G.YOUREK
ET AL
The final AFM image is virtually a composite or “convolution” between the geomet-
ric properties of the tip and the sample surface.
93
Undoubtedly, one of the most impor-
tant controllable parameter for AFM imaging, either in ambient air or fluid, is proper
selection of scanning tips. The AFM scanning “tip” typically consists of a sharp micro-
fabricated barb or spike mounted at the end of a “cantilever” to form a unified “probe”.
Although these terms are sometimes used interchangeably, only the microstructured com-
ponent at the end of the cantilever is the part that actually indents the sample surface dur-
ing the AFM scanning. A wide variety of AFM scanning tips are currently available,
differing in geometry, material properties, and chemical composition.
Tips are broadly defined by their aspect ratio (length to width), opening angle and/or
radius of curvature. Relatively rough sample surfaces, in the range of micrometers,
should be scanned using high-aspect-ratio tips, which combine small opening angles with
a long tip. However, low-aspect-ratio tips, corresponding with high opening angles, are
more suitable for scanning relatively flat specimens.
94, 95
A special type of low-aspect-
ratio tips exist where the very end is shaped into a high-aspect-ratio peak with overall
low-aspect-ratio configuration of the tip. These tips are referred to as “sharpened tips”
and ensure greater scan depth with improved resolution when scanning relatively flat
samples. Radius of curvature of the AFM tip reflects the nanometric sharpness of the
tip’s peak. Typical radius of curvature of sharpened tips is less than 20 nm, while that of
unsharpened tips ranges from 20-50 nm. Oxide sharpened silicone nitride tips are widely
utilized in the AFM scanning of living cells and various other biological structures
3, 96, 97
due to their high versatility and ability to combine high resolving power with physical
tolerance on soft sample surface.
The tip-cantilever assembly is most commonly made of crystal silicone or silicone
nitride, which are both suitable for microfabrication due to their stiffness and wear resis-
tance. Silicone nitride tips are more suitable for contact mode imaging due to their flexi-
bility and “forgiveness” on the sample surface compared to the stiffer crystal silicone
probes. Another distinctive characteristic of silicone nitride probes is the greater ten-
dency of the silicone nitride tips to be trapped by the surface tension attractive forces
during interactions with the sample surface than the crystal silicon probes. Such forces,
although micro- or nano-scale in nature, might be strong enough to deform the surface of
soft samples. Therefore, considerable attention to the selection of the scanning tip should
be taken, especially when imaging delicate samples. By contrast, when scanning harder
samples or using tapping mode AFM, stiffer crystal silicone probes are likely more ap-
propriate. However, increased brittleness of the crystal silicone tips due to their greater
stiffness mandates considerable care during tip handling and preparation for the scanning
session.
Several recent efforts are directed toward substituting the silicone and the silicone ni-
tride with more characterized materials for the fabrication of enhanced AFM probes.
Carbon nanotubes
98-101
are gaining rising popularity to be the backbone structural mate-
rial for the second generation of AFM probes. Additional advantages offered by the car-
bon nanotubes include their well-characterized structure, mechanical robustness, and
unique chemical properties that allow well-defined surface modification without jeopard-
izing the AFM scanning resolution. For example, utilizing this last feature of feasibility
of carbon nanotubes’ surface modification under high controllability, many aspects of
structural and thermodynamic properties of protein-protein and protein-nucleic acid com-
76