228 Chapter 4
4.10 Physical Properties of Thin Films
The Handbook of Thin Film Technology [7] contains an extensive section on the electrical and
electronic conduction, piezoelectric and piezoresistive, dielectric and ferromagnetic properties
of thin films. The reader is referred to it.
4.11 Mechanical and Related Properties
4.11.1 Mechanical Properties
4.11.1.1 Mechanical Property Determination
A number of testing techniques have been used to determine the strength properties of thin
films. They include the high-speed rotor test [222], the bulge test [223–227], microtensile
testing machines of the soft [228–231] and the hard categories [223–227], and even fixtures
which can be operated in the electron microscope [232, 233]. Hoffman [234, 235] reviewed
the test techniques and the reader could do no better than to read Hoffman’s articles or the
original references. The basic handling problem encountered with the preparation and
mechanical property testing of thin film specimens is much less severe with thick films for
which many of the standard test specimens, machines, and techniques can be readily used.
Therefore, the spectrum of mechanical properties measured on thick films is much broader
than with thin films.
4.11.1.2 Tensile Properties Of Thin Films
The tensile properties of thin films have been reviewed [234–237]. As Hoffman concludes
[234], the data reported are not very consistent even on the same material. The reader is
advised to consult the references for details. In general, the observed strength of
vapor-deposited metal films consists of three parts:
σ
OBS
= σ
Bulk
+ σ
Imperfections
+ σ
Thickness
(4.11)
where σ
OBS
is the inherent strength level of bulk polycrystalline material in the annealed state,
σ
Imperfections
is the contribution due to point defects in excess of those normally found in the
bulk annealed state, and σ
Thickness
is the contribution arising from the smallest dimension of the
film and its limiting effect on grain size such that dislocation multiplication and migration are
impeded [230].
Table 4.10 gives the strength properties of thin films of some metals and compares them to
bulk values [235]. In many cases, the strengths are about 200 times those of annealed bulk
samples and three to ten times those of hard drawn samples. The tensile strength values are
given numerically as well as by fractions of the shear modulus. The ductility of the
high-strength films is very limited, which is similar to the behavior of high-strength fibers or