Study on Substitution Effect of Bi
4
Ti
3
O
12
Ferroelectric Thin Films
137
Park, B. H., Kang, B. S., Bu, S. D., Noh, T. W.; Lee, J. & Jo, W. (1999). Lanthanum-substituted
bismuth titanate for use in non-volatile memories.
Nature, Vol. 401, pp. 682-684,
ISSN 0028-0836
Park, C. H. & Chadi D. J. (1998). Microscopic study of oxygen-vacancy defects in
ferroelectric perovskites.
Phys. Rev. B, Vol. 57, R13961, ISSN 1098-0121
Paz De Araujo, C. A., Cuchiaro, J. D., McMillan, L. D., Scott, M. C. & Scott, J. F. (1995).
Fatigue-free ferroelectric capacitors with platinum electrodes.
Nature, Vol. 374, pp.
627-629, ISSN 0028-0836
Ramesh, R.; Luther, K.; Wilkens, B.; Hart, D. L.; Wang, E. & Trascon, J. M. (1990). Epitaxial
growth of ferroelectric bismuth titanate thin films by pulsed laser deposition.
Appl.
Phys. Lett.,
Vol.57, No. 15, pp.1505-1507, ISSN 0003-6951
Scott, J. F. & Paz De Araujo, C. A. (1989). Ferroelectric memories.
Science, Vol. 246, No. 4936,
pp. 1400-1405, ISSN 0036-8075
Shulman, H. S.; Damjanovic, D. & Setter, N. (2000). Niobium doping and dielectric
anomalies in bismuth titanate.
J. Am. Ceram. Soc., Vol. 83, No. 3, pp. 528-532, ISSN
1551-2916
Simoes, A. Z.; Pianno, R. F. C.; Ries, A.; Varela, J. A. & Longo, E. (2006). a-b axis-oriented
lanthanum doped Bi
4
Ti
3
O
12
thin films grown on a TiO
2
buffer layer. J. Appl. Phys.,
Vol. 100, No. 8, 084106, ISSN 0021-8979
Sun, H.; Zhu, J., Fang, H. & Chen, X. B. (2006). Large remnant polarization and excellent
fatigue property of vanadium-doped SrBi
4
Ti
4
O
15
thin films. J. Appl. Phys., Vol. 100,
No. 7, 074102, ISSN 0021-8979
Takenaka, T. & Sanaka, K. (1980). Grain orientation and electrical properties of hot-forged
Bi
4
Ti
3
O
12
ceramics. Jpn. J. Appl. Phys., Vol. 19, pp. 31-39, ISSN 0021-4922
Uchida, H.; Yoshikawa, H.; Okada, I.; Matsuda, H.; Lijima, T.; Watanabe, T.; Kojima, T. &
Funakubo, H. (2002). Approach for enhanced polarization of polycrystalline
bismuth titanate films by Nd
3+
/V
5+
cosubstitution. Appl. Phys. Lett., Vol. 81, No.12,
pp. 2229-2231, ISSN 0003-6951
Wang, X. S. & Ishiwara, H. (2003). Polarization enhancement and coercive field reduction in
W- and Mo-doped Bi
3.35
La
0.75
Ti
3
O
12
thin films. Appl. Phys. Lett., Vol. 82, No. 15, pp.
2479-2481, ISSN 0003-6951
Watanabe, T.; Funakubo, H.; Osada, M.; Uchida, H. & Okada, I. (2005). The effects
of neodymium content and site occupancy on spontaneous polarization of
epitaxial (Bi
4−x
Nd
x
)Ti
3
O
12
films. J. Appl. Phys., Vol. 98, No. 2, 024110, ISSN
0021-8979
Wu, D.; Li, A. D.; Zhu, T.; Li, Z. F.; Liu, Z. G. & Ming, N. B. (2001). Processing- and
composition-dependent characteristics of chemical solution deposited Bi
4-x
La
x
Ti
3
O
12
thin films.
J. Mater. Res., Vol. 16, No. 5, pp. 1325-1332, ISSN 0884-2914
Yau, C. Y.; Palan, R.; Tran, K. & Buchanan, R. C. (2005). Mechanism of polarization
enhancement in La-doped Bi
4
T
3
O
12
films. Appl. Phys. Lett., Vol. 86, No. 3, 032907,
ISSN 0003-6951
Yuan, G. L. & Or, S. W. (2006). Enhanced piezoelectric and pyroelectric effects in single-
phase multiferroic Bi
1−x
Nd
x
FeO
3
(x = 0–0.15) ceramics. Appl. Phys. Lett., Vol. 88, No.
6, 062905, ISSN 0003-6951