2.3 Autocorrelation Function 15
w(t) ≡
[h(x,t)]
2
. (2.3)
Larger values of the interface width indicate a rougher surface. It is common
to observe a power-law behavior for the interface width in deposition time,
w(t) ∼ t
β
, (2.4)
where β is referred to as the growth exponent. This characteristic behavior
of the interface width is the basis for dynamic scaling theory, which has been
widely used to describe the dynamic properties of thin films.
2.3 Autocorrelation Function
Statistics such as the mean height and interface width measure the vertical
properties of a surface and do not reflect correlations between different lat-
eral positions on the surface. To accomplish this, the autocorrelation function
R(r,t) is introduced, which measures the correlation of surface heights sepa-
rated laterally by the vector r. The autocorrelation function is defined as
R(r,t) ≡ w
−2
h(x,t)h(x + r,t). (2.5)
If the statistical behavior of a surface does not depend on the specific orienta-
tion of the surface, the surface is said to be isotropic, and the autocorrelation
function depends only on |r|. Thus, a new variable r = |r| can be introduced
to express the autocorrelation function as R(r, t). Surfaces that do not possess
this symmetry are called anistropic surfaces, whose treatment is not discussed
here. The interested reader may find more information about anistropic sur-
faces in [187].
General properties of the autocorrelation function can be deduced from
its definition. When r =0,R(0,t) = 1, using the definition of interface width
to evaluate the average. In addition, when r is large, surface heights become
uncorrelated. Because xy = xy if x and y are uncorrelated variables, for
large r,
R(r, t) → w
−2
h(x,t)h(x + r,t)∼w
−2
h
2
∼ 0, (2.6)
as the mean height
h is taken to be zero at all times by the choice of ref-
erence height. It follows that R(r, t) is a decreasing function of r, and how
fast R(r, t) decreases is a measure of the lateral correlation of surface heights.
For self-affine thin film surfaces, the autocorrelation function is often found
to have an exponentially decreasing behavior, which naturally satisfies the
above properties. Mounded thin film surfaces also exhibit a decreasing au-
tocorrelation function in general, but the autocorrelation function may also
exhibit oscillations as a result of the presence of mounds. Figure 2.2a shows the
characteristic behavior of the autocorrelation function of a self-affine rough
surface.