Index 331
metal–semiconductor interfaces, 171
perovskite structure, 169–170
Poisson’s equation, 174
pulsed laser deposition (PLD), 170–171
resistive switching, 201
resonant tunneling, 199–200
RHEED, 170–171
Schottky–Mott limit, 175
SrRuO
3
/Nb:SrTiO
3
junction
bulk Hall effect, 184, 185
core-level shifts, 186–187
internal photoemission (IPE), 185–186
I–V and C–V characteristics, 183–184
Nb concentration, 184–185
plasma emission spectroscopy analysis,
184
polar discontinuity, 183
relative permittivity, 185, 187
temperature dependent resistivity, 185
vacuum photoemission, 186
SrTiO
3
dielectric properties
Barrett’s formula, 180, 181
conductivity, 179
C–V characteristics, 180, 182, 183
electrostatic potential and electric field,
181
high temperature superconductivity,
180
I–V characteristics, 181–183
polarity, 181, 183
relative permittivity, 180, 181, 183
thermionic-field emission, 183
termination control
charge sheet density, 190, 191
electrostatic potential, 190
Fermi level pinning, 188
interface termination, 187, 189, 190
I–V, C–V, and IPE characteristics, 188,
189
relative permittivity, 190
SrMnO
3
coverage, 187, 188
Thomas–Fermi screening length, 190
Conductive bridge RAM (CBRAM), 132
Conductive-tip atomic force microscope
(C-AFM), 147
Core electrons, 324–325
Crystal structure
BiFeO
3
, 118
chromium dioxide (CrO
2
/,99
La
1x
Sr
x
MnO
3
, 103
magnetite (Fe
3
O
4
/, 109–110
thin film vanadium dioxide
monoclinic lattice, 57, 58
rutile lattice, 57
XRD spectrum, 58–59
Curie temperature, 40, 101–103, 108, 109,
112, 113, 118
D
Density of states (DOS), 288, 289, 295, 296
Devices, vanadium dioxide
cross-bar memory structure, 88, 89
current vs.temperature, 85–86
current vs.voltage, 88, 89
free carrier density, 85
switching time, 87
Diluted magnetic oxide semiconductors
anomalous Hall effect (AHE), 113, 114
Curie temperature, 112, 113
Hall resistance, 112
holy grail, 111
hysteresis loop
Co
0:07
Ti
0:93
O
2
, 114, 116
Ti
0:99
Co
0:01
O
2•
, 115
magnetic circular dichroism (MCD), 114,
115
Zener mean-field model, 113
Dye-sensitized solar cells (DSSCs), 273–274
Dynamic random access memory devices
(DRAM), 131
E
Electric polarization, 210
Electrochemical metallization memory
(ECM), 132
Electrode materials
bipolar and unipolar switching, 159–161
Cu-and Ag-electrode, 159
metal workfunction, 158–159
Energy band structure, vanadium dioxide
CDMFT, 76, 78
dipole selection rules, 73
metal-insulator transition strength, 74–75
near-Fermi level, 71, 72
peak height ratio, 75
PES intensity, 76–78
spectral weight redistribution, 75
X-ray absorption spectroscopy (XAS) data,
72, 73
F
Fermi’s golden rule, 11
Ferroelectricity
Born dynamical charges, 207, 208