430 Chapter 9
MeN and MeC are obtained by PECVD, when organometallic or chelate precursors are
decomposed in mixtures containing N
2
or CH
4
, Ar and H
2
. The film microstructure can be
selectively controlled by adjusting chemical reactions in the gas phase and at the growing
surface, and by appropriate choice of E
i
,
i
and
n
values, which affect the development of
crystals, their size, shape, and orientation [164–166, 169–172]. One of the frequent concerns
in this activity is handling hazardous and corrosive precursors, including metal chlorides.
Nanocomposite superhard coatings formed by nanometer size particles (usually MeN, MeC)
embedded in amorphous or crystalline matrices are of considerable interest. These 3D
architectures, also called ‘third generation ceramic coatings’, represent a new class of
materials that exhibit exceptional mechanical, electronic, magnetic, and optical properties
due to microstructural features which are reduced to approximately 5–10 nm [164–166,
168–173].
Such hard nc-MeN/hard matrix (usually amorphous such as SiN
1.3
) materials have been
fabricated by PECVD [164, 167, 169, 171, 172], complementary to the nc-MeN/soft matrix
(usually metal, Me = Ti, Cr, W, V, Zr) films prepared by PVD [166]. Formation of nc structures
is based on the thermodynamically driven segregation in binary, ternary, or quaternary
systems, which leads to spontaneous self-organization of a stable nanoscale structure [164].
The microstructure of nc gives rise to high H with relatively low E providing high toughness,
enhanced wear resistance, high elastic recovery, resistance against crack formation and crack
propagation, high thermal stability (up to 1100
◦
C), and reduced thermal conductivity. These
properties are explained by the difficulty of creating dislocations in grains of tens of
nanometers in size, and by the reduction of intergranular sliding due to the thinness of the
grain boundary region. In general, such properties are controlled by crystal size, orientation,
and shape, and by grain boundary thickness, and they depend on the selection of materials,
process parameters such as E
i
and
i
, and deposition methods [166, 169–172].
Of all nc superhard (H > 40 GPa) films, TiN-based coatings with SiN
1.3
matrix have been the
most frequently investigated. As an example, the effect of silicon concentration [Si] on H and
E for nc-TiN/SiN
1.3
films, fabricated at T
s
= 500
◦
C is shown in Figure 9.18(a). Both clearly
exhibit a maximum at an optimum [Si] situated between 5 and 10 at.% that corresponds to an
amount of SiN
1.3
that forms a matrix which surrounds the TiN particles (5–10 nm in diameter).
It has been proposed that the boundary between grains is about one monolayer thick [164, 169,
170, 173, 174].
In order to obtain insight into the microstructural characteristics on the nanoscale, and to
determine complementary functional properties, electrical resistivity, ρ
E
, of such nc films has
been studied by in situ RTSE and ex situ four-point measurements [70, 167]. As an example,
the effect of [Si] on ρ
E
is presented in Figure 9.18(b). The metallic character of pure TiN and
of the nc-TiN/SiN
1.3
was confirmed by low values of ρ
E
until about [Si] ∼ 40 at.%, above
which the loss of metallic character was marked by the onset of a rapid increase in ρ
E
due to