nuclei responsible for the coupling. This technique has been applied to
various systems. In the following section, examples are given for studying (a)
organic radicals in organic host crystals, (b) radicals trapped in xenon, argon,
or Freon matrices, (c) triplet state radicals in crystals or polycrystalline
samples, (d) free radicals in biological systems, (e) polymeric systems, (f)
inorganic radicals in irradiated inorganic single crystals, (g) paramagnetic
complexes in organic single crystals, (h) F and H centers found in inorganic
host lattices, (i) paramagnetic inorganic ions in organic crystals, (j) transition
metal ion complexes observed in frozen solution and powders, (k) defects and
complexes on surfaces such as silica alumina, zeolite, and nafion, (l) impurity
centers in semiconductor host crystals, (m) spin centers in silicon and borate
systems, (n) paramagnetic centers in cubic host crystal and (o) perovskite-type
materials. Selected examples are given in each area with references noted.
A detailed tabulation of the published ENDOR data for single crystals,
polycrystalline solids and biological materials for 58 isotropic species through
1993 has been given in the Handbook of Electron Spin Resonance [25].
Earlier ENDOR studies in disordered matrices, crystalline systems, hemes and
hemoproteins, iron-sulfur proteins, radiation biophysics, polymer studies, and
triplet state systems in solids were reviewed in Dorio and Freed (eds.) [26].
4.5.1 Organic Radicals in Organic Host Crystals
Often the crystals are irradiated at a low temperature and then the radicals
identified as the temperature is raised. Electron attachment and proton
abstraction occur at different temperatures so intermediate radicals can be
formed. An example of the principal values of the hyperfine couplings for the
D- and E-protons and the
14
N couplings for the radical formed [27] upon X-
irradiation of deoxycytidine-5'-phosphate-hydrate at 11 K and measured by
X-band ENDOR techniques at 6 K is given in Table 4.3. Two Mrad/hour of
irradiation was applied for 2–4 hours. Because of the increased resolution, the
couplings can be determined more precisely and it is possible to detect the
presence of several radicals. Radicals I and II
a
and II
b
were identified at 6 K.
Typically the primary radical is formed at the lowest temperature as a result of
reaction with the electrons formed from the X-irradiation. However, as the
temperature is raised, the unstable primary radical decays—forming other
products which may or may not be radicals. An example [28] where different
radicals were identified as a function of temperature occurred upon 4.2 K
X-irradiation of a single crystal of citric acid (2-hydroxy-1,2,3-propane
tricarboxylic acid), partially deuterated and warmed to 100 K. ENDOR
analysis achieved upon cooling the radicals formed at 100 K to 4.2 K, thus
quenching the reaction, are given in Table 4.4.
Radical I is formed by the loss of a carboxylic acid group from the 2-
position and radical II is due to electron attachment to the carboxylic acid
group located at the 3-position. Upon warming to 300 K, radical II decays and
181
4.5 Applications