/=dT were taken from the data in Fig. 2.4. The resulting curves had clear
minimums and could be well-fitted with Gaussians (see examples of the fitting in
Fig. 2.8b). The center and width of the fitted Gaussian were taken as T
MIT
and T .
The MIT strength was defined as the resistance ratio R.T
MIT
T /=R.T
MIT
CT /.
XAS measurements of the O K-edge at room temperature were performed on this