Spieler H. Semiconductor detector systems

Springer-Verlag Berlin, 2005, 401 pages Time-correlated single photon counting (TCSPC) is a remarkable technique for recording low-level light signals with extremely high precision and picosecond-time resolution. TCSPC has developed from an intrinsically time-consuming and one-dimensional technique into a fast, multi-dimensional technique to record light signals. So this reference and text describes how advanced TCSPC techniques work and demons...

CRC Press, 2003, 310p. Introduction Background History of Microscopy Scanning Probe Microscopes (SPMs) Scanning Tunneling Microscope (STM) Electron Tunneling Atomic Force Microscope (AFM) Modes of Operation of AFM Simultaneous AFM and Scanning Near-Field Fluorescence (SNOM and SNOM–AFM) Friction Force Microscopy (FFM) STM and AFM Studies under Fluids Sample Preparation Procedures for STM and AFM Calibration and Image Analysis of STM and AFM...

Academic Press, 2001, 186p. Fundamental Concepts in Ultrahigh Vacuum, Surface Preparation, and Electron Spectroscopy Auger Electron Spectroscopy Photoelectron Spectroscopy Inelastic Scattering of Electrons and Ions Low-Energy Electron Diffraction Scanning Probe Microscopy Interfacial Segregation Metal–Semiconductor Interfaces Gas–Surface Interactions

North-Holland, Amsterdam, 1988, 399 p., (анг. яз. ) The advent of germanium and silicon detectors in the 1960's has revolutionized gamma- and X-ray spectrometry. The excellent energy resolution of these semiconductor detectors has been the basis for rapid and sometimes step-like progress. Today there is scarcely a field in natural science to which spectrometry with semiconductor detectors has not gained entry. The authors estimate that worldwide...

BIOS Scientific Publishers Limited, 2003, 151p. History Principles The energy-dispersive X-ray detector Spectral processing Energy-dispersive X-ray microanalysis in the scanning electron microscope X-ray microanalysis in the transmission electron microscope X-ray mapping Energy-dispersive X-ray analysis compared with other techniques Bibliography Index

Wiley, 3-d edition, 2000, 816 p. Классический учебник по курсу "Регистрация и измерение ионизирующего излучения" в обновленном и расширенном третьем издании предоставит читателю четкое представление о методах и приборах, используемые для обнаружения и измерения характеристик различных видов проникающей радиации. Книга представляет углубленное освещение основных принципов обнаружения радиации, а также в полной мере иллюстрирует применение совреме...

Elsevier Science, 1996, Pages: 400 The monograph is devoted to scientific basis of semiconductor chemical sensors technique. Its attention is focused at the usage of semiconductor sensors in the precision physico-chemical studies. The monograph expounds physical and chemical basis underlying the semiconductor sensor method, discusses the mechanism of processes occurring under interaction of gas with semiconductor adsorbent surface, leading to ch...

John Wiley & Sons, 2006, 368p. Introduction The Auger Process Instrumentation The Spatial Resolution Forming an Auger Image Image Processing and Interpretation Quanti?cation of Auger Images Applications: Materials Science Applications: Semiconductor Manufacturing Concluding Remarks

IAEA, Proceedings of a Technical Meeting Vienna, 20–23 November 2007 All nuclear spectrometry systems contain electronic circuits and devices, commonly referred to as front-end electronics, which accept and process the electrical signals produced by radiation detectors. This front-end electronics are composed of a chain of signal processing subsystems that filter, amplify, shape, and digitise these electrical signals to finally produce digitally...

2nd ed. - Tayllor&Francis, 1995, -614p. (Анг. язык) Материалы в этой книге, которая является результатом 10-летнего опыта, накопленного автором в преподавании курсов, связанных с радиационными измерениями в университете Миссури-Ролла (США), предназначены для введения учащегося в предмет экспериментальные методы ядерной физики. Книга включает в себя не только то, что новичок должен выучить, но и некоторые справочные материалы, которые потребую...