Leroy C., Rancoita P.-G. Principles Of Radiation Interaction In Matter And Detection
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January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
920 Principles of Radiation Interaction in Matter and Detection
X, 144, 194, 422, 425, 437, 438, 493,
494, 509, 757, 780
absorption coefficient, 438
detector, 439, 782
emission, 231
energy, 438
imaging, 509
region, 126, 130
δ, 32, 35, 41, 49, 439, 488, 619
absorption, 49, 52
emission, 41, 55
emission angle, 35
emission probability, 55
energy, 49
fast, 57, 67, 83
γ, 240, 422, 425, 612, 714
intensity standard, 240
interaction, 138
cosmic, 29, 255, 287, 331, 378, 562–564,
566, 567, 571, 611, 612, 614, 708
abundance, see Isotopic abundance
adiabatic energy change, 322
anomalous, 332, 336, 563
comp osition, 714
convection, 323
diffusion, 322
drift due to solar wind, 328, 329
energy spectrum, 717
extragalactic, 331, 711
extragalactic spectrum, 711
flux, 563
galactic, 300, 319, 331, 332, 336,
363, 562, 563, 576, 711
galactic spectrum, 709
high energy, 712
low energy, 709
mo dulation, 319, 331, 332
origin, 709
primary, 336, 342, 562, 563, 708,
711, 713, 714
propagation, 319, 710
proton, 567
proton flux, 566
secondary, 336, 342, 708
solar, 711
sp ectrum, 709
solar, 336
track, 488
Rayleigh
angular spread, 160
cross section, 755
differential cross section, 159
scattering, 157, 159, 442, 755
Reaction cross section, see Cross section,
reaction
Reactor, 29, 287, 296, 342, 345, 350, 355,
722
neutron, 377
physics, 29, 287
pulsed, 292
Triga, 348, 377, 378
sp ectrum, 349
Readout, 20
electronics, 639
Real diode equation, 386, 388
Recoil
atom, see Atom, recoil
direction, 347
energy, 153, 294, 347, 352, 353, 355,
362, 572, 576, 728, 730, 731
kinetic energy, 18, 19, 153
nucleus, see Nucleus, recoil
silicon, see Silicon, recoil
Recombination, 477, 478, 550, 586, 587
center, 370, 382, 383, 389, 452, 474, 555
concentration, 384, 548
in silicon, 383
columnar, 586, 587, 588
complete, 590
current, 381, 387, 388, 543, 548
effect, 380, 587
effective lifetime, 388
electron, 380
electron hole, 382, 452
germinate, 586, 588
in emitter-base region, 542
initial, 587
majoriry carrier, 381
minority carrier, 381
pro cess, 547
rate, 380, 388, 587
strong, 588
vacancy interstitial, 347
with impurities, 590
Rectification, 288
prop erty, 387
ratio, 391
reduced, 391
Rectifying device, 387
Reduced
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
Index 921
energy, see Energy, reduced
nuclear stopping power, see Nuclear,
stopping power, reduced
radius, see Radius, reduced
sup erheat, 725
Reflection
co efficient, 442
length, 442
Refractive index, 124–126, 128, 130, 131,
426, 429, 440, 654, 713
liquid, 125, 127
on web, 125, 184
solid, 125, 127
Relative
stopping power, 70
sunsp ot number, see Sunspot, relative
number
Relative atomic mass, see Atomic, weight
Relativistic
correction, 35
Coulomb wave function
Sommerfield Maue, 101
kinematics, 6
mass, see Mass, relativistic
particles multiplicity, 68
region
extreme, 101
rise, 46, 47, 49, 52, 619
exp erimental evidence, 51
units, 5
Relaxation time, 780
dielectric, 400
spin lattice, 774, 776
Rep etition time, 776
Rephasing, 776
Resistivity
for semiconductor, see Semiconductor,
resistivity
for silicon, see Semiconductor,
resistivity
Resolution time, 23
Resonance frequency, 776
Rest mass, see Mass, rest
Restricted
energy loss, see Energy loss, restricted
energy loss formula, see Energy loss,
restricted, formula
Reverse
bias, see Reverse, voltage
current, see Leakage current
damage constant, see Leakage
current, damage, constant
current-voltage characteristic, see I-V
characteristics, reverse
resistance, 391
voltage, 385, 387, 391–393, 397–399,
401–403, 458, 483, 484, 527
Revolution perio d, 37
RICH detector, 26, 434
Ring imaging
˘
Cerenkov detector, see
RICH detector
Rise time, 424, 447
Robinson’s analytical approximation, 348,
352
Ro om temperature, 288, 294, 295, 370,
375, 383, 385, 386, 388, 389, 394,
397–400, 406–409, 412, 413, 487, 529,
533, 534
Rossi approximation B, see
Approximation B
Rossi–Greisen equation, 122
RPP approximation, 573, 574, 576–580
Rutherford
differential cross section, 16–20, 223
non-p oint like target, 223
formula, 17
non-relativistic, 17
small angle approximation, 17
small angle relativistic
approximation, 17
scattering formula, 120
Rydb erg energy, see Energy, Rydberg
s invariant quantity, 12
SAA, 337, see South Atlantic anomaly
Sah–Noyce–Shockley theory, 397
Sah–Reddi model, 404
SAMPEX, 332, 563
radiation belt, see Radiation belt,
SAMPEX
Sampler
active, 283, 615, 616, 619, 621
dense and thick, 648
dense and thin, 648
gas, 648
hydrogeneous, 655
liquid argon, 620, 623, 625, 626,
643, 645, 684
low Z, 620
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922 Principles of Radiation Interaction in Matter and Detection
scintillator, 613, 616, 619, 620,
623, 625, 626, 643, 645
silicon, 283, 285, 616, 619, 620,
634, 645, 652, 653, 687
dense active, 642
passive, 285, 615, 616, 619–621, 641,
645
Al, 639, 645
configuration, 633–636, 638, 639
critical energy, 642, 643
Cu, 685
dominant, 641
Fe, 634, 645, 646, 652, 685
FePb, 634, 635
high Z, 620, 622, 623, 627
low Z, 626, 627, 639
medium Z, 620, 623
Pb, 619, 633, 634, 645, 646, 652,
653, 683
PbFe, 633, 635
thick, 638, 639
U, 645, 682, 687
W, 645
Sampling
calorimeter, see Calorimeter, sampling
fluctuation, 643
fraction, 681
frequency, 615, 616, 617, 618, 620,
628, 641, 642, 645, 652, 670
large, 622
inefficiency, 623
Satellite, 711
Saturation, 682, 684, 686
voltage, 586
Scanner, see Imager
Scattering, see Particle, scattering
amplitude, 251
angle, 15, 17, 260, 728
elastic, 728
multiple, 434
Schr¨odinger equation, 248
Schwabe solar cycle, see Solar, cycle
Schwabe–Wolf cycle, see Solar, cycle
Scintillating
detector, see Scintillator
fib er, 440, 667, 669
core, 440
core material, 440
medium, see Scintillator, material
Scintillation
efficiency, 420–422, 424, 656
light, 421, 424, 435, 436, 441, 713
detection, 442
pulse, 420, 423
sp ectrum, 420
yield, 420
Scintillator, 23, 419, 447, 448, 470, 654,
655, 757
decay time, 293
constant, 447
hygroscopic, 426
inorganic, 24, 419, 423, 425, 655
crystal, 426
prop erty, 423
layer, 436
light, see Scintillation, light
liquid, 656
material, 419, 447
organic, 23, 419,
420
, 421–423, 655
liquid, 422
plastic, 23, 126, 436, 442, 448
plate, 437
radiation hard, 293
resp onse, 421
tile, 437
Screened Coulomb collision, see Coulomb
collision, screened
Screening, 47, 98, 164
complete, 96, 97, 99, 100, 101, 103,
104, 114, 121, 166, 172
differential pair production
probability, 168
effect, 96, 102
function, 95, 97
length, 79, 81
universal, 80, 81, 357
no, 96, 98, 99–101, 103
nuclear field, 77, 96, 120
nuclear potential, 20
of nuclear charge, see Screening,
nuclear field
parameter, 96, 97
for pair production, see Pair
pro duction, screening parameter
radius, 79
Sea level, 565
SEB, 560, 561, 571, 577
Second moment, 61
Secondary
angular distribution, 255, 258, 265
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
Index 923
charged multiplicity, 255
defect, see Defect, secondary
electron, 369, 379, 487, 488
energetic, 487
ionization, see Ionization, secondary
multiplicity, 257, 260, 275
on emulsion nuclei, 255
on nucleus, 256
on proton, 255
ratio, 255, 256, 264
shower particle, 255
particle, 613
slow, 260
SEE, 30, 540, 558, 560, 561, 568–572,
574, 577, 578, 580
classificatin, 560
cross section, 573, 577
heavy ion, 581
nucleon, 581
proton, 581, 582
generation mechanism, 569
immunity, 574, 579
mitigation, 584
radiation environment
accelerator, 568
atmospheric, 563
radioactive source, 565
spatial, 562
terrestrial, 564
rate, 579, 581, 582
sensitivity, 573, 577
SEGR, 561, 571
Segr`e chart, 228
SEL, 560, 561, 577
Selection rule, 226, 253
angular momentum, 240
parity, 240
Self annealing, 386, 554
pro cess, 373
Semicoherent interaction on nucleus, see
Interaction, on nucleus, semicoherent
Semiconductor, 452
conductivity, 288, 374, 405, 407, 409,
452
initial, 415
type, 411
type change, 374, 412
conductivity-mobility
electron, 407
hole, 407
detector, 20, 24, 767
capacitance, 460
device, 288, 292, 299, 380, 381, 387,
558, 569, 573, 579
memory, 560
dio de, 387, 535
extrinsic, 288, 401, 405, 408, 409
low magnetic field, 407
low temperature, 394
n-type, 394, 395
non-irradiated, 393
small compensation, 395
heavy, 761, 769
material, 452, 759, 760
n-type, 452
p-type, 452
resistivity, 370, 372, 408, 409, 412, 416,
417, 458, 460, 481, 524, 525,
528, 529, 532
after irradiation, 295, 409–411
base, 557
dep endence on temperature, 409
high, 296, 409, 411, 413, 459, 555
initial, 297, 535
intrinsic, 411
low, 296, 297, 409, 411, 413, 459,
524
low temperature, 408, 410, 411
non irradiated, 413
resistor, 387
silicon, 287, 452
Sensitivity factor, 566
SEP, see Solar, energetic particle
SEU, 560, 561, 568, 571, 572, 574, 576,
577, 582, 583
cross section, 572
rate, 579, 580, 584
neutron, 581
proton, 581, 582
sensitive area, 578
Shallow
dopant, 295
impurity concentration, 402
level, 382
Shaping time, 477, 481, 761, 766
Shared energy, see Partition energy
Shell
correction term, 33, 34, 44, 45, 47, 50,
70, 85
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
924 Principles of Radiation Interaction in Matter and Detection
number, see Quantum, number,
principal
Sho ckley–Read–Hall
generation-recombination term, 466
Shower
generation process, 136, 614, 628, 631
generator, 27
combined medium and high Z
absorb er, 637
medium, 641
particle, 255, 257, 262, 264
multiplicity, see Secondary,
multiplicity, shower particle
propagation, 614
in complex absorber, see
Electromagnetic, shower,
propagation in complex
absorb er
Shulek expression, 63
SI unit, 193
Si–SiO
2
interface, 380
SICAPO collaboration, 612, 635, 686, 691
Signal, 451, 469, 473, 482, 489, 522
ac, 398
acoustic, 736
amplitude, 737
coincidence, 470
electromagnetic, 613, 671
equalization in calorimetry, 628, 679
for ideal hadron, 671
for real hadron, 671
hadronic, 613, 671, 682
induced, 524
input, 470
output, 470
shap e, 737
shap ed, 392
short, 570
to noise ratio, 295, 471, 771
SIJD model, see Small signal, ac
imp edance, of a junction diode model
Silicon
atoms per cm
3
, see Atom, number per
cm
3
, in silicon
backplane, 486
CZ
n-type, 411
device, 30, 288, 289, 293, 296, 346, 347,
369, 377, 382, 386, 451
dielectric constant, see Dielectric,
constant, silicon
dio de, 392, 486, 522
double sided detector, 25
electric permittivity, see Electric,
p ermittivity, silicon
FZ
n-type, 371, 411
substrate, 371–373, 375
weakly doped, 395
imaging calorimeter, 759, 760
intrinsic, 389, 391, 409
non-irradiated, 407
lattice, 351, 456, 550
MCZ
n-type, 371
substrate, 371–373, 375
MediPix device, 761, 764, 780
X-ray medical imaging, 780
MediPix1 device, 493
MediPix2 device, 493, 494, 496, 498,
499, 501, 783
charge sharing, 499
medium, 357, 376, 377
intrinsic, 389
microstrip detector, 293, 451, 486, 489,
522
spatial resolution, 487
oxygenated, 294, 296, 297
pad detector, 293, 767
photo diode, 25
pixel detector, 23, 25, 293, 491, 492,
522, 767
recoil, 347–350, 352–358, 360, 361, 376,
552, 583
resistivity, 458, 459
sampler, see Sampler, active, silicon
strip detector, 23, 25
TimePix device, 494
Silicon detector, 29, 41, 51, 58, 67, 91,
282, 289, 293–295, 346, 347, 372, 375,
385, 386, 388, 390, 391, 393, 396, 416,
417, 451, 458, 461, 469–471, 475, 476,
478, 481, 487, 488, 522, 535, 536, 555,
629, 687, 766
capacitance, 459, 477
electrical characteristics, 294
FZ, 371, 373, 386, 392, 393
n-type, 395
irradiated, 451, 475, 522
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
Index 925
MCZ, 371, 373, 393
MESA, see MESA, silicon detector
non-irradiated, 295, 385, 451
n-type, 395
op eration, 294
oxygenated, 296
planar, 465, 469, 477–479, 485, 489,
531, 766
reverse-biased, 386
SP, see SP, silicon detector
surface barrier, 526, 527
Simplified expression for spallation
pro duct emission, 267
Simulation code, 202, 275, 276, 620, 623,
626, 640, 648, 680, 686, 700, 701
EGS4, 213, 216, 628, 630, 636, 696
FLUKA, 695
GEANT, 353, 573, 695
SRIM, 81, 353, 529
2003, 412
technique, 30
TRIM, 81, 552, 579, 583
Single
event
burnout, see SEB
effect, see SEE
gate rupture, see SEGR
latchup, see SEL
upset, see SEU
foil yield, 135
particle density function, 251
photon emission computed tomography,
see SPECT
Single-carrier space-charge-limited
current, 397
Skew ray, 441
Slow control, 23
SM detector, see MESA, detector, planar
Small signal
ac impedance, 398
of a junction diode model, 398–400
mo del, 543
Sn filter, 760
Snell law, 440
Soft energy deposition, 631
SOHO, 301
Solar
activity, 299, 300, 335, 337, 562, 709,
711
level, 306
cavity, see Heliosphere
cell, see Photovoltaic cell
chromosphere, 300, 332
corona, 300, 301, 311, 331, 332
comp osition, 300
expanding model, 301
expansion, 301
static model, 301
sup ersonic expansion, 300
coronal hole, 311, 313
cycle, 306, 311, 336, 342
energetic particle, 297, 332, 336
equatorial plane, 310
flare, 300, 331, 562, 563
inner corona, 313
latitude, 306, 311, 313
magnetic
cycle, see Hale cycle
equator, 311
field, 310, 313
magnetograph, 307
mo dulation, 331, 332, 337, 709–711
photosphere, 300, 308, 313
thickness, 308
p olar hole, 311, 313
ray, see Ray, solar
rotation axis, see Sun, rotation, axis
source, 297
storm, 563
sunsp ot, 331
system, 562
wind, 299, 300, 302, 306, 311, 313, 315,
331, 332, 562–564
dynamic pressure, 314, 318
high speed, 311
kinetic models, 303
magnetic pressure, 314, 318
non-relativistic plasma, 306, 308
particle, 336
ram pressure, see Solar, wind,
dynamic pressure
sp eed at 1 AU, 300
sup ersonic speed, 300
termination shock, 332
thermal pressure, 314, 318
traveling time, 316
velocity, 331
wind plasma, see Solar, wind
Solute, 422, 656
Solvent, 656
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
926 Principles of Radiation Interaction in Matter and Detection
Sonic point, 300
Sorenssen expression, 174
Sound speed, 300, 302, 314
Source
detector system, 766
distribution, 761, 762
image, 758
lo cation, 762
South Atlantic anomaly, 337
SP
detector, 483–486, 523–526, 529–531
energy resolution, 485
silicon detector, 522
technology, 451
Space
physics, 29
charge, 295, 459, 460
limited, 397
negative, 295, 296, 460, 529, 536
p ositive, 459
region, 375, 402, 418, 454, 459
physics, 287
qualification, 299
pro cedure, 369
radiation, see Radiation, environment,
space
radiation environment, see Radiation,
environment, space
Space-time coordinate, 471
Spacecraft, 297, 562
Spallation, 27, 275, 276, 558, 680
cross section, 267
maximum yield, 269
nucleon, 183, 278
pro cess, 262, 267, 269
pro duct, 263, 267, 268
proton, 278
Spatial resolution, 442, 666
Sp ecific energy, see Energy, specific
Sp ecific ionization, see Ionization, specific
SPECT, 28, 755, 757, 758, 759, 761
Sp ectral
emission maximum, 425
fluence of neutrons, see Neutron,
sp ectral fluence
index, see Differential, spectral index
sensitivity, 420, 426, 657
Sp eed of light, 7, 124, 126
medium, 124
Spherical mirror, 435
Spin, 4, 44, 737
quantum number, see Spin
Spin-parity, 183, 239
Spiral angle, 309, 327
in ecliptic plane, 309
Sp ontaneous nucleation, 736
SRAM, 560, 564, 569, 572, 575
cell, 564
Stable damage constant, 529
Standard
mo del, 6, 612
particle, 737
planar technology, see SP, technology
Temperature and Pressure, see STP
Steady-state modulation condition, 323
Stellar wind, 302
Sto chastic noise, see Noise, electronic
Sto chastic quantity, 196
Stopping
number, 33, 39, 43, 44
p ower, 33, 42, 46, 49, 70, 72, 216, 421,
633, 772
by collision for electron, see
Collision stopping power, for
electron
by radiation for electron, see
Radiation stopping power, for
electron
electronic, see Electronic stopping
p ower
for non relativistic particle, 70
mass, see Mass stopping power
nuclear, see Nuclear stopping
p ower
relative, see Relative stopping
p ower
total for electron, see Total
stopping power, for electron
universal, see Universal stopping
p ower
STP, 66, 72, 84
Straggling parameter, 73
Streaming term, see Radial current
density term
Strip, 489
b ody capacitance per unit length, 490
depletion voltage, 490
dimension, 490
intermediate, 489
pitch, 489
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
Index 927
readout, 489
width, 490
Styrene, 130
Sub-detector, 20–22, 611, 613
Sub-micron technology, 287, 560, 569, 570
Sub-shower, see AS, electromagnetic,
sub-shower
Sub-threshold slope, 380, 540
Subsolar
distance, 318
p oint, 318
Sun, 709
effective rotation period, 307
magnetic
dip ole, 313
dip ole field, 307
field, 307
p olarty, 308
p olarty reversed, 308
rotation, 306
axis, 307, 310, 313
p eriod, 306
sidereal differential rotation, 306, 313
Sunsp ot, 306
activity, 306
cycle, see Solar, cycle
group, 306
relative number, 306
Sup erheated
droplet, 732
detector, 28, 721, 732
liquid droplet, 721
freon, 28
Sup ersymmetric weakly interacting
massive particle, 708
Sup ersymmetry, 737
Surface
current, 523
damage, 550
effect, 387, 550
tension, 724
top ography, 417
Surgery, 761
Susceptance, 400
Swift ion, 74
Switching voltage, 397
Synchrotron radiation, 95
Systematic error, 600
t invariant quantity, 12, 18
Target surface thickness, 251
Tau particle, 6
TDC, 448
Tellurium vapor, 760
Temperature
b oiling, 724, 727
critical, 397, 398, 724, 736
threshold, 727
Terrestrial radiation environment, see
Radiation environment, terrestrial
Tetra momentum transfer (square of), see
t invariant quantity
Tevatron collider, 568
Thermal generation, 474
Thermalization length, 587
Thermally Stimulated Current, 371
sp ectroscopy, 372
technique, 371
Thick
absorb er, see Absorber, thick
target, 112, 113
Thin absorber, see Absorber, thin
Thomas–Fermi
mo del, 78, 79, 81, 96, 348
radius, 120
Thomson
cross section, 141, 155, 161
p er atom, 162
differential cross section, 150, 159, 162
effect, 138
formula, 162
nuclear scattering, 179
scattering, 95, 161, 162, 179
Threshold
˘
Cerenkov detector, see Cherenkov,
detector, threshold
detector, 721
Threshold-voltage shift, 380
TID, 293, 299, 380, 381, 550
Tilt angle, 311
Time
constant, 469
of flight, 26, 448, 449, 779
projection chamb er, 24
resolution, 422
Tissue, 758, 770, 771
Tl, 424
ToF, see Time of flight
Toluene, 23, 422, 656
Tomographic device, 770
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
928 Principles of Radiation Interaction in Matter and Detection
Topology, 260, 263
Total
cross section, see Cross section, total
dose, see TID
energy, see Energy, total
ionization, see Ionization, total
ionizing dose, see TID
radiation cross section, see Radiation,
total cross section
range, see Range, total
Total stopping power
for electron
in Al, 107
in Fe, 109
in Pb, 111
in Si, 108
in W, 110
in water, 106
Townsend first coefficient, 604
Track length, 200, 617
α particle, 594
total, 616
Tracker, see Tracking detector
Tracking detector, 21, 293, 522
Transfer resistor, see Transistor
Transferred energy, see Energy,
transferred
Transistor, 288
annealing effect, 556
base, 541, 542, 546, 547, 558
current, 542, 546–548, 555
doping profile, 544, 548, 549, 551
exp onentially graded, 547
graded, 544, 545, 548, 549, 551
homogeneous, 548
lead, 555
narrow, 543, 545
region, 542, 549
spreading resistance, 30, 540, 555,
558
width, 551
bip olar, 30, 299, 540, 555
current gain, see Current, gain,
bip olar transistor
irradiated, 380
lateral, 550, 553, 554
n-p-n, 541, 550, 553, 554
p-n-p, 541, 553, 554
vertical, 550, 553, 554
collector, 541, 542
current, 542, 545, 547–549,
552–555
common-emitter configuration
active mode, 542, 545
emitter, 541
gain
common base, see Current, gain,
common base
common emitter, see Current,
gain, common emitter
degradation, see Current, gain
degradation
MOS, see MOS, transistor
p ower, 571
Transit time, 25
electron, 447, 760
hole, 760
minority carrier, 545, 549
Transition
effect, 623, 626, 634
forbidden, 226, 240
probability, 240
radiation, see Radiation, transition
detector, 21, 26, 437
emission, see Radiation, emission,
transition
energy range, 438
yield, 437
Transmission function, 336, 341, 342
Transport
equation, 54, 56
Landau’s solution, 56
Landau’s solution for electron, 90
Vavilov’s solution, 57
equation solution, 56, 60
mechanism in irradiated
semiconductors, 416
of ion in matter, 728
Transverse shower size, 627
Trap, 294, 371, 372, 380, 397, 403, 551
concentration, 371, 375, 397
energy level, 397
filling , 371
state, 466
Trapped
electron, see Electron, trapped
hole, see Hole, trapped
particle, 29, 287, 335, 337
electron in magnetosphere, 337,
363
January 9, 2009 10:21 World Scientific Book - 9.75in x 6.5in ws-bo ok975x65˙n˙2nd˙Ed
Index 929
p ositron in magnetosphere, 337
proton in magnetosphere, 337, 363
Trapping, 402, 531, 564
center, 404, 475
effect, 295, 478
of charge, see Charge trapping
temp orary, 382
time, 466
TRD, see Transition radiation, detector
Trigger signal, 21, 22
Triode, 658
Tritium, 511, 517
Triton, 512, 514
TSC, see Thermally Stimulated Current
Tsyganenko–Stern model, 318
Tumor, 769
Tunnel effect, 232
Tunneling
defect-assisted, 382
pro cess, 382
Two phase parton model, 257
Two photon separation, 665, 666
U, see Sampler, passive, U
u, see Atomic, unified mass, unit
u invariant quantity, 12
ULSI, 297
Ultraviolet light, see Radiation, ultraviolet
Ulysses, 300, 301, 311, 313
Unified atomic mass unit, see Atomic,
mass unit
Universal
interatomic potential, see Interatomic,
Coulomb potential, universal
reduced energy, see Energy, reduced,
universal
screening function, see Interatomic,
screening function, universal
screening length, see Screening, length,
universal
stopping power, 77, 80
UV light, see Radiation, ultraviolet
V
2
-center, see Divacancy
V
2
O-center, see Divacancy-oxygen
Vacancy, 194, 288, 293–296, 346, 370, 415,
478
accumulation, 416
deep center, 373
migration, 370
silicon, 370
Vacancy-dopant, 370, 372, 376, 415
Vacancy-oxygen, 370, 371, 373
Vacancy-phosporus, 372
Vacancy-vacancy, see Divacancy
Vacuum, 480, 526
chamber, 289
condition, 289
Valence band, 424, 451, 452
edge, 371
Van Allen radiation belt, see Radiation
b elt, Van Allen
Van der Graaff tandem, 770
Vavilov distribution, 58, 67, 487
Vavilov–Ukhin model, 392
Vector
b oson, 612
dominance model, 183
meson, 183
Velocity, 7
Very large scale integration, see VLSI
Vessel, 600
Viscosity, 721
Visible
light, see Radiation, visible
wavelength, see Radiation, visible
Visible energy, 206, 280, 281, 285, 616,
617, 620, 622, 629, 634, 635, 642, 671,
675
dead area loss, 652, 653
electromagnetic, 636, 638, 691
reduction, 636, 637, 692
exp ected, 620
fluctuation, 640, 646, 696
for electromagnetic shower, 671
for hadronic shower, 672
energy dependence, 672
for ideal hadron shower, 671
hadronic, 687, 688, 696
lateral loss, 651, 652, 707
longitudinal loss, 650–653, 670, 707
loss, 646, 650, 652, 653, 705
mosaic loss, 651
neutron contribution, 686, 701
of electromagnetic shower, 672
reduction, 629, 630, 687, 689
by filtering effect, 692
by local hardening effect, 690
sampled, 640
VLSI, 29, 30, 287, 289, 297, 541, 561