5.5.3 Lithium drifted and high-purity germanium detectors
The ®rst procedure which produced germanium crystals of acceptable purity
and size for g ray detection was to drift ionised lithium atoms into the crystal.
They neutralise the impurity atoms (mainly boron), so preventing them from
accepting or donating electrons. The method is complex but keeps leakage
currents suf®ciently low to permit the manufacture of relatively large-volume
high-resolution detectors known as lithium drifted germanium detectors,
Ge(Li). These detectors, however, suffer from two serious shortcomings.
First, the drifting process leaves a dead layer at the surface blocking all
photons with energies below 30 or even 40 keV and signi®cantly attenuating
higher energy photons up to about 100 keV. Second, the crystals have to be
stored as well as used at liquid nitrogen temperature to prevent the lithium
atoms from drifting into positions where they lose their effectiveness.
Eventually germanium crystals could be produced with only about 10
10
effective impurity atoms per cubic centimetre or even less (Debertin and
Helmer, 1988, Section 2.1). It then became possible to produce intrinsic, p-
type, high-purity germanium (HPGe) crystals (Figure 5.6(a)). They have to
be used at liquid nitrogen temperature but can be stored at room temperature
without losing their effectiveness. High-purity germanium detectors are
replacing lithium drifted detectors. The latter are in many respects satisfac-
tory, but to keep them continuously at 7196 8C is costly and troublesome.
The effect of the dead layer on the surface of Ge(Li) detectors can be seen
when comparing the spectra shown in Figures 3.9 and 3.14. In Figure 3.9(b), a
spectrum of
133
Ba, the dead layer absorbed the X rays which are prominent in
the
133
Ba spectrum due to a NaI(Tl) detector shown in Figure 3.9(c). In Figure
3.14(a) (a europium-152 spectrum), little is left of the around 40 keV KX rays
which are emitted with more than twice the intensity of the 122 keV g rays.
Figures 3.14(b) and (c) show the improvements when the cobalt-57
spectrum is obtained with a HPGe detector. The latter displays the 14 keV g
rays, the about 6.5 keV KX rays emitted by the daughter (iron), and the
peaks due to summing of iron KX rays and g rays. The majority of HPGe
detectors are either planar shaped (Figure 5.6(a)), or co-axial, a cylinder
drifted radially from a 10 to 15 mm diameter concentric bore. Detector
windows can be made thin enough to clearly detect 3 keV photons.
5.5.4 Further comments on silicon detectors
Silicon detectors are produced as either ion implanted or surface barrier or
lithium drifted detectors. Ion implanted silicon detectors have low leakage
5.5 Semiconductor detectors: an introduction 143