Unit cell determination and refinement
40
1
Regardless of the nature of the diffraction experiment, finding the unit
cell in a conforming lattice is a matter of selecting the smallest
parallelepiped in reciprocal space, which completely describes the array of
the experimentally registered Bragg peaks. Obviously, the selection of both
the lattice and the unit cell should be consistent with crystallographic
conventions (see section 1.12, Chapter
I), which impose certain constraints
on the relationships between unit cell symmetry and dimensions.
Since each point in reciprocal space represents a series of
crystallographic planes, the description of diffraction data by means of any
lattice may therefore, be reduced to assigning triplets of Miller indices to
every observed Bragg peak based on the selected unit cell. Recalling the
definitions of both the direct and reciprocal lattices (Eqs. 1.1 and 1.16,
respectively) and considering Figure
5.1
(or Figure
2.40
in Chapter
2,
which
illustrates a three-dimensional case), the assignment of indices in a periodic
lattice is based on Eq. 5.1.' The latter establishes relationships between the
unit vectors
a*,
b* and
c*
and the corresponding reciprocal vectors d*(jko in
terms of triplets of integers
h,
k
and I.
d*,,
=
ha*
+
kb*
+
lc*
(5.1)
This process is commonly known as indexing of diffraction data and in
three dimensions it usually has a unique and easy solution when both the
lengths and directions of reciprocal vectors,
d*jkl, are available. On the
contrary, when only the lengths,
d*hkl, of the vectors in the reciprocal space
are known, the task may become extremely complicated, especially if there
is no additional information about the crystal structure other than the array of
numbers representing the observed l/djkl
[=
d*hkl] values.
The difficulty and reliability of indexing are closely related to the
absolute accuracy of the array of d*jkl values, i.e. to the absolute accuracy
with which positions of Bragg reflections have been determined. For
Conventional lattices may be perturbed by functions with different periodicity, e.g. by
sinusoidal or saw-tooth-like modulations, see section 1.21 in Chapter
1.
In the simplest
case (one-dimensional modulation), Eq.
5.1
becomes
d*hkr
=
ha*
+
kb*
+
lc*
+
mq
assuming that the perturbation function is periodic and has the modulation vector
q.
In a
case of three-dimensional modulation, a total of six indices
(h, k,
1,
m, n,
and
p)
are
required to identify every point observed in reciprocal space:
d*hkl
=
ha*
+
kb*
+
lc*
+
mq,
+
nq2
+
pq,,
where
q,, q2
and
q3
are the modulation vectors of the corresponding
perturbation functions. If this is the case, vectors
q,, q2
and
q3
should be established in
addition to
a*,
b*
and
c*
before assignment of indices can be performed. Since even the
three-dimensional diffraction pattern of a modulated structure is a projection of four- to
six-dimensional superspace, indexing of single crystal diffraction data is quite complex. It
is rarely, if ever, successful from first principles when only powder diffraction data are
available.