
206 5 Application of Modern TCSPC Techniques
The fit was calculated for the time window indicated by the vertical lines; it de-
livers lifetime components of 49 ps and 476 ps. The fast lifetime components may
contain some scattered laser light. Nevertheless, even the slow component is re-
markably short. The short lifetime can, however, be explained by the fact that the
excitation density was very small. The leaves were therefore perfectly dark-
adapted. Consequently, the reaction pathway remained fully open during the
measurement, and no decrease of photochemical quenching was induced [345].
5.14.3 Laser Ranging
The high time resolution of TCSPC in conjunction with fast detectors can be used
to build up high-resolution ranging or three-dimensional imaging systems. The
system described in [340, 341, 533] uses a 20 ps diode laser, an actively quenched
avalanche photodiode [116] and an SPC
300 TCSPC module. The photons re-
flected from the target and a reference pulse are recorded within the same TAC
range. A slow-scanning procedure is employed, i.e. the photons for one pixel of
the image are collected and the time-of-flight distribution is read out from the
TCSPC module before the scanner proceeds to the next pixel.
The system achieves a distance repeatability of 10 µm and < 30 µm for a 1 m
and 25 m stand-off, respectively. The distance accuracy corresponds to a timing
accuracy of 33 fs and 100 fs. This surprisingly high resolution is obtained by a
fitting algorithm [516] which gives a better accuracy than the usual centroid esti-
mate. The high accuracy is also explained by the fact that the average timing jitter
of a large number of detected photons decreases with the square root of the photon
number. An accuracy this good can only be achieved with a detector of low transit
time spread, efficient cancellation of system drifts, and a TCSPC time channel
width short enough to sample the IRF correctly.
TCSPC modules with sequencing or imaging capability can be used to read out
the data without stopping the measurement, or to acquire the complete image at a
fast scanning rate.
5.14.4 Positron Lifetime Experiments
Positron lifetime measurements can be used to investigate the type and the density
of lattice defects in crystals [293]. In solid materials positrons have a typical life-
time of 300 to 500 ps until they are annihilated by an electron. When positrons
diffuse through a crystal they may be trapped in crystal imperfections. The elec-
tron density in these locations is different from the density in a defect-free crystal.
Therefore, the positron lifetime depends on the type and the density of the crystal
defects. When a positron annihilates with an electron two
J quanta of 511 keV are
emitted. The
J quanta can easily be detected by a scintillator and a PMT.