26 Diffraction
is, however, found to be more complicated than that necessary for
viewing through a microscope, and it is the major subject of this
book.
X rays are scattered by the electrons in an atom,
**
neutrons are scat-
**
When X rays hit an atom, its electrons
are set into oscillation about their nuclei
as a result of perturbation by the rapidly
oscillating electric field of the X rays. The
frequency of this oscillation is equal to
that of the incident X rays. The oscillat-
ing dipole so formed acts, in accord with
electromagnetic theory, as a source of radi-
ation with the same frequency as that of
the incident beam. This is referred to as
“elastic scattering” and is the type of scat-
tering discussed in this book. When there
is energy loss, resulting in a wavelength
change on scattering, the phenomenon is
described as “inelastic scattering.” This
effect is generally ignored by crystallogra-
phers interested in structure and will not
be discussed in this book.
tered by the nuclei and also, by virtue of their spin, by any unpaired
electrons in the atom, and electrons are scattered by the electric field of
the atom, which is of course a consequence of the combined effects of
both its nuclear charge and its extranuclear electrons. However, neither
X rays nor neutrons of the required wavelengths can be focused by
any known lens system, and high-energy electrons cannot (at least
at present) be focused sufficiently well to show individually resolved
atoms. Thus, the formation of an atomic-resolution image of the object
under scrutiny, which is the self-evident aim of any method of crystal
structure determination—and is a process that we take for granted
when we use our eyes or any kind of microscope—is not directly possi-
ble when X rays, neutrons, or high-energy electrons are used as a probe.
Unfortunately, the atoms that we wish to see are too small to be seen
without these short-wavelength radiation sources.
When, however, X rays or neutrons are diffracted by crystalline mate-
rials, a measurable pattern of diffracted beams is obtained and these
results can be analyzed to give a three-dimensional map of the atomic
arrangement within the crystal and hence the molecular structures
involved. In order for the reader to understand the process involved
it is necessary to consider diffraction in general, and easier to start with
the effects of visible light on masks that are readily visible. Scattering
of light by slits will serve as a preliminary model for the scattering
of X rays by atoms. When the dimensions of both the slits and the
wavelength of visible light are reduced by several orders of magnitude,
analogous results can be obtained for atoms and X rays.
Diffraction of visible light by single slits
The pattern of radiation scattered by any object is called the diffraction
pattern of that object. Diffraction occurs whenever the wavefront of a
light beam is obstructed in some way. We are accustomed to think of
light as traveling in straight lines and thus casting sharply defined shad-
ows, but that is only because the dimensions of the objects normally
illuminated in our experience are much larger than the wavelength of
visible light. When light from a point source passes through a narrow
slit or a very fine pinhole, the light is found to spread into the region
that normally would be expected to be in shadow. In explanation of
this effect, each point on the wavefront within the slit or pinhole is
considered to act as a secondary source, radiating in all directions.
The secondary wavelets so generated interfere with each other, either
reinforcing or partially destroying each other, as originally described
by Francesco Maria Grimaldi, Christiaan Huygens, Thomas Young, and
Augustin Jean Fresnel (Grimaldi, 1665; Huygens, 1690; Young, 1807;