Analog Devices. Методы практического конструирования при нормировании сигналов с датчиков
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РАЗДЕЛ 10: Методы конструирования аппаратуры
©АВТЭКС Санкт-Петербург (812) 567-7202, http://www.autexspb.da.ru, E-mail: autex@newmail.ru
Автор перевода: Горшков Б.Л.
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8. Paul Brokaw,
An IC Amplifier User Guide To Decoupling, Grounding, And Making Things Go Right
For A Chang
e,
Analog Devices Application Note, Order Number E1393-5-590.
9. A. Rich,
Understanding Interference-Type Nois
e,
Analog Dialogue, 16-3, 1982, pp. 16-19.
10. A. Rich,
Shielding and Guardin
g,
Analog Dialogue, 17-1, 1983, pp. 8-13.
11. EMC Test & Design,
Cardiff Publishing Company, Englewood, CO.
12. A. Rich,
Understanding Interference-Type Nois
e,
Analog Dialogue, 16-3, 1982, pp. 16-19.
13. James Bryant and Herman Gelbach,
High Frequency Signal Contaminatio
n,
Analog Dialogue, Vol. 27-2, 1993.
14. Walt Jung,
System RF Interference Preventio
n,
Analog Dialogue, Vol. 28-2, 1994.
15. Neil Muncy,
Noise Susceptibility in Analog and Digital Signal Processing System
s,
Audio Engineering Society Convention, Nov. 1994.
16. Ralph Morrison, Solving Interference Problems in Electronics,
John Wiley, 1995.
17. Siemens Optoisolator Products, http://www.siemens.com
Защита от перегрузки по напряжению и электростатический разряд
1.
Amplifier Applications Guide
, Section XI, pp. 1-10,
Analog Devices, Incorporated, Norwood, MA, 1992.
2.
Systems Applications Guide
, Section 1, pp. 56-72,
Analog Devices, Incorporated, Norwood, MA, 1993.
3.
Linear Design Seminar
, Section 1, pp. 19-22,
Analog Devices, Incorporated, Norwood, MA, 1994.
4. ESD Prevention Manual,
Analog Devices, Inc.
5.
MIL-STD-883 Method 3015, Electrostatic Discharge Sensitivity Classificatio
n.
700 Robbins Ave., Building #4, Section D, Philadelphia, PA 19111-5094.
6.
EIAJ ED-4701 Test Method C-111, Electrostatic Discharge
s.
250 W 34th St., New York NY 10119, Attn.: Tomoko.
7.
ESD Association Standard S5.2 for Electrostatic Discharge (ESD) Sensitivity Testing -Machine
Model (MM)- Component Leve
l.
200 Liberty Plaza, Rome, NY 13440.
8.
ESD Association Draft Standard DS5.3 for Electrostatic Discharge (ESD) Sensitivity Testing -
Charged Device Model (CDM) Component Testing.
ESD Association, Inc., 200 Liberty Plaza, Rome, NY13440.
9. Niall Lyne,
Electrical Overstress Damage to CMOS Converter
s, Application Note AN-397,
Analog Devices, 1995, http://www.analog.com
10.
How
to
Reliably
Protect
CMOS
Circuits
Against
Power
Supply
Overvoltagin
g, App. Note AN-311,
Analog Devices, http://www.analog.com
11. ADM3311E RS-232 Port Transceiver Data Sheet,
Analog Devices, Inc., http://www.analog.com
12. TransZorbs
10 Melville Park Road, Melville, NY, 11747-3113, 516-847-3000, http://www.gensemi.com