Springer Science+Business Media, 2011, 212 pages.
This monograph and translation from the Russian describes in detail and comments on the fundamentals of metrology. The basic concepts of metrology, the principles of the Inteational System of Units SI, the theory of measurement uncertainty, the new methodology of estimation of measurement accuracy on the basis of the uncertainty concept, as well as the methods for processing measurement results and estimating their uncertainty are discussed from the mode position. It is shown that the uncertainty concept is compatible with the classical theory of accuracy. The theory of random uncertainties is supplemented with their most general description on the basis of generalized normal distribution; the instrumental systematic errors are presented in connection with the methodology of normalization of the metrological characteristics of measuring instruments. The information about mode systems of traceability is given. All discussed theoretical principles and calculation methods are illustrated with examples.
Chapter 1 discusses the basic concepts of metrology from a mode point of view. Chapter 2 is devoted to measurement errors. For the readers’ convenience, the book includes the minimum information required from probability theory and statistics. The theory of random measurement errors, which shows that these errors follow a generalized normal distribution law (and, in the most common special case – a normal distribution law), is then discussed. Chapter 3 discusses the concept of measurement uncertainty, which is now covered by inteational regulation. This concept is shown to be compatible and consistent with the classical theory of measurement errors. The method for determining measured results (and for estimating the uncertainty in said results) implemented by this regulation is also described. Chapter 4 provides a
detailed discussion of methods for statistical reduction of measurement results (revised in light of this procedure). Chapter 5 describes the basic assumptions and principles underlying the design
of the Inteational System of Units (SI). Chapter 6 is devoted to traceability of measurements. A detailed discussion of the major elements of national systems for traceability of measurements is provided: references, calibration schemes, and organizational structures. The metrological and legal characteristics of the two forms for dissemination of units – calibration and verification – are described; a mathematical description of the statistical errors in verification is provided; and a mechanism for determining the value of the uncertainty in the magnitude of a unit during such operations will be provided. A new inteational system for assuring traceability of measurements is described; this system is based on an agreement among the directors of the various national metrological institutes, as well as key comparisons among national standards. Chapter 7 describes methods for determination and adjustment of the verification and calibration periods. Since these methods are grounded in the theory underlying the metrological reliability of the SI system, they will therefore be discussed simultaneously with a presentation of the basic provisions of this theory. Chapter 8 describes a new methodology for assurance of measurement accuracy (based on the provisions contained in the ISO 5725-series standards) that is now becoming more and more common around the world.
This monograph and translation from the Russian describes in detail and comments on the fundamentals of metrology. The basic concepts of metrology, the principles of the Inteational System of Units SI, the theory of measurement uncertainty, the new methodology of estimation of measurement accuracy on the basis of the uncertainty concept, as well as the methods for processing measurement results and estimating their uncertainty are discussed from the mode position. It is shown that the uncertainty concept is compatible with the classical theory of accuracy. The theory of random uncertainties is supplemented with their most general description on the basis of generalized normal distribution; the instrumental systematic errors are presented in connection with the methodology of normalization of the metrological characteristics of measuring instruments. The information about mode systems of traceability is given. All discussed theoretical principles and calculation methods are illustrated with examples.
Chapter 1 discusses the basic concepts of metrology from a mode point of view. Chapter 2 is devoted to measurement errors. For the readers’ convenience, the book includes the minimum information required from probability theory and statistics. The theory of random measurement errors, which shows that these errors follow a generalized normal distribution law (and, in the most common special case – a normal distribution law), is then discussed. Chapter 3 discusses the concept of measurement uncertainty, which is now covered by inteational regulation. This concept is shown to be compatible and consistent with the classical theory of measurement errors. The method for determining measured results (and for estimating the uncertainty in said results) implemented by this regulation is also described. Chapter 4 provides a
detailed discussion of methods for statistical reduction of measurement results (revised in light of this procedure). Chapter 5 describes the basic assumptions and principles underlying the design
of the Inteational System of Units (SI). Chapter 6 is devoted to traceability of measurements. A detailed discussion of the major elements of national systems for traceability of measurements is provided: references, calibration schemes, and organizational structures. The metrological and legal characteristics of the two forms for dissemination of units – calibration and verification – are described; a mathematical description of the statistical errors in verification is provided; and a mechanism for determining the value of the uncertainty in the magnitude of a unit during such operations will be provided. A new inteational system for assuring traceability of measurements is described; this system is based on an agreement among the directors of the various national metrological institutes, as well as key comparisons among national standards. Chapter 7 describes methods for determination and adjustment of the verification and calibration periods. Since these methods are grounded in the theory underlying the metrological reliability of the SI system, they will therefore be discussed simultaneously with a presentation of the basic provisions of this theory. Chapter 8 describes a new methodology for assurance of measurement accuracy (based on the provisions contained in the ISO 5725-series standards) that is now becoming more and more common around the world.