Crystal structure solution
515
6.8
Structure solution from powder data
In the remainder of this chapter, we will consider multiple practical
structure solution examples. For the most part, individual intensities and
structure factors will be extracted by using Le Bail's algorithm of full pattern
decomposition. This technique is chosen instead of
Pawley's approach
because the former algorithm is usually more stable and it has been
incorporated into several freely available software programs, which are
coupled with Patterson and Fourier calculations. These are: LHPM-Rietical
and GSAS,' although other well-developed and tested computer codes are
a~ailable.~
In
some of the more complex examples, however, we will employ
manual profile fitting. The latter approach is less "user-friendly" in terms of
automation, but it avoids the unrestricted and sometimes unrealistic
determination of the intensities of
Ka,
and
Ka2
peaks.
By solving crystal structures of different classes of
material^,^
we will
illustrate only a few of the possible approaches to the
ab initio
structure
solution from powder diffraction data. Whenever possible the structure
factors obtained from full pattern decompositions should be used until the
coordinates of all atoms are established.
In
some cases it may be necessary
to re-determine individual structure factors based on the nearly completed
structural model, especially when locations of lightly scattering atoms are of
concern after all strongly scattering species have been correctly positioned in
the unit cell. This re-determination may be routinely performed during
Rietveld refinement and
will
be briefly discussed in Chapter
7.
LHPM-Rietica (authors B.A. Hunter and C.J. Howard) may be downloaded from
ftp:Nftp.ansto.gov.au/pub/physics/neutron/rietveld/RieticaLHPM95/
or
via
a link at
http://www.ccp14.ac.uk.
GSAS (authors A.C. Larsen and R.B. Von Dreele) may be downloaded from
http://public.lanl.gov/gsas/
or
via
a link at http://www.ccpl4.ac.uk. A convenient graphic
user interface for GSAS (author Brian Toby) may be downloaded from
http://www.ncnr.nist.gov/programs/crystallography/
or
via
http://www.ccpl4.ac.uk.
One of these is EXPO
-
an integrated package for full pattern decomposition and for
solving crystal structure by direct methods (authors
A.
Altomare, B. Carrozzini, G.
Cascarano, C. Giacovazzo, A. Guagliardi, A.G.G. Moliterni, R. Rizzi, M.C. Burla, G.
Polidori, and M. Camalli). For information on how to obtain the program, contact
sirware@area.ba.cnr.it or visit
http://www.irmec.ba.cnr.it/.
There is a variety of software that can be used to process "pseudo-single crystal"
experimental diffraction data represented in a form of individual structure factors or their
squares (consult http://www.iucr.org and/or
http://www.ccpl4.ac.uk).
The most commonly
used software products are SHELXS-90 and SHELXL-97 (author G.M. Sheldrick), which
are distributed free for academic use (consult SHELX home page at
http://shelx.uni-
ac.gwdg.de/SHELX/index.html
for details). Unless noted otherwise, processing of the
individual structure factor data, direct phase determination, Patterson-, Fourier- and E-map
calculations shown in this chapter were performed using WinCSD software, which is
available from STOE
&
Cie, Gmbh
(http://www.stoe.com/products/index.htm).