Springer, 2008. 184 p. ISBN: 1402084196
Written by a team of two leading experts and two very successful young former PhD students, New Methods of Concurrent Checking describes new methods of concurrent checking, such as partial duplication, use of output dependencies, complementary circuits, self-dual parity, self-dual duplication and others. A special chapter demonstrates how the new general methods of concurrent checking can be more specifically applied to regular structures to obtain optimum results. This is exemplified for all types of adders up to 64 bits with a level of detail never before presented in the literature. The clearly written text is illustrated by about 100 figures.
Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Inteet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation.
Computers are incredibly fast, inexpensive and equipped with almost unimaginable large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm2.
This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nanotechnologies in the near future.
Can we always trust computers? Are computers always reliable? Are chips suf?ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by concurrent checking? Besides permanent faults, many temporary or transient faults are also to be expected.
What do we know about the detection of these transient faults during normal operation? Contrary to permanent faults, transient faults cannot be detected by testing but rather only by concurrent checking, and the design of effective error detection circuits for concurrent checking will be a challenging problem in the next years.
The book in front of you, New Methods of Concurrent Checking, answers the question as to how the best possible state-of-the-art error detection circuits can be designed. This book describes the latest new and effective methods for concurrent checking for digital circuits which were developed mainly in the last 15 years. Some of the methods are published for the ?rst time. The book is of interest to students and teachers in electrical engineering and computer science, researchers and designers and all readers who are interested in error detection and reliability of digital circuits and computers.
The authors have worked together in research and industrial projects in the area of concurrent checking in the Fault-Tolerant Computing Group at the University of Potsdam, Germany. This group was founded in 1992 as a Max-Planck-Working Group and was incorporated into the Institute of Computer Science of the university in 1997.
Many of the ideas and results presented here were obtained in cooperation with guest researchers from different parts of the world.
Written by a team of two leading experts and two very successful young former PhD students, New Methods of Concurrent Checking describes new methods of concurrent checking, such as partial duplication, use of output dependencies, complementary circuits, self-dual parity, self-dual duplication and others. A special chapter demonstrates how the new general methods of concurrent checking can be more specifically applied to regular structures to obtain optimum results. This is exemplified for all types of adders up to 64 bits with a level of detail never before presented in the literature. The clearly written text is illustrated by about 100 figures.
Computers are everywhere around us. We, for example, as air passengers, car drivers, laptop users with Inteet connection, cell phone owners, hospital patients, inhabitants in the vicinity of a nuclear power station, students in a digital library or customers in a supermarket are dependent on their correct operation.
Computers are incredibly fast, inexpensive and equipped with almost unimaginable large storage capacity. Up to 100 million transistors per chip are quite common today - a single transistor for each citizen of a large capital city in the world can be easily accommodated on an ordinary chip. The size of such a chip is less than 1 cm2.
This is a fantastic achievement for an unbelievably low price. However, the very small and rapidly decreasing dimensions of the transistors and their connections over the years are also the reason for growing problems with reliability that will dramatically increase for the nanotechnologies in the near future.
Can we always trust computers? Are computers always reliable? Are chips suf?ciently tested with respect to all possible permanent faults if we buy them at a low price or have errors due to undetected permanent faults to be discovered by concurrent checking? Besides permanent faults, many temporary or transient faults are also to be expected.
What do we know about the detection of these transient faults during normal operation? Contrary to permanent faults, transient faults cannot be detected by testing but rather only by concurrent checking, and the design of effective error detection circuits for concurrent checking will be a challenging problem in the next years.
The book in front of you, New Methods of Concurrent Checking, answers the question as to how the best possible state-of-the-art error detection circuits can be designed. This book describes the latest new and effective methods for concurrent checking for digital circuits which were developed mainly in the last 15 years. Some of the methods are published for the ?rst time. The book is of interest to students and teachers in electrical engineering and computer science, researchers and designers and all readers who are interested in error detection and reliability of digital circuits and computers.
The authors have worked together in research and industrial projects in the area of concurrent checking in the Fault-Tolerant Computing Group at the University of Potsdam, Germany. This group was founded in 1992 as a Max-Planck-Working Group and was incorporated into the Institute of Computer Science of the university in 1997.
Many of the ideas and results presented here were obtained in cooperation with guest researchers from different parts of the world.