X-rays, characteristic of each element, are emitted. The SEM-EDX is
a valuable tool for the microscopist because, with careful prepara-
tion, individual grains in a thin section or polished grain mount
can be analyzed for chemical content. SEM-EDX analysis provides,
(1) elemental data for unknown phases, (2) identity of trace
elements in minerals, (e.g., copper in goethite, silver in galena and
silver in gold, substituent elements in sphalerite or tennantite),
(3) elemental mapping, (4) identification of small inclusions, and
(5) high magnification.
3.1.2.6 Automated image analysis
Several computer-controlled, automated techniques for quantitative
image analysis have been developed. The use in this handbook of
QEM-SEM (Quantitative Evaluation of Minerals with Scanning
Electron Microscope) as an example does not imply or constitute a
recommendation of any one system over another.
QEM-SEM
1
is a fully-automated, powerful image analyzer which
can determine quantitatively the size distribution and association of
minerals or phases in complex mixtures. The system, developed by
CSIRO, Australia, uses X-ray and electron signals generated in a
scanning electron microscope to produce lineal or two-dimensional
representations of the mineral assemblages. In the simplest mode of
operation, point identification provides an automated version of
conventional volume fraction determination (point counting). This
technique provides both the degree of liberation of specified minerals
and the intergrowth distribution for unliberated minerals.
QEM-SEM comprises a computer-controlled scanning electron
microscope fitted with a multi-element, (up to 4) energy dispersive
X-ray detector and a back-scattered electron detector. Samples are
prepared in the form of polished sections. The electron beam is
positioned automatically at regularly-spaced points in a field of
observation. For particles, the line spacing is made the same as
point spacing along lines, typically 3 µm, in order to obtain a full 2-D
image of each particle. For drill core samples, the line spacing is
much greater (up to 200 µm). For determination of volume fractions
alone, a widely spaced (40 to 200 µm) grid of points is used. At each
sampled point, the signal generated by the back-scattered electrons
is used to determine the average atomic number of the small area of
material irradiated by the beam and thus identify the mineral phase.
More typically, the beam is left in position for 20-30 ms until suffi-
cient X-rays have been collected to allow computer identification of
the particular mineral present. The procedure is repeated for succes-
sive fields of observation in order to generate mineral maps. The
computer software then isolates the individual mineral particles as
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