166 The diffraction of light
The geometry of X-ray diffraction patterns is rather more complicated because the
wavelengths of X-rays (∼0.2 nm) are roughly comparable with the lattice spacings in
crystals. Hence the diffraction angles are large (Sections 8.2, 8.3, 8.4 and 9.5) and X-ray
diffraction patterns are in a sense ‘distorted’representations of the patterns of reciprocal
lattice points from crystals, the nature of the ‘distortion’ depending upon the particular
X-ray technique used.
The second reason for considering the diffraction of light is that it provides a sim-
ple basis or analogy for an understanding of how and why the intensities of X-ray
diffraction beams vary (Section 9.1), line broadening and the occurrence of satellite
reflections (Section 9.6). The analogy is provided by a consideration of the diffraction
grating, which is, in effect, a one-dimensional crystal. There are three variables to con-
sider in the diffraction of light from a diffraction grating—the line or slit spacing, the
width of each slit and the total number of slits. The slit spacing corresponds to the
lattice spacings in crystals and determines the directions of the diffracted beams, or,
in short, the geometry of the diffraction patterns. The width of the slits determines,
for each diffracted beam direction, the sum total of the interference of all the little
Huygens’ wavelets which contribute to the total intensity of the light from each slit
(Section 7.4), which is analogous to the sum total of the interference between all the
diffracted beams from all the atoms in the motif. In short it is the lattice which deter-
mines the geometry of the pattern and the motif which determines the intensities of the
X-ray diffracted beams. The analogy, however, must not be pressed too far because it
takes no account of the dynamical interactions between diffracted beams, i.e. the inter-
ference effects arising from re-reflection (and re-re-reflection, etc.) of the direct and
diffracted/reflected beams as they pass through a crystal. This desideratum is particu-
larly important in the case of electron diffraction. Finally, the total number of slits in a
diffraction grating determines the numbers and intensities of the satellite or subsidiary
diffraction peaks each side of a main diffraction peak—the greater the number of slits,
the greater the numbers and the smaller are the intensities of the satellite peaks. In most
X-ray and electron diffraction situations the total number of diffracting planes is so large
that satellite peaks are unobservable and of no importance, but in the case of X-ray
diffraction from thin film multilayers, consisting not of thousands but only of tens or
hundreds of layers, the numbers and intensities of the satellite peaks are important and
useful.
Third, it is the diffraction of light which sets a limit, ‘the diffraction limit,’ to the
resolving power or limit of resolution of optical instruments, in particular telescopes
and microscopes, and is therefore of utmost importance to an understanding of how
these instruments work. The diffraction limit however is not unsurmountable and it is
an important characteristic of modern microscopical techniques—for example scanning
tunnelling, atom force, or near field scanning optical microscopes—that they overcome
this limit by virtue of the close approach of a fine probe to a specimen surface.
Finally, to generalize the point made in the first paragraph, the reciprocal relation-
ship between an object and its diffraction pattern is formally expressed by what is
known as a Fourier transform, which is a (mathematical) operation which transforms
a function containing variables of one type (in our case distances in an object or dis-
placements) into a function whose variables are reciprocals of the original type (in our